Share Email Print


Laser Testing and Reliability
Editor(s): David L. Begley; S. C. Wang
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a black-and-white photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 1620
Date Published: 1 February 1992
Softcover: 11 papers (110) pages
ISBN: 9780819407580

Table of Contents
show all abstracts | hide all abstracts
Application of OBIC and photoluminescence to the failure analysis of laser diode devices
Author(s): Giuseppe A. Azzini; R. De Franceschi; M. Liberatore; Laura Serra; Paolo Montangero
Show Abstract
Implementation of a system to life test 2-D laser arrays
Author(s): Thomas H. Faltus; Daniel J. Bicket
Show Abstract
Optical feedback in diagnostic methods and testing of semiconductor laser diodes
Author(s): Marziale Milani; S. Mazzoleni; Franca Brivio
Show Abstract
Reliability of ridge waveguide GaInAsP/InP laser
Author(s): H. F. Postolek; Tibor F. Devenyi; M. Havelock; Cornelis Blaauw; Cheryl M. Maritan; George K. D. Chik
Show Abstract
Effect of degradation modes on the lifetime assessment of GaAlAs/GaAs laser
Author(s): Tibor F. Devenyi; George K. D. Chik; F. Yu
Show Abstract
Lambdameter for accurate stability measurements of optical transmitters
Author(s): Gregory E. Obarski
Show Abstract
Reliability of a self-pulsating CD laser for fiber optic data links
Author(s): Tong Lu; Robert F. Harding; Paul J. Sendelbach; Kathy A. McLaughlin
Show Abstract
Experimental methods for designing, testing, and producing reliable high-power ion lasers
Author(s): Marco F. Arrigoni; Luis Spinelli; Gerald Barker
Show Abstract
Effects of F2 concentration on the degradation of discharge-pumped KrF laser output
Author(s): Qihong Lou
Show Abstract
Characteristics of laser-induced luminescence in poly(paraphenylene)
Author(s): Changqin Jin; Shaozhe Lu; Xi A. Su; Xing Juan Liu
Show Abstract
Reliability requirements for solid state lasers in space applications
Author(s): David L. Begley; Robert G. Marshalek; Robert J. Smith
Show Abstract

© SPIE. Terms of Use
Back to Top