Share Email Print


Photonic Instrumentation Engineering VI
Editor(s): Yakov G. Soskind
For the purchase of this volume in printed format, please visit

Volume Details

Volume Number: 10925
Estimated Publication Date: 7 March 2019

Table of Contents
show all abstracts | hide all abstracts
Optimization for as-built performance
Author(s): Kenneth E. Moore
Show Abstract
Structural, Thermal, and Optical Performance (STOP) analysis of the NASA ARCSTONE instruments
Author(s): Christine Buleri; Mike Kehoe; Constantine Lukashin; Trevor Jackson; Jeff Beckman; Adam Curtis; Britney Edwards; Trevor Owen; Adam Phenis; Mike Stebbins
Show Abstract
Physical-optics simulation of optical interferometry systems (Conference Presentation)
Author(s): Site Zhang; Rui Shi; Christian Hellmann; Frank Wyrowski
Show Abstract
Lens design using grid-based surface optimization
Author(s): S. Gay; Z. Derocher; K. Moore
Show Abstract
Sub-nanosecond time-gated camera based on a novel current-assisted CMOS image sensor
Author(s): Thomas Lapauw; Hans Ingelberts; Thomas Van den Dries; Maarten Kuijk
Show Abstract
Focus adjustable motion-blur compensation method using deformable mirror
Author(s): Tomohiko Hayakawa; Kenichi Murakami; Jerome Pitogo de Leon; Masatoshi Ishikawa
Show Abstract
Active fiber-ring enhanced absorption gas spectroscopy using multi-longitudinal mode tunable laser in the NIR
Author(s): Mahmoud A. Selim; Yasser M. Sabry; George A. Adib; Diaa Khalil
Show Abstract
Photothermal microscopy characterization of multiphoton annealing of defects in thin-film coatings for high-power lasers
Author(s): Facundo Zaldívar Escola; Nélida Mingolo; Oscar E. Martinez; Jorge J. Rocca; Carmen S. Menoni
Show Abstract
Label-free 3D super-resolution nanoscope with large field-of-view
Author(s): Ivan Kassamakov; Tuomo Ylitalo; Anton Nolvi; Pekka Raatikainen; Riku Paananen; Edward Hæggström
Show Abstract
Characterization of fiber optics with femtosecond-infrared fiber Bragg gratings for extreme applications (Conference Presentation)
Author(s): Daniel Murphy; Peter Riley; Thomas Rugari; Gary Pickrell; Brian Risch; Stephen Rountree; Matthew Davis
Show Abstract
Characterization of gradient index optical components using experimental ray tracing
Author(s): Tobias Binkele; Rebecca Dylla-Spears; Michael A. Johnson; David Hilbig; Mahmoud Essameldin; Thomas Henning; Friedrich Fleischmann
Show Abstract
In-process monitoring of laser ablation on thin steel membranes by multispectral shape from-shading
Author(s): P. -P. Jacobs; B. Nelsen; Ch. Taudt; F. Rudek; P. Hartmann
Show Abstract
Analysis of HIMAP polarimeter (Conference Presentation)
Author(s): Juliana Mae Richter; Russell Chipman; Brian Daugherty; David J. Diner; Annmarie Eldering; Jason J. Hyon; Meredith Kupinski; Jessica L. Neu; Dejian Fu
Show Abstract
High-resolution wave front phase sensor for silicon wafer metrology
Author(s): J. M. Trujillo-Sevilla; O. Casanova Gonzalez; S. Bonaque-González; J. Gaudestad; J. M. Rodríguez Ramos
Show Abstract
Absolute calibration of a Shack-Hartmann wavefront sensor for measurements of wavefronts
Author(s): Alexander N. Nikitin; Ilya Galaktionov; Julia Sheldakova; Alexis Kudryashov; Nikolay Baryshnikov; Dmitrii Denisov; Valerii Karasik; Alexey Sakharov
Show Abstract
Thin-film characterization with a dual-channel dispersion-encoded imaging low-coherence interferometry approach
Author(s): Ch. Taudt; M. Preuß; B. Nelsen; T. Baselt; E. Koch; P. Hartmann
Show Abstract
Non-contact characterization of compound optical lenses using confocal microscopy and low-coherence interferometry (Conference Presentation)
Author(s): Mohamed T. El-Haddad; Yuankai K. Tao
Show Abstract
Quantitative phase imaging for surface roughness measurements to demonstrate variation of quality factor in crystalline whispering-gallery mode resonators (Conference Presentation)
