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Proceedings of SPIE Volume 1343

X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography
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Volume Details

Volume Number: 1343
Date Published: 1 February 1991
Softcover: 51 papers (492) pages
ISBN: 9780819404046

Table of Contents
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Suppression of columnar-structure formation in Mo-Si layered synthetic microstructures
Author(s): Masahito Niibe; Masami Hayashida; Takashi Iizuka; Akira Miyake; Yutaka Watanabe; Rie Takahashi; Yasuaki Fukuda
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Soft x-ray multilayers fabricated by electron-beam deposition
Author(s): Masaaki Sudoh; Ryouhei Yokoyama; Mitsuo Sumiya; Masaki Yamamoto; Mihiro Yanagihara; Takeshi Namioka
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Selection, growth, and characterization of materials for MBE-produced x-ray optics
Author(s): Patrick A. Kearney; Jon M. Slaughter; Charles M. Falco
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Deposition- controlled uniformity of multilayer mirrors
Author(s): Alan F. Jankowski; Daniel M. Makowiecki; M. A. McKernan; R. J. Foreman; R. G. Patterson
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Silicon/silicon oxide and silicon/silicon nitride multilayers for XUV optical applications
Author(s): Pierre Boher; Philippe Houdy; Louis Hennet; Jean-Pierre Delaboudiniere; Mikhael Kuehne; Peter Mueller; Zhigang Li; David J. Smith
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Interfaces in Mo/Si multilayers
Author(s): Jon M. Slaughter; Patrick A. Kearney; Dean W. Schulze; Charles M. Falco; C. R. Hills; Edward B. Saloman; Richard N. Watts
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Fabrication and characterization of Si-based soft x-ray mirrors
Author(s): Bernt Schmiedeskamp; Bernhard Heidemann; Ulf Kleineberg; Andreas Kloidt; Mikhael Kuehne; H. Mueller; Peter Mueller; Kerstin Nolting; Ulrich Heinzmann
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Design considerations for multilayer-coated Schwarzchild objectives for the XUV
Author(s): Jeffrey B. Kortright; James H. Underwood
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Performance of multilayer-coated figured optics for soft x-rays near the diffraction limit
Author(s): Eric L. Raab; Donald M. Tennant; Warren K. Waskiewicz; Alastair A. MacDowell; Richard R. Freeman
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Multilayer reflectors for the "water window"
Author(s): Shi Xu; Brian L. Evans
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Design and analysis of aspherical multilayer imaging x-ray microscope
Author(s): David L. Shealy; Wu Jiang; Richard B. Hoover
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Imaging performance and tests of soft x-ray telescopes
Author(s): Eberhard Adolf Spiller; R. McCorkle; Janusz S. Wilczynski; Leon Golub; George U. Nystrom; Peter Z. Takacs; Charles W. Welch
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Imaging characteristics of the development model of the SAX x-ray imaging concentrators
Author(s): Oberto Citterio; Paolo Conconi; Giancarlo Conti; E. Mattaini; E. Santambrogio; Giancarlo Cusumano; Bruno Sacco; Heinrich W. Braeuninger; Wolfgang Burkert
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Fabrication of a grazing-incidence telescope by grinding and polishing techniques on aluminum
Author(s): Dennis J. Gallagher; Webster C. Cash; James C. Green
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Recent developments in production of thin x-ray reflecting foils
Author(s): Rene Hudec; Boris Valnicek; J. Cervencl; T. Gerstman; Adolf Van Inneman; Pavel Nejedly; Lubomir Svatek
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Results from the calibration of the Extreme Ultraviolet Explorer instruments
Author(s): Barry Y. Welsh; Patrick N. Jelinsky; Peter W. Vedder; John V. Vallerga; David S. Finley; Roger F. Malina
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Performance of the Multi-Spectral Solar Telescope Array VI: performance and characteristics of the photographic films
