Share Email Print

Proceedings of SPIE Volume 1546

Multilayer and Grazing Incidence X-Ray/EUV Optics
Editor(s): Richard B. Hoover
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 1546
Date Published: 1 January 1992
Softcover: 54 papers (650) pages
ISBN: 9780819406743

Table of Contents
show all abstracts | hide all abstracts
Magnesium-silicide-based multilayers for soft x-ray optics
Author(s): Pierre Boher; Philippe Houdy; Louis Hennet; Zhigang Li; Abhijit Uday Modak; David J. Smith; M. Idir; T. Moreno; Robert J. Barchewitz; Mikhael Kuehne; Peter Mueller; Jean-Pierre Delaboudiniere
Tungsten/boron nitride multilayers for XUV optical applications
Author(s): Pierre Boher; Louis Hennet; F. Pierre; David J. Smith; Abhijit Uday Modak; M. Idir; Robert J. Barchewitz
Description and performance of mirrors and multilayers for the extreme ultraviolet imaging telescope of the SOHO mission
Author(s): Jean-Pierre Chauvineau; Jean-Yves Clotaire; Gilles Colas; O. Lam; Jean-Claude Manneville; Jean-Paul Marioge; Michel Mullot; Alain Raynal; Gerard Tissot; Laurence Valiergue; Jean-Pierre Delaboudiniere
Evaluation of reflectors for soft x-ray optics
Author(s): Kazuyuki Etoh; Noriyoshi Hoshi; Toshihiro Yonemitu; Herve-Andre Durand; Jean-Jacques Delaunay; Kazuhiko Ito; Ichiro Yamada; Izumi Kataoka
Method for characterizing multilayer coatings on curved substrates
Author(s): George Gutman; Kevin Parker; James Scholhamer; James L. Wood
Reflectivity measurements of Ni/V, Ni/Ti, and W/C multilayer mirrors in the 2-6nm wavelength region using synchrotron radiation
Author(s): Hiroshi Nagata; Yukinobu Ishino; Shoji Seki; Masataka Shin'ogi; Tsuneaki Miyahara
Fabrication of large layered synthetic microstructures of uniform reflectivity performance
Author(s): Peter J. Biltoft; Steven Falabella; Edward H. Noble
Fabrication and analysis of Mo-Si multilayers
Author(s): Lawrence Shing; Richard C. Catura
Feasibility study of the use of synchrotron radiation in the calibration of AXAF: initial reflectivity results
Author(s): Dale E. Graessle; Roger J. V. Brissenden; J. C. Cobuzzi; John P. Hughes; Edwin M. Kellogg; Fred E. Mootz; Daniel A. Schwartz; Patrick O. Slane; Martin V. Zombeck; Richard L. Blake; Jeffrey C. Davis
Grazing-incidence x-ray reflectivity: studies for the AXAF Observatory
Author(s): Patrick O. Slane; Daniel A. Schwartz; Leon P. Van Speybroeck; D. Jones; John H. Chappell; James W. Bilbro; Alan P. Shapiro; Sandeep D. Dave; P. Kidd; Scott C. Texter
X-ray focusing using microchannel plates
Author(s): George W. Fraser; John Ernest Lees; James F. Pearson; Mark R. Sims; K. Roxburgh
X-ray scattering measurements from thin-foil x-ray mirrors
Author(s): Finn Erland Christensen; B. P. Byrnak; Allan Hornstrup; Shou-Hua Zhu; Niels J. Westergaard; Herbert W. Schnopper; Lalit Jalota
Construction of a micro-zone-plate for a scanning x-ray microscope at Hefei
Author(s): Yong Feifei Zhao; Xingshu Xie; Xinya Lei; Youzhou Zhao; Lide Zhang
Graded d-spacing multilayer telescope for high-energy x-ray astronomy
Author(s): Finn Erland Christensen; Allan Hornstrup; Niels J. Westergaard; Herbert W. Schnopper; James L. Wood; Kevin Parker
Solar observations with the multispectral solar telescope array
Author(s): Richard B. Hoover; Arthur B. C. Walker; Joakim F. Lindblom; Maxwell J. Allen; Ray H. O'Neal; Craig Edward DeForest; Troy W. Barbee
Photographic films for the multispectral solar telescope array
Author(s): Richard B. Hoover; Arthur B. C. Walker; Craig Edward DeForest; Maxwell J. Allen; Joakim F. Lindblom; Lou Gilliam; Laurence J. November; Todd Brown; Clyde A. Dewan
Solar/stellar coronal explorer and the solar/stellar coronal observatory
Author(s): Arthur B. C. Walker; Joakim F. Lindblom; J. Gethyn Timothy; Troy W. Barbee; Richard B. Hoover; Einar Tandberg-Hanssen; Shi Tsan Wu; J. Sahade
Multispectral solar telescope array II: soft-x-ray/EUV reflectivity of the multilayer mirrors
Author(s): Troy W. Barbee; John W. Weed; Richard B. Hoover; Maxwell J. Allen; Joakim F. Lindblom; Ray H. O'Neal; Charles C. Kankelborg; Craig Edward DeForest; Elizabeth S. Paris; Arthur B. C. Walker; Thomas D. Willis; Efim S. Gluskin; Piero A. Pianetta; Phillip C. Baker
Design and test of a high-resolution EUV spectroheliometer
Author(s): Thomas E. Berger; J. Gethyn Timothy; Arthur B. C. Walker; Helen Kirby; Jeffrey S. Morgan; Surendra K. Jain; Ajay Kumar Saxena; Jagadish C. Bhattacharyya; Martin H.C. Huber; Giuseppe Tondello; Giampiero Naletto
Objective double-crystal spectrometer
Author(s): Arthur B. C. Walker; Thomas D. Willis; Richard B. Hoover
Soft x-ray ion chamber
Author(s): Bo Chen; Ling Ma; Futian Li; Xingdan Chen
Selective photodevices for the VUV
Author(s): William R. Hunter; John F. Seely
Boron carbide as atomic oxygen protection for the Lexan-carbon filter on the ROSAT wide-field camera
Author(s): Barry J. Kent; Bruce Miles Swinyard; Hans-Joerg Maier; Dagmar Frischke
High-resolution telescope cluster I: overview and technical status
Author(s): Arthur B. C. Walker; Richard B. Hoover; William T. Roberts; Shi Tsan Wu
Characterization of SnO2 GIAR films
Author(s): Meiman Kentjana; Hitoshi Homma; Ercan E. Alp; Timothy M. Mooney
JET-X instrument for the USSR Spectrum-RG mission: its design and performance
Author(s): Alan A. Wells; G. C. Stewart; Martin J. L. Turner; D. J. Watson; C. H. Whitford; Elio Antonello; Oberto Citterio; Heinrich W. Braeuninger; Mark S. Cropper; W. Jeremy Curtis; S. C. Peskett; Christopher James Eyles; C. V. Goodall; T. Mineo; Bruno Sacco; Oleg V. Terekhov
Measurement of molybdenum mirror reflectivities
Author(s): Richard L. Blake; Jeffrey C. Davis; Ping P. Gong; Dale E. Graessle; Warren Ruderman
Lobster-eye x-ray optics using microchannel plates
Author(s): Philip E. Kaaret; Phillip Geissbuehler

© SPIE. Terms of Use
Back to Top