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Proceedings of SPIE Volume 1163

Fringe Pattern Analysis
Editor(s): Graeme T. Reid
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Volume Details

Volume Number: 1163
Date Published: 20 November 1989
Softcover: 26 papers (266) pages
ISBN: 9780819401991

Table of Contents
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Field Shift Moire, A New Technique For Absolute Range Measurement
Author(s): Albert Boehnlein; Kevin Harding
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Sinusoidal Phase Modulating Laser Diode Interferometer With Feedback Control System To Eliminate External Disturbance
Author(s): Osami Sasaki; Kazuhide Takahashi; Takarnasa Suzuki
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Non-Contact Ranging Using Dynamic Fringe Projection
Author(s): M. M. Shaw; D. M. Harvey; C. A. Hobson; M. J. Lalor
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High-Precise Retardation Measurement Using A Phase Detection Of Young's Fringes
Author(s): Suezou Nakadate
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Hexflash Phase Analysis Examples
Author(s): Lawrence Mertz
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High Speed, Large Format Wavefront Sensor Employing Hexflash Phase Analysis
Author(s): Jimmy Roehrig; Paul Ehrensberger; Mark Okamura
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New Image Processing Algorithms For The Analysis Of Speckle Interference Patterns
Author(s): H. A. Vrooman; A. A.M. Maas
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Fringe Location By Means Of A Zero Crossing Algorithm
Author(s): K. J. Gasvik; K. G. Robbersmyr; T. Vadseth
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New Method Of Extracting Fringe Curves From Images
Author(s): K. Liu; J. Y. Yang
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Use Of Gray Scale Coding In Labeling Closed Loop Fringe Patterns
Author(s): V. Parthiban; Rajpal S. Sirohi
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An Assessment Of Some Image Enhancement Routines For Use With An Automatic Fringe Tracking Programme
Author(s): J. C. Hunter; M. W. Collins; B. A. Tozer
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A Quasi Heterodyne Holographic Technique And Automatic Algorithms For Phase Unwrapping
Author(s): D. P. Towers; T. R. Judge; P. J. Bryanston-Cross
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CCD Based Moire Interferometric Strain Sensor (MISS)
Author(s): A. Asundi; Kan Man Fung
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Profile Measurement By Projecting Phase-Shifted Interference Fringes
Author(s): S. Kakunai; K. Iwata; M. Hasegawa; T. Sakamoto
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Analysis Of Solute Concentration And Concentration Derivative Distribution By Means Of Frameshift Fourier And Other Algorithms Applied To Rayleigh Interferometric And Fresnel Fringe Patterns
Author(s): A. J. Rowe; S. Wynne Jones; D. Thomas; S. E. Harding
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Managing Some Of The Problems Of Fourier Fringe Analysis
Author(s): D. R. Burton; M. J. Lalor
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Multiwaveband Phase Interferometer
Author(s): B. R. Hill
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Fringe Modulation For The Separation Of Displacement Derivative Components In Speckle-Shearing Interferometry
Author(s): J. Fang; H. M. Shi
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Automated Laser-Diode Interferometry With Phase-Shift Stabilization
Author(s): Yukihiro Ishii
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Fringe Analyzer For A Fizeau Interferometer
Author(s): Kenji Yasuda; Ken Satoh; Masane Suzuki; Ichirou Yamaguchi
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Automatic Video Inspection Of A Diesel Spray
Author(s): V. K.H. Cheung; T. R. Judge; P. J. Bryanston-Cross
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A Scheme For The Analysis Of Infinite Fringe Systems
Author(s): J. C. Hunter; M. W. Collins; B. A. Tozer
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Spectral Contents Analysis Of Birefringent Sensors
Author(s): Alex S. Redner
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Correlation Of Fringe Patterns Using Multiple Digital Signal Processors
Author(s): D. A. Hartley; C. A. Hobson; S. Monaghan
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3-D Displacement Analysis Using Oblique Axis Speckle Photography
Author(s): E. W. Smith; Y. S. Tan; Y. M. He
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Accuracy Of Fringe Pattern Analysis
Author(s): Gui-Ying Wang; Xiao-Ping Ling
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