Author(s): Richard B. Hoover; Arthur B. C. Walker; Craig Edward DeForest; Maxwell J. Allen; Joakim F. Lindblom
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Performance of the Multi-Spectral Solar Telescope Array III: optical characteristics of the Ritchey-Chretien and Cassegrain Telescopes
Author(s): Richard B. Hoover; Phillip C. Baker; James B. Hadaway; R. Barry Johnson; Cynthia Peterson; David R. Gabardi; Arthur B. C. Walker; Joakim F. Lindblom; Craig Edward DeForest; Ray H. O'Neal
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Soft x-ray projection lithography: experiments and practical printers
Author(s): Donald L. White; John E. Bjorkholm; Jeffrey Bokor; Ludwig Eichner; Richard R. Freeman; Jeffrey A. Gregus; Tanya E. Jewell; William M. Mansfield; Alastair A. MacDowell; Eric L. Raab; William T. Silfvast; L. H. Szeto; Donald M. Tennant; Warren K. Waskiewicz; David L. Windt; Obert R. Wood
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XUV free-electron laser-based projection lithography systems
Author(s): Brian Emerson Newnam
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Design survey of x-ray/XUV projection lithography systems
Author(s): David L. Shealy; Vriddhachalam K. Viswanathan
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Ultraprecise scanning technology
Author(s): Frits Zernike; Daniel N. Galburt
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Submicrometer lithographic alignment and overlay strategies
Author(s): Saleem H. Zaidi; S. Sohail H. Naqvi; Steven R. J. Brueck
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Resist schemes for soft x-ray lithography
Author(s): Gary N. Taylor; Richard S. Hutton; David L. Windt; William M. Mansfield
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XUV characterization comparison of Mo/Si multilayer coatings
Author(s): David L. Windt; Warren K. Waskiewicz; Glenn D. Kubiak; Troy W. Barbee; Richard N. Watts
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XUV resist characterization: studies with a laser plasma source
Author(s): Glenn D. Kubiak
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Interface characterization of XUV multilayer reflectors using HRTEM and x-ray and XUV reflectance
Author(s): David L. Windt; Robert Hull; Warren K. Waskiewicz; Jeffrey B. Kortright
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SOHO space satellite: UV instrumentation
Author(s): Arthur I. Poland; Vicente Domingo
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Ultra-High-Resolution XUV Spectroheliograph II: predicted performance
Author(s): Arthur B. C. Walker; Joakim F. Lindblom; J. Gethyn Timothy; Maxwell J. Allen; Craig Edward DeForest; Charles C. Kankelborg; Ray H. O'Neal; Elizabeth S. Paris; Thomas D. Willis; Troy W. Barbee; Richard B. Hoover
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Active sun telescope array
Author(s): Arthur B. C. Walker; J. Gethyn Timothy; Troy W. Barbee; Richard B. Hoover
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Survey of hard x-ray imaging concepts currently proposed for viewing solar flares
Author(s): Jonathan W. Campbell; John M. Davis; A. Gordon Emslie
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Solar EUV/FUV line polarimetry: observational parameters and theoretical considerations
Author(s): Silvano Fineschi; Richard B. Hoover; Juan M. Fontenla; Arthur B. C. Walker
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Solar EUV/FUV line polarimetry: instruments and methods
Author(s): Richard B. Hoover; Silvano Fineschi; Juan M. Fontenla; Arthur B. C. Walker
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Performance of the Multi-Spectral Solar Telescope Array V: temperature diagnostic response to the optically thin solar plasma
Author(s): Craig Edward DeForest; Charles C. Kankelborg; Maxwell J. Allen; Elizabeth S. Paris; Thomas D. Willis; Joakim F. Lindblom; Ray H. O'Neal; Arthur B. C. Walker; Troy W. Barbee; Richard B. Hoover; Efim S. Gluskin
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Design of narrow band XUV and EUV coronagraphs using multilayer optics
