Share Email Print
cover

Proceedings of SPIE Volume 1309

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 1309
Date Published: 1 October 1990
Softcover: 29 papers (322) pages
ISBN: 9780819403605

Table of Contents
show all abstracts | hide all abstracts
Modeling second-generation thermal imaging systems
Author(s): Howard V. Kennedy
Show Abstract
Second-generation thermal imaging system design-trades modeling
Author(s): Leo O. Vroombout
Show Abstract
Infrared focal plane array modeling
Author(s): Richard A. LeBlanc; Casey L. Contini
Show Abstract
Performance improvement of an IR imaging system using subsystem MTF analysis
Author(s): Douglas S. Fraedrich; Charles L. Confer
Show Abstract
Information theoretical assessment of digital imaging systems
Author(s): Sarah John; Zia-ur Rahman; Friedrich O. Huck; Stephen E. Reichenbach
Show Abstract
What eye model should we use for MRT testing?
Author(s): Gerald C. Holst; Alan R. Taylor
Show Abstract
Evaluation of display system enhancements to assist an operator in the detection of point targets
Author(s): Robert D. Reeves; Craig Thornton
Show Abstract
Human recognition of infrared images
Author(s): Jeffrey S. Sanders; Carl E. Halford; Keith A. Krapels
Show Abstract
Optimization of Schottky-barrier infrared detectors for solar blindness
Author(s): Ralph R. Reinhold
Show Abstract
Analysis of material emissivity effects on detection/recognition of targets viewed through smokes/obscurants with thermal imaging systems
Author(s): W. Michael Farmer
Show Abstract
Effects of pixel area versus number of pixels on FPA performance predictions
Author(s): J. Michael Ensminger
Show Abstract
Design and manufacture of a prototype 4-waveband scanning thermal imager
Author(s): Evan S. Cameron; Benoit Montminy
Show Abstract
Is there a role for infrared target and background signature prediction in sensor performance analysis?
Author(s): Marshall R. Weathersby
Show Abstract
Spatial frequency performance of SPRITE detectors
Author(s): Glenn D. Boreman; Allen E. Plogstedt
Show Abstract
C2NVEO advanced FLIR systems performance model
Author(s): Luke B. Scott; Leslie R. Condiff
Show Abstract
Image generation for perception testing using computer FLIR simulation
Author(s): John D. Horger
Show Abstract
Model for IR sensor performance evaluation: applications and results
Author(s): William T. Kreiss; Arman Tchoubineh; William A. Lanich
Show Abstract
Enhanced temporal resolution with a scanning imaging radiometer
Author(s): Steven M. Shepard; David T. Sass; Paul Kollmorgen
Show Abstract
Fast convolution technique for image generation
Author(s): Gertrude H. Kornfeld
Show Abstract
Development of an optical test bench for use in production
Author(s): Andre Girard
Show Abstract
Tolerancing methodology for an IR optical telescope
Author(s): R. Lawrence Sinclair; Steve Tritchew; Paul Jennison
Show Abstract
Self-imaging technique for focusing an IR telescope
Author(s): Paul Jennison; Loris G. Gregoris; Edward J. Kristufek
Show Abstract
System response function: a new approach to minimize IR testing errors
Author(s): Stephen W. McHugh; Dave A. Gallinger; Eden Y.C. Mei
Show Abstract
Easy focusing with a sweep frequency target
Author(s): Gerald C. Holst; Stephen W. McHugh
Show Abstract
Results of laboratory evaluation of staring arrays
Author(s): Curtis M. Webb
Show Abstract
Development of infrared optical systems
Author(s): Harald Schlott
Show Abstract
Update on objective MRTD measurement
Author(s): Thomas L. Williams
Show Abstract
Portable MRTD collimator system for fast in-situ testing of FLIRs and other thermal imagers
Author(s): Thomas L. Williams
Show Abstract
Characterization of filtered FLIR systems designed for chemical vapor detection and mapping
Author(s): Lewis W. Carr; Leland Fletcher; Peter L. Holland; Joseph Leonelli; David McPherrin; Mark L.G. Althouse
Show Abstract

© SPIE. Terms of Use
Back to Top