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Proceedings of SPIE Volume 1332

Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection
Editor(s): Chander Prakash Grover
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Volume Details

Volume Number: 1332
Date Published: 1 January 1991
Softcover: 95 papers (910) pages
ISBN: 9780819403933

Table of Contents
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Absolute measurement of spherical surfaces
Author(s): Katherine Creath; James C. Wyant
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High-precision interferometric testing of spherical mirrors with long radius of curvature
Author(s): Klaus R. Freischlad; Michael F. Kuechel; Wolfgang Wiedmann; Winfried M. Kaiser; Maximilian Mayer
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Real-time wavefront measurement with lambda/10 fringe spacing for the optical shop
Author(s): Klaus R. Freischlad; Michael F. Kuechel; Karl-Heinz Schuster; Ulrich Wegmann; Winfried M. Kaiser
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Simple test for the 90 degree angle in prisms
Author(s): Daniel Malacara-Hernandez; Ricardo Flores-Hernandez
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Set of two 45 - 90 - 45 prisms equivalent to the Fresnel rhomb
Author(s): Murty V. Mantravadi; Ram Prakash Shukla; K. V.S.R. Apparao
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Focal length measurement using diffraction at a grating
Author(s): Rajpal S. Sirohi; Harish Kumar; Narinder Kumar Jain
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Automatic inspection technique for optical surface flaws
Author(s): GuoGuang Yang; Wenliang Gao; Shangyi Cheng
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Aspheric surface testing techniques
Author(s): H. Philip Stahl
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Interferometer for testing aspheric surfaces with electron-beam computer-generated holograms
Author(s): Takashi Gemma; Masayuki Hideshima; Makoto Taya; Nobuko Watanabe
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Applications of diamond-turned null reflectors for generalized aspheric metrology
Author(s): James T. McCann
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Optical aspheric surface profiler using phase shift interferometry
Author(s): Kenji Sasaki; Akira Ono
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Aspheric testing using null mirrors
Author(s): Murty V. Mantravadi; Vas Kumar; Robert J. von Handorf
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Application of real-time holographic interferometry in the nondestructive inspection of electronic parts and assemblies
Author(s): Craig P. Wood; James D. Trolinger
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TV holography and image processing in practical use
Author(s): Ole Johan Lokberg; Svein Ellingsrud; Eiolf Vikhagen
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Holographic instrumentation for monitoring crystal growth in space
Author(s): James D. Trolinger; Ravindra B. Lal; Ashok K. Batra
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Van der Lugt optical correlation for the measurement of leak rates of hermetically sealed packages
Author(s): Colleen Mary Fitzpatrick; Edward P. Mueller
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Holographic interferometry in corrosion studies of metals: I. Theoretical aspects
Author(s): Khaled J. Habib
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Holographic interferometry in corrosion studies of metals: II. Applications
Author(s): Khaled J. Habib
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Numerical investigation of effect of dynamic range and nonlinearity of detector on phase-stepping holographic interferometry
Author(s): Qiang Fang; Xiangyang Luo; Yushan Tan
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Holography with a single picosecond pulse
Author(s): Nils H. Abramson
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Holographic measurement of the angular error of a table moving along a slideway
Author(s): Kiyofumi Matsuda; Koji Tenjimbayashi
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Optical phase-conjugate resonators, bistabilities, and applications
Author(s): Putcha Venkateswarlu; Mostafa Dokhanian; Prayaga Chandra Sekhar; M. C. George; H. Jagannath
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Phase-conjugate interferometry by using dye-doped polymer films
Author(s): Kazuo Nakagawa; Chikara Egami; Takayoshi Suzuki; Hirofumi Fujiwara
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Phase-conjugate Twyman-Green interferometer for testing conicoidal surfaces
Author(s): Ram Prakash Shukla; Mostafa Dokhanian; Putcha Venkateswarlu; M. C. George
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Nondestructive testing of printed circuit board by phase-shifting interferometry
Author(s): Yueguang Lu; Lingzhen Jiang; Lixun Zou; Xia Zhao; Junyong Sun
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Absolute range measurement system for real-time 3-D vision
Author(s): Christopher M. Wood; Michael Mason Shaw; David Mark Harvey; Clifford Allan Hobson; Michael J. Lalor; John T. Atkinson
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New stereo laser triangulation device for specular surface inspection
Author(s): Marc Samson; Marc L. Dufour
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Visual inspection system using multidirectional 3-D imager
Author(s): Tetsuo Koezuka; Yoshikazu Kakinoki; Shinji Hashinami; Masato Nakashima
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Real-time edge extraction by active defocusing