Author(s): Maxime Jacquot; Guoping Lin; Aurélien Coillet; Souleymane Diallo; Laurent Larger; Yanne Chembo
Show Abstract
Chromatic line confocal technology in high-speed 3D surface-imaging applications
Author(s): Karri Niemelä
Show Abstract
An economical solution for high-throughput low-noise multi-channel spectroscopy
Author(s): Nassim Rahimi; Alain Price; Xinhua Pan; Askari Ghasempour; Francis Ndi
Show Abstract
Precision metrology through wavelength-demultiplexed laser interferometry (Conference Presentation)
Author(s): Zain Zaidi; Vala Fathipour; Connie Chang-Hasnain
Show Abstract
Stress metrology for flexible and flat-panel display manufacturing (Conference Presentation)
Author(s): Wei-Chun Hung; Raphael Morency; Wojtek J. Walecki
Show Abstract
Influence of numerical aperture (NA) on micro-reflectance spectroscopy
Author(s): Xinhua Pan; Nassim Rahimi; Alain Price; Askari Ghasempour; Francis C. Ndi
Show Abstract
True OEM terahertz systems for industrial applications
Author(s): N. Vieweg; A. Deninger; P. Leisching
Show Abstract
Multi-tone modulated continuous-wave lidar
Author(s): Rasul Torun; Mustafa M. Bayer; Imam Uz Zaman; Ozdal Boyraz
Show Abstract
Performance analysis of linearly-swept frequency-modulated continuous-wave ladar
Author(s): Thomas DiLazaro; George Nehmetallah
Show Abstract
Wavelength-locking of a semiconductor laser using an electronic technique
Author(s): K. Mullaney; J. Hodgkinson; S. E. Staines; R. P. Tatam
Show Abstract
Hybrid sensor based on microstructured hollow-core fiber for simultaneous measurement of strain and temperature
Author(s): M. S. Ferreira; J. Bierlich; J. Kobelke; J. L. Pinto; K. Schuster; K. Wondraczek
Show Abstract
A compact DUV spectrometer for wide-temperature entry, descent, and landing sensing applications
Author(s): Waylin J. Wing; Jim Holmes; Nicholas Chiolino; Paul Bourget; Sonia Perez; Matthew Barlow; A. Matt Francis
Show Abstract
Simulation study of optical detection of small particles by light scattering-type sensor with double-side mirror reflectors
Author(s): Kenya Nakai; Nozomi Enoki
Show Abstract
Vector Brillouin optical time-domain analysis with Raman amplification and optical pulse coding
Author(s): Ping Lu; Nageswara Lalam; Bo Liu; Michael Buric; Paul R. Ohodnicki
Show Abstract
Lens in a voice coil: a compact design approach for z-scanners
Author(s): Thomas Ruppel; Ronny Andronico; Michael Deyerler; Robert Mastromattei
Show Abstract
A frequency-modulated laser interferometer for nanometer-scale position sensing at cryogenic temperatures
Author(s): Adam J. Christiansen; David A. Naylor; Ian T. Veenendaal; Brad G. Gom
Show Abstract
Electro-optic-based pressure measurement and transmitter using lithium niobate (LiNbO3) Mach-Zehnder modulator for industrial application
Author(s): Yadvendra Singh; Sanjeev Kumar Raghuwanshi
Show Abstract
Polarized wavefront measurement using an electrically tunable focused plenoptic camera
Author(s): Zhaowei Xin; Dong Wei; Mingce Chen; Xiaoya Wang; Xinyu Zhang; Haiwei Wang; Changsheng Xie
Show Abstract
New microcontroller unit improving stability and functionality of the optical chopper for atmospheric LIDAR
Author(s): Margaret M. Allard; Jens Lautenbach; Luis Quintero
Show Abstract
Development of separation inspection technique for micro-cracks and particles using non-contact stress-induced light scattering method
Author(s): Yoshitaro Sakata; Nao Terasaki
Show Abstract
Microspectroscopy of nanomaterials, biological species, and live cells
Author(s): Jeffrey B. Oleske; Justin T. Cooper; Antoine Varagnat; Gerald Cairns
Show Abstract
Characterization of performance of back-illuminated SCMOS cameras versus conventional SCMOS and EMCCD cameras for microscopy applications
Author(s): Justin Cooper; Alan Mullan; Aleksandra Marsh; Marcin Barszczewski
Show Abstract

© SPIE. Terms of Use
Back to Top