Author(s): Arthur B. C. Walker; Maxwell J. Allen; Troy W. Barbee; Richard B. Hoover
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Further observations of vectorial effects in the x-ray photoemission from caesium iodide
Author(s): George W. Fraser; John Ernest Lees; James F. Pearson
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Predicted performance of the lithium scattering and graphite crystal polarimeter for the Spectrum-X-Gamma mission
Author(s): Martin C. Weisskopf; Ronald F. Elsner; Robert Novick; Philip E. Kaaret; Eric H. Silver
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Cylindrical proportional counter for x-ray polarimetry
Author(s): Enrico Costa; Luigi Piro; Alda Rubini; Paolo Soffitta; Enrico Massaro; Giorgio Matt; Gastone Medici; Giuseppe Manzo; Stefano Re
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New low-density, high-porosity lithium hydride-beryllium hydride foam: properties and applications to x-ray astronomy
Author(s): Jon L. Maienschein; Patrick E. Barry; Frederick E. McMurphy; John S. Bowers
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Photoelectric effect from CsI by polarized soft x-rays
Author(s): Ping-Shine Shaw; Eric D. Church; Shaul Hanany; Yee Liu; Judith R. Fleischman; Philip E. Kaaret; Robert Novick; Giuseppe Manzo
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Bragg crystal polarimeter for the Spectrum-X-Gamma misson
Author(s): Jeff Holley; Eric H. Silver; Klaus Ziock; Robert Novick; Philip E. Kaaret; Martin C. Weisskopf; Ronald F. Elsner; Jeffrey W. Beeman
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Performance of the Multi-Spectral Solar Telescope Array IV: the soft x-ray and extreme ultraviolet filters
Author(s): Joakim F. Lindblom; Ray H. O'Neal; Arthur B. C. Walker; Forbes R. Powell; Troy W. Barbee; Richard B. Hoover; Stephen F. Powell
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ORFEUS: orbiting and retrievable far and extreme ultraviolet spectrometer
Author(s): Harald Rippel; Dirk Kampf; Roland Graue
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High-resolution stigmatic EUV spectroheliometer for studies of the fine scale structure of the solar chromosphere, transition region, and corona
Author(s): J. Gethyn Timothy; Thomas E. Berger; Jeffrey S. Morgan; Arthur B. C. Walker; Jagadish C. Bhattacharyya; Surendra K. Jain; Ajay Kumar Saxena; Martin H.C. Huber; Giuseppe Tondello; Giampiero Naletto
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Hard x-ray polarimeter utilizing Compton scattering
Author(s): Hirohisa Sakurai; Motosaku Noma; H. Niizeki
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Design and analysis of the reflection grating arrays for the X-Ray Multi-Mirror Mission
Author(s): Dennis P. Atkinson; Jay V. Bixler; Paul Geraghty; Charles J. Hailey; Jeffrey L. Klingmann; Richard C. Montesanti; Steven M. Kahn; Frits B. S. Paerels
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XMM space telescope: development plan for the lightweight replicated x-ray gratings
Author(s): Richard C. Montesanti; Dennis P. Atkinson; David F. Edwards; Jeffrey L. Klingmann
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Fabrication and performance at 1.33 nm of a 0.24-um period multilayer grating
Author(s): H. Berrouane; Chantal G. Khan Malek; Jean-Michel Andre; L. Lesterlin; F. R. Ladan; Jean-Rene Rivoira; Yves Lepetre; Robert J. Barchewitz
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Fabrication of multilayer Bragg-Fresnel zone plates for the soft x-ray range
Author(s): Chantal G. Khan Malek; T. Moreno; Philippe Guerin; F. R. Ladan; Jean-Rene Rivoira; Robert J. Barchewitz
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Multilayer monochromator for synchrotron radiation angiography
Author(s): Alfred Q. R. Baron; Troy W. Barbee; George S. Brown
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EUV performance of a multilayer-coated high-density toroidal grating
Author(s): Ritva A. M. Keski-Kuha; Roger J. Thomas; Werner M. Neupert; Charles E. Condor; Jeffrey S. Gum
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