Author(s): Y.Y. Hung; Quiming Zhu; Dahuan Shi; Shouhong Tang
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System calibration and part alignment for inspection of 2-D electronic circuit patterns
Author(s): Arturo A. Rodriguez; Jon R. Mandeville; Frederick Y. Wu
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Algorithm for the generation of look-up range table in 3-D sensing
Author(s): Xianyu Su; Wensen Zhou
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Information extracting and application for the combining objective speckle and reflection holography
Author(s): Zhengyuan Cao; Fang Cheng
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Surface inspection using optical fiber sensor
Author(s): Makoto Abe; Shigekata Ohta; Masaji Sawabe
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Fiber optic smart structures: structures that see the light
Author(s): Raymond M. Measures
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Near real-time operation of a centimeter-scale distributed fiber sensing system
Author(s): Brian K. Garside
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Geometric measurement of optical fibers with pulse-counting method
Author(s): Qiuhua Nie; John C. C. Nelson; Simon C. Fleming
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Interferometric fiber optic sensors for use with composite materials
Author(s): Raymond M. Measures; Tomas Valis; Kexing Liu; W. Dayle Hogg; Suzanne M. Ferguson; Edward Tapanes
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Fiber optic damage detection for an aircraft leading edge
Author(s): Raymond M. Measures; Michel LeBlanc; W. Dayle Hogg; Keith McEwen; B. K. Park
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Low- cost fiber optic sensing systems using spatial division multiplexing
Author(s): Barry E. Paton
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Two-dimensional micropattern measurement using precision laser beam scanning
Author(s): Hiroo Fujita
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GRIN fiber lens connectors
Author(s): Carlos C. Gomez-Reino; Jesus Linares
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Laser-based triangulation techniques in optical inspection of industrial structures
Author(s): Timothy A. Clarke; Kenneth T. V. Grattan; N. E. Lindsey
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Application of fiber optic sensors in pavement maintenance
Author(s): Mehdi Shadaram; Amin Solehjou; Soheil Nazarian
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Laser ultrasonics: generation and detection considerations for improved signal-to-noise ratio
Author(s): James W. Wagner; John B. Deaton; Andrew D. W. McKie; James B. Spicer
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Effects of the nonvanishing tip size in mechanical profile measurements
Author(s): Eugene L. Church; Peter Z. Takacs
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Three-dimensional nanoprofiling of semiconductor surfaces
Author(s): Paul C. Montgomery; Jean-Pierre Fillard; N. Tchandjou; Syamsa Moh Ardisasmita
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Laser moire topography for 3-D contour measurement
Author(s): Tetsuya Matsumoto; Yoichi Kitagawa; Masaaki Adachi; Akihiro Hayashi
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Nomarski viewing system for an optical surface profiler
Author(s): Joseph Bietry; R. Anthony Auriemma; Thomas C. Bristow; Edward Merritt
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Rigorous optical theory of the D Sight phenomenon
Author(s): Rodger L. Reynolds; Omer L. Hageniers
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Surface microtopography of thin silver films
Author(s): Manuel Filipe M. Costa; Jose B. Almeida
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Design criteria of an integrated optics microdisplacement sensor
Author(s): Antonio d'Alessandro; Marco De Sario; Antonella D'Orazio; Vincenzo Petruzzelli
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Laser-scanning tomography and related dark-field nanoscopy method
Author(s): Paul C. Montgomery; Pascal Gall-Borrut; Syamsa Moh Ardisasmita; Michel Castagne; Jacques Bonnafe; Jean-Pierre Fillard
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Super-accurate positioning technique using diffracted moire signals
Author(s): Yutaka Takada; Yoshiyuki Uchida; Yasuo Akao; Jun Yamada; Shuzo Hattori
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Moire displacement detection by the photoacoustic technique
Author(s): Kazuhiro Hane; S. Watanabe; Toshio Goto
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Displacement measurement using grating images detected by CCD image sensor
Author(s): Kazuhiro Hane; Chander Prakash Grover
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Noncontact technique for the measurement of linear displacement using chirped diffraction gratings
Author(s): William B. Spillman; Peter L. Fuhr
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Interferometric measurement of in-plane motion
Author(s): Michael Hercher; Geert J. Wijntjes
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Automatic mask-to-wafer alignment and gap control using moire interferometry
Author(s): Vijay Trimbak Chitnis; Kowsalya Varadan; M. S. Rashmi; Alok K. Kanjilal; Ram Narain
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Fringe-scanning moire system using a servo-controlled grating
Author(s): Haruhisa Kurokawa; Naoki Ichikawa; Nobuyuki Yajima
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Interference phenomenon with correlated masks and its application
