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Proceedings of SPIE Volume 1164

Surface Characterization and Testing II
Editor(s): John E. Greivenkamp; Matthew Young
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Volume Details

Volume Number: 1164
Date Published: 20 December 1989
Softcover: 30 papers (277) pages
ISBN: 9780819402004

Table of Contents
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A Simple Hartmann Test Data Interpretation
Author(s): Daniel Malacara; Jose Castro
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Optimum Configuration Of The Offner Null Corrector: Testing An F/1 Paraboloid
Author(s): Jose M. Sasian
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Carrier-Based Automatic Phase-Shift Method
Author(s): H. M. Shi; J. Fang; F. L. Dai; G. C. Jin
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System For Phase Shifting Interferometry In The Presence Of Vibration
Author(s): Peter L. Wizinowich
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Fringe Variation And Visibility In Speckle-Shearing Interferometry
Author(s): Jing Fang
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Effects Of The Optical Transfer Function In Surface Profile Measurements
Author(s): E. L. Church; P. Z. Takacs
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Functional Integral Representation Of Rough Surfaces
Author(s): Gregg M. Gallatin
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Irradiance Moments Computed From Hartley Transform For Rough Surface Classification
Author(s): Christophe Gorecki; Michel Arpin
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Resolving Interferometric Step Height Measurement Ambiguities Using A Priori Information
Author(s): John E. Greivenkamp; Kevin G. Sullivan; Russell J. Palum
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Step Height Measurement Range Extended For An Interference Microscope Utilizing The Obliquity Effect
Author(s): James F. Biegen
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Calibration Of Surface Heights In An Interferometric Optical Profiler
Author(s): Katherine Creath
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Image Formation In Common Path Differential Profilometers
Author(s): M. G. Somekh; R. K. Appel
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Scanning Tunneling Microscopy Of Optical Surfaces
Author(s): J. Schneir; J. A. Dagata; H. H. Harary; C. J. Evans; A. J. Melmed; H. B. Elswijk; J. Sauvageau
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Measuring Surface Profiles With The Scanning Tunneling Microscope
Author(s): V. Elings; J. Gurley
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Development Of An Automatic Focusing Mechanism For An Interference Microscope
Author(s): D. K. Cohen; E. R. Cochran; J. D. Ayres
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Surface Profile Measurements Of Curved Parts
Author(s): T. C. Bristow; G. Wagner; J. R. Bietry; R. A. Auriemma
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High Resolution Optical Profiler
Author(s): Katherine Creath
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A Scanning Heterodyne Interferometer With Immunity From Microphonics
Author(s): M. J. Offside; M. G. Somekh; C. W. See
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Real Time Crystal Axis Measurements Of Semiconductor Materials
Author(s): Sidney Weiser
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Radial Metrology With A Panoramic Annular Lens
Author(s): Donald R. Matthys; Pal Greguss; John A. Gilbert; David L. Lehner; Amy S. Kransteuber
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British Standard On Surface Flaws
Author(s): Lionel R. Baker; Alan Chapman; Taj Wojtowicz
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The Scratch Standard Is Only A Cosmetic Standard
Author(s): Matt Young
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Vertical Profiling, CD Measurements, And 3D Surface Profiling With A Confocal Laser Scanning Microscope
Author(s): Tom Pommso; D. Awamura; T. Ode
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Surface Topography Measurements Over The 1 Meter To 10 Micrometer Spatial Period Bandwidth
Author(s): Peter Z. Takacs; Karen Furenlid; Robert A. DeBiasse; Eugene L. Church
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Suppression Of Tool Marks To Enhance Detection Of Surface Defects
Author(s): C. W. Carroll; N. W.H. Sufi; R. C. Chang
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Surface Analysis For The Characterization Of Defects In Thin Film Processes
Author(s): Ramin Lalezari; Robert G. Knollenberg
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Spacelab Optical Viewport Glass Assembly Optical Test Program For The Starlab Mission
Author(s): D. C. Massey
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Optical Measurement Of Roughness On Cylinders With Thick, Refractive Coatings
Author(s): Wilson M. Routt; Amalkumar P. Ghosh
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A Scanning Differential Intensity And Phase System For Optical Metrology
Author(s): R. K. Appel; M. G. Somekh; C. W. See
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Applications Of Laser Speckle In Metallic Corrosion
Author(s): K. Habib
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