Share Email Print
cover

Proceedings of SPIE Volume 1384

High-Speed Inspection Architectures, Barcoding, and Character Recognition
Editor(s): Michael J. W. Chen
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 1384
Date Published: 1 February 1991
Softcover: 36 papers (366) pages
ISBN: 9780819404510

Table of Contents
show all abstracts | hide all abstracts
Image registration for automated inspection of 2-D electronic circuit patterns
Author(s): Arturo A. Rodriguez; Jon R. Mandeville
Automated visual inspection system for IC bonding wires using morphological processing
Author(s): Hiroyuki Tsukahara; Masato Nakashima; Takehisa Sugawara
Automatic inspection system for full-color printed matter
Author(s): Shin-Ichi Meguro; Masakatu Nunotani; Katsuyuki Tanimizu; Mutsuo Sano; Akira Ishii
Parsing algorithm for line-drawing pattern recognition
Author(s): Patrick S. P. Wang; Y. Y. Zhang
Holographic labeling for automated identification
Author(s): Peter William McOwan; Andrew K. Powell; Ronald E. Burge
New search method based on hash table and heuristic search method
Author(s): He-Chen Wang; Wu Xian; Da Li Luo; Xiang Song
Optical properties of barcode symbols for laser scanning
Author(s): Anna Marie Quinn; Jay M. Eastman
Analysis of one-dimensional barcode
Author(s): Ynjiun P. Wang; Theo Pavlidis; Jerome Swartz
Thin family: a new barcode concept
Author(s): David C. Allais
High-density two-dimensional barcode
Author(s): Ynjiun P. Wang; Theo Pavlidis; Jerome Swartz
Diffraction analysis of beams for barcode scanning
Author(s): Jay M. Eastman; Anna Marie Quinn
Analysis of barcode digitization techniques
Author(s): John A. Boles; Randall K. Hems
Data-driven parallel architecture for syntactic pattern recognition
Author(s): Chien-Chao Tseng; Shu-Yuen Hwang
Neural net selection of features for defect inspection
Author(s): Kenji Sasaki; David P. Casasent; Sanjay S. Natarajan
Context specification for text recognition in forms
Author(s): Kelly L. Anderson; William A. Barrett
New decision tree algorithm for handwritten numerals recognition using topological features
Author(s): Sebastiano Impedovo; Giovanni Dimauro; Giuseppe Pirlo
Table recognition for automated document entry system
Author(s): Haruhiko Kojima; Teruo Akiyama
Intelligent word-based text recognition
Author(s): Frank Hoenes; Rainer Bleisinger; Andreas R. Dengel
Japanese document recognition and retrieval system using programmable SIMD processor
Author(s): Sueharu Miyahara; Akira Suzuki; Shunkichi Tada; Takahiko Kawatani
Initial key word OCR filter results
Author(s): David P. Casasent; Anand K. Iyer; Gopalan Ravichandran
Optical correlation filters to locate destination address blocks in OCR
Author(s): David P. Casasent; Gopalan Ravichandran
Spectral signature analysis for industrial inspection
Author(s): Robert Frank Rauchmiller; Raymond S. Vanderbok
Issues in parallelism in object recognition
Author(s): Suchendra M. Bhandarkar; Minsoo Suk

© SPIE. Terms of Use
Back to Top