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Proceedings of SPIE Volume 1661

Machine Vision Applications in Character Recognition and Industrial Inspection
Editor(s): Donald P. D'Amato; Wolf-Ekkehard Blanz; Byron E. Dom; Sargur N. Srihari
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Volume Details

Volume Number: 1661
Date Published: 1 August 1992
Softcover: 38 papers (440) pages
ISBN: 9780819408150

Table of Contents
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Contrast enhancement of mail piece images
Author(s): Yong-Chul Shin; Ramalingam Sridhar; Victor Demjanenko; Paul W. Palumbo; Jonathan J. Hull
Document understanding using layout styles of title page images
Author(s): Louis H. Sharpe; Basil Manns
Recognition of characteristic symbols in engineering drawings
Author(s): Chan Pyng Lai; Rangachar Kasturi
Estimation of linear stroke parameters using iterative total least squares methods
Author(s): Jan A. Van Mieghem; Hadar I. Avi-Itzhak; Roger D. Melen
Gray-scale character recognition using boundary features
Author(s): Stephen W. Lam; Anthony C. Girardin; Sargur N. Srihari
Recognition of poorly printed text by direct extraction of features from gray scale
Author(s): Theo Pavlidis; Li Wang; Jiangying Zhou; William J. Sakoda; Jairo Rocha
Use of a priori knowledge for character recognition
Author(s): Gilles Houle; Kie Bum Eom
Character recognition: a unified approach
Author(s): Nassrin Tavakoli
Automated optical recognition of degraded handwritten characters
Author(s): Emade Darwiche; Abhijit S. Pandya; Anil D. Mandalia
System for line drawings interpretation
Author(s): L. Boatto; Vincenzo Consorti; Monica Del Buono; Vincenzo Eramo; Alessandra Esposito; F. Melcarne; Mario Meucci; M. Mosciatti; M. Tucci; Arturo Morelli
Model-based control strategy for document image analysis
Author(s): Frank Fein; Frank Hoenes
Contextual analysis of machine-printed addresses
Author(s): Peter B. Cullen; Tin Kam Ho; Jonathan J. Hull; Michal Prussak; Sargur N. Srihari
Massively parallel implementation of character recognition systems
Author(s): Michael D. Garris; Charles L. Wilson; James L. Blue; Gerald T. Candela; Patrick J. Grother; Stanley A. Janet; R. Allen Wilkinson
Recent advances in inspecting integrated circuits for pattern defects
Author(s): Virginia H. Brecher; Byron E. Dom
Wafer examination and critical dimension estimation using scattered light
Author(s): Richard H. Krukar; Susan M. Gaspar; Scott R. Wilson; Donald R. Hush; S. Sohail H. Naqvi; John Robert McNeil
Three-dimensional inspection of integrated circuits: a depth from focus approach
Author(s): Xavier Binefa; Jordi M. Vitria; Juan Jose Villanueva
Advanced Via Inspection Tool
Author(s): Douglas Y. Kim; Kurt Muller; Lawrence D. Thorp; Kenneth A. Bird
Automated vision system for inspection of wedge bonds
Author(s): Koduri K. Sreenivasan; Mandayam D. Srinath; Alireza R. Khotanzad

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