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Proceedings of SPIE Volume 1620

Laser Testing and Reliability
Editor(s): David L. Begley; S. C. Wang
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Volume Details

Volume Number: 1620
Date Published: 1 February 1992
Softcover: 11 papers (110) pages
ISBN: 9780819407580

Table of Contents
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Application of OBIC and photoluminescence to the failure analysis of laser diode devices
Author(s): Giuseppe A. Azzini; R. De Franceschi; M. Liberatore; Laura Serra; Paolo Montangero
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Implementation of a system to life test 2-D laser arrays
Author(s): Thomas H. Faltus; Daniel J. Bicket
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Optical feedback in diagnostic methods and testing of semiconductor laser diodes
Author(s): Marziale Milani; S. Mazzoleni; Franca Brivio
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Reliability of ridge waveguide GaInAsP/InP laser
Author(s): H. F. Postolek; Tibor F. Devenyi; M. Havelock; Cornelis Blaauw; Cheryl M. Maritan; George K. D. Chik
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Effect of degradation modes on the lifetime assessment of GaAlAs/GaAs laser
Author(s): Tibor F. Devenyi; George K. D. Chik; F. Yu
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Lambdameter for accurate stability measurements of optical transmitters
Author(s): Gregory E. Obarski
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Reliability of a self-pulsating CD laser for fiber optic data links
Author(s): Tong Lu; Robert F. Harding; Paul J. Sendelbach; Kathy A. McLaughlin
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Experimental methods for designing, testing, and producing reliable high-power ion lasers
Author(s): Marco F. Arrigoni; Luis Spinelli; Gerald Barker
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Effects of F2 concentration on the degradation of discharge-pumped KrF laser output
Author(s): Qihong Lou
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Characteristics of laser-induced luminescence in poly(paraphenylene)
Author(s): Changqin Jin; Shaozhe Lu; Xi A. Su; Xing Juan Liu
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Reliability requirements for solid state lasers in space applications
Author(s): David L. Begley; Robert G. Marshalek; Robert J. Smith
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