Author(s): Chander Prakash Grover; Kazuhiro Hane
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Multichannel chromatic interferometry: metrology applications
Author(s): Gilbert M. Tribillon; Jose E. Calatroni; Patrick Sandoz
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New Zeiss interferometer
Author(s): Michael F. Kuechel
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Software concept for the new Zeiss interferometer
Author(s): Bernd Doerband; Wolfgang Wiedmann; Ulrich Wegmann; C. Wolfgang Kuebler; Klaus R. Freischlad
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Review of interferogram analysis methods
Author(s): Daniel Malacara-Hernandez
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Automatic, high-resolution analysis of low-noise fringes
Author(s): Gordon D. Lassahn
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Three-dimensional surface inspection using interferometric grating and 2-D FFT-based technique
Author(s): Y.Y. Hung; Shouhong Tang; Quiming Zhu
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Review of phase-measuring interferometry
Author(s): H. Philip Stahl
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White-light moire phase-measuring interferometry
Author(s): H. Philip Stahl
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New phase measurement for nonmonotonical fringe patterns
Author(s): Shouhong Tang; Y.Y. Hung; Quiming Zhu
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Synchronous phase-extraction technique and its applications
Author(s): Y.Y. Hung; Shouhong Tang; Guofan Jin; Quiming Zhu
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Optical techniques for determination of normal shock position in supersonic flows for aerospace applications
Author(s): Grigory Adamovsky; John G. Eustace
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Estimation of plastic strain by fractal
Author(s): YuZhong Dai; Fu-Pen Chiang
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Two-dimensional surface strain measurement based on a variation of Yamaguchi's laser-speckle strain gauge
Author(s): John P. Barranger
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Photoelastic transducer for high-temperature applications
Author(s): Alex S. Redner; Grigory Adamovsky; Laurence N. Wesson
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Study of oxidization process in real time using speckle correlation
Author(s): Mikiya Muramatsu; G. H. Guedes; Kiyofumi Matsuda; Thomas H. Barnes
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Application of speckle metrology at a nuclear waste repository
Author(s): Edgar Conley; Joseph Genin
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Study of microbial growth I: by diffraction
Author(s): Gareth T. Williams; Ramendra Deo Bahuguna; Humberto Arteaga; Elaine N. Le Joie
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Basic use of acoustic speckle pattern for metrology and sea waves study
Author(s): Duo-Min He; Ming-Shia He
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Light scattered by coated paper
Author(s): Egon Marx; Jun-Feng Song; Theodore V. Vorburger; Thomas Robert Lettieri
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Statistical properties of intensity fluctuations produced by rough surfaces under the speckle pattern illumination
Author(s): Takeaki Yoshimura; Kazuo Fujiwara; Eiichi Miyazaki
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Scattering measurements of optical coatings in high-power lasers
Author(s): Yi-Sheng Chen
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Simultaneous measurement of refractive index and thickness of thin film by polarized reflectances
Author(s): Tami Kihara; Kiyoshi Yokomori
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Measurement of fluid velocity fields using digital correlation techniques
Author(s): Donald R. Matthys; John A. Gilbert; Joseph T. Puliparambil
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Studies on laser dynamic precision measurement of fine-wire diameters
Author(s): Liangbi Bao; Fuyao Chen; Shixiong Wu; Jiangtong Xu; Zhilian Guan
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Measurement of interfacial tension by automated video techniques
Author(s): Vance A. Deason; Randall L. Miller; Arthur D. Watkins; Michael B. Ward; Karen B. Barrett
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Design parameters of an EO sensor
Author(s): Lakhan Singh Tanwar; P. C. Jain; Horst Kunzmann
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3-D camera based on differential optical absorbance
Author(s): Regis Houde; Denis Laurendeau; Denis Poussart
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Holotag: a novel holographic label
Author(s): Oliverio D.D. Soares; Luis Miguel Bernardo; Maria Isilda Pinto; F. V. Morais
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New technique for multiplying the isoclinic fringes
Author(s): Mei-Yuan Wen; Guang Ting Liu
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Optical surface microtopography using phase-shifting Nomarski microscope
Author(s): Wataru Shimada; Tadamitu Sato; Toyohiko Yatagai
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Optical three-dimensional sensing for measurement of bottomhole pattern
Author(s): Wan-Yong Su; Xianyu Su
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Study of microbial growth II: by holographic interferomery
Author(s): Ramendra Deo Bahuguna; Gareth T. Williams; Iraj K. Pour; R. Raman
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