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PROCEEDINGS VOLUME 1165

Scatter from Optical Components
Editor(s): John C. Stover

*This item is only available on the SPIE Digital Library.


Volume Details

Volume Number: 1165
Date Published: 2 January 1990

Table of Contents
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Scatter From Optical Components: An Overview
Author(s): John C. Stover
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Incident Angle Invariance In Surface Scatter
Author(s): William L. Wolfe
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Application And Verification Of Wavelength Scaling For Near Specular Scatter Predictions
Author(s): Cynthia L. Vernold
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Subsurface And Volume Scattering From Smooth Surfaces
Author(s): E. L. Church; P. Z. Takacs
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Opposition Effect In The Scattering Of Light From A Random Rough Metal Surface
Author(s): Zu-Han Gu; Richard S. Dummer; Alexei A. Maradudin; Arthur R. McGurn
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Surface Statistics Determined From IR Scatter
Author(s): Tod F. Schiff; John C. Stover
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Relating Surface Scattering Characteristics To Emissivity Changes During The Galvanneal Process
Author(s): D. P. Hill; R. L. Shoemaker; D. P. DeWitt; D. R. Gaskell; T. F. Schiff; D. White; K. M. Gaskey
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Light Scattered By Random Rough Surfaces And Roughness Determination
Author(s): Egon Marx; T. V. Vorburger
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Surface Scatter Phenomena: A Linear, Shift-Invariant Process
Author(s): James E. Harvey
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An Investigation Of Anomalous Scatter From Beryllium Mirrors
Author(s): John C. Stover; Marvin L. Bernt; Douglas E. McGary; Jeff Rifkin
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An ERIM Perspective On BRDF Measurement Technology
Author(s): C. Blake Arnold; Jerry L. Beard
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The Prediction Of BRDFs From Surface Profile Measurements
Author(s): E. L. Church; P. Z. Takacs; T. A. Leonard
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The Reconciliation Of Scatter Data Obtained With Solar Simulator And Lasers,
Author(s): Clara Asmail
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BRDF Error Analysis
Author(s): Fredrick M. Cady; Donald R. Bjork; Jeffrey Rifkin; John C. Stover
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45°/0° Bidirectional Reflectance Distribution Function Standard Development
Author(s): P. Yvonne Barnes; Jack J. Hsia
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Power Spectrum Standard For Surface Roughness: Part I
Author(s): D. J. Janeczko
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Measurement Of Light-Baffle Attenuation By A Gating Technique
Author(s): Silvano Donati
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Linearity In BSDF Measurements
Author(s): Fredrick M. Cady; Donald R. Bjork; Jeffrey Rifkin; John C. Stover
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BRDF Of Silicon Carbide And Aluminum Foam Compared To Black Paint At 3.39 Microns
Author(s): Lawrence M. Scherr; Jack H. Schmidt; Karen Sorensen
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Characterization Of Optical Baffle Materials
Author(s): A. Lompado; B. W. Murray; J. S. Wollam; J. F. Meroth
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Low Scatter Edge Blackening Compounds For Refractive Optical Elements
Author(s): Isabella T. Lewis; Arthur R. Telkamp; Arno G. Ledebuhr
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Bidirectional Transmittance Distribution Function Of Several Infrared Materials At 3.39 Microns
Author(s): Karen Sorensen; W. William Lee; Lawrence M. Scherr
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Thermal Cycling Effects On The BRDF Of Beryllium Mirrors
Author(s): Robert C. Sullivan; Ramesh Patel; Brian Murray
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BTDF Of Znse With Multilayer Coatings At 3.39 Microns
Author(s): Lawrence M. Scherr; Karen Sorensen; Edward C. Hagerott; Russell M. Ono
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Bidirectional Reflectance Distribution Function (BRDF) Measurements On Multilayer Dielectric Coatings As A Function Of Polarization State
Author(s): M. J. Schroeder; D. J. Musinski; C. G. Hull-Allen; F. J. Van Milligen
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Study Of Polarization Effects On Scatter From Si Wafers
Author(s): John G. Kepros; Eldon N. Okazaki
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Scattering From Contaminated Surfaces
Author(s): Kie Nahm; Paul R. Spyak; William L. Wolfe
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The Use Of A Simplified Model For Particulate Scatter
Author(s): Kie Nahm; Paul R. Spyak; William L. Wolfe
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Cleanliness Correlation By BRDF And PFO Instruments
Author(s): Philip T.C. Chen; Randy J. Hedgeland
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Contamination Effects On Optical Surfaces
Author(s): W. P. Saylor; M. C. Hanichak
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A Means Of Eliminating The Effects Of Particulate Contamination On Scatter Measurements Of Superfine Optical Surfaces
Author(s): Carl S. Masser
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Vacuum BRDF Measurements Of Cryogenic Optical Surfaces
Author(s): Timothy L. Howard; Patricia M. George; Steve Flammang; Daryl Mossman
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Cleanliness Requirements For The Air In A BRDF Facility
Author(s): Clara Asmail
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Monte Carlo Simulation Of Contaminant Transport To And Deposition On Complex Spacecraft Surfaces
Author(s): J. R. Phillips; M. C. Fong; T. D. Panczak
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Surface Particle Obscuration And BRDF Predictions
Author(s): P. T. Ma; M. C. Fong; A. L. Lee
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Satellite Material Contaminant Optical Properties
Author(s): B. E. Wood; W. T Bertrand; B. L. Seiber; E. L. Kiech; P. M. Falco; J. D. Holt
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Dark Field Photographic Techniques For Documenting Optical Surface Contamination.
Author(s): Kenneth M. Aline; James A. Dowdall
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Design Of A Laboratory Study Of Contaminant Film Darkening In Space
Author(s): H. S. Judeikis; G. S. Arnold; M. Hill; R. C. Young Owl; D. F. Hall
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Use Of A Cryogenically Cooled QCM In Conjunction With A Programmable Data Acquisition System To Detect And Examine Accreted Mass On The Sensing Crystal Caused By Environmental Contamination
Author(s): Donald A. Wallace; Scott A. Wallace
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Contamination Monitoring Approaches For EUV Space Optics
Author(s): David C. Ray; Roger F. Malina; Barry Y. Welsh; Steven J. Battel
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Results Of A CO[sub]2[/sub] BRDF Round Robin
Author(s): Thomas A. Leonard; Michael Pantoliano; James Reilly
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