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Proceedings of SPIE Volume 1266

In-Process Optical Measurements and Industrial Methods
Editor(s): H. A. Macleod; Peter Langenbeck
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 1266
Date Published: 1 August 1990
Softcover: 28 papers (276) pages
ISBN: 9780819403131

Table of Contents
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Camber measurement in quality control of beryllia capillary tubes for argon ion lasers
Author(s): John N. Pike; Alfred M. Gaibrois; James F. Lynch
Broadband optical monitoring of filters fabricated using molecular beam deposition
Author(s): Shari Powell Fisher; Christopher C.H. Hale; Ian T. Muirhead; John Gordon H. Mathew; Robert J. Cornwell
Measurement of vibration with low detection limit at audible frequencies
Author(s): Anastasius J.A. Bruinsma; E. J.J. Doppenberg; M. M. Joon; J. W. Verheij
Safety of optical systems in hazardous areas
Author(s): Graham Tortoishell
Surface metrology by phase contrast
Author(s): Lionel R. Baker
Optical surface fabrication on ultra precision machines
Author(s): Sergey V. Ljubarsky; V. G. Sobolev; Sergey E. Shevtsov
Sensitivity enhancement in speckle metrology
Author(s): Meirong Tu; Peter J. Gielisse
Measurement of surface quality using a moire deflectometer
Author(s): Eliezer Keren; Kathi Kreske; Amiadav Livnat
Finish machining of optical surfaces
Author(s): Alexander I. Grodnikov; Vladimir P. Korovkin; Vladimir A. Gorshkov; Ju. K. Lysyanny
Some recent applications of electromagnetic theory in optics
Author(s): Roger Petit
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