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Proceedings of SPIE Volume 1556

Scanning Microscopy Instrumentation
Editor(s): Gordon S. Kino
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Volume Details

Volume Number: 1556
Date Published: 1 February 1992
Softcover: 21 papers (194) pages
ISBN: 9780819406842

Table of Contents
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Solid immersion lens photon tunneling microscope (Invited Paper)
Author(s): Gordon S. Kino; Scott M. Mansfield
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Field detection by subwavelength aperture probes
Author(s): Ann Roberts
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Imaging of near-field diffraction patterns with subwavelength resolution in the optical region
Author(s): Duncan J. Butler; Keith A. Nugent; Ann Roberts; Patrick D. Kearney
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Near-field acoustic microscopy (Invited Paper)
Author(s): Butrus T. Khuri-Yakub; S. Akamine; B. Hadimioglu; Hidenori Yamada; Calvin F. Quate
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Imaging of biological material with STM/AFM (Invited Paper)
Author(s): Miguel Salmeron; D. Frank Ogletree; G. Neubauer; M. N. Murray; Thomas Wilson; M. D. Bednarski; William F. Kolbe; Albert Folch
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Metrics for metrology on an atomic scale (Abstract Only)
Author(s): E. Clayton Teague
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Study of LDEF particulate contamination using atomic force microscopy
Author(s): Mark S. Anderson; Carl R. Maag
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Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy
Author(s): Mark R. Kozlowski; Michael C. Staggs; Mehdi Balooch; Robert J. Tench; Wigbert J. Siekhaus
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Nanoscale semiconductor impurity characterization by scanned probe microscopy (Invited Paper)
Author(s): K. S. Mak; Clayton C. Williams
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Scanning cone-beam reconstruction algorithms for x-ray microtomography
Author(s): Ge Wang; T. H. Lin; Ping Chin Cheng; D. M. Shinozaki; Hyo-Gun Kim
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Measurement of photothermal vibrational displacement by a focusing error sensor
Author(s): Eiichi Sato; Toshinori Nakajima; Ichirou Yamaguchi
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Microinterferometry to 1 pm (Invited Paper)
Author(s): Winfried Denk
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New spectrally resolved confocal scanning laser microscope
Author(s): John W. Bowron; Savvas Damaskinos; Arthur E. Dixon
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Two-photon excitation in scanning laser microscopy (Abstract Only)
Author(s): James H. Strickler; Watt W. Webb
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Optimal disc design for a confocal microscope
Author(s): T. H. Lin; Ping Chin Cheng
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New transmission and double-reflection scanning beam confocal microscope: applications in transmission (Invited Paper)
Author(s): Arthur E. Dixon; Savvas Damaskinos; Matt R. Atkinson; L. H. Cao
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Three-dimensional structural analysis from biological confocal images
Author(s): Jagath K. Samarabandu; Raj S. Acharya; Ping Chin Cheng; C. Meng; Ronald Berezney; R. G. Summers
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Scanning confocal microscope for precise measurement of optical fiber diameter
Author(s): Steven E. Mechels; Matthew Young
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High-resolution differential phase and amplitude optical microscope
Author(s): Sergei I. Bozhevolnyi; A. V. Postnikov; P. S. Radko
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Method of sampling and positioning for laser scanning microscope: load cell method (Proceedings Only)
Author(s): Yu-Pin Lan; Ren-Huei Hsu; Sheng-Hua Lu; Mao-Sheng Huang
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Application of a 2-D atomic force microscope system to metrology
Author(s): Diana Nyyssonen; Laszlo Landstein; E. Coombs
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