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Adaptive X-Ray Optics V
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Volume Details

Volume Number: 10761
Date Published: 16 November 2018

Table of Contents
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Front Matter: Volume 10761
Author(s): Proceedings of SPIE
Metrology of micron focusing KB mirrors for SPB/SFX instrument and preliminary commissioning results at European XFEL
Author(s): I. Freijo Martín; R. Bean; M. Vannoni; H. Sinn
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The transform limited SXR monochromator with ultra-high-resolution option to open up new scientific capabilities at LCLS II (Conference Presentation)
Author(s): Daniele Cocco; Georgi L. Dakovski; Serge Guillet; Corey Hardin; Daniel Morton; Josep Nicolas; Frank P. O'Dowd; David Rich; Joseph A. Stieber; Randy A. Whitney
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Shaping the mirror profile by using a novel cooling scheme to increase optical design flexibility in high power XFELs (Conference Presentation)
Author(s): Corey L. Hardin; May Ling Ng; Daniel Morton; Lance Lee; Lin Zhang; Daniele Cocco
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Focusing optics system for the Time-resolved Molecular Optics (TMO) beam line at LCLS: surface metrology and mirror shape control of bendable mirror system
Author(s): Lance Lee; Daniele Cocco; May Ling Ng; Lin Zhang; Daniel Morton
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Development of the new long trace profilometer at LCLS for bendable x-ray mirror metrology
Author(s): M. L. Ng; J. Nicolas; D. Spiga; C. L. Hardin; D. S. Morton; D. Cocco
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Simulating the optical performances of the LCLS bendable mirrors using a 2D physical optics approach
Author(s): D. Spiga; D. Cocco; C. L. Hardin; D. S. Morton; M. L. Ng
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Ex-situ metrology and data processing techniques developed at the ALS for optimization of beamline performance of bendable x-ray mirrors
Author(s): Valeriy V. Yashchuk; Ian Lacey; Wayne R. McKinney
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Progress in development of adjustable optics for x-ray astronomy
Author(s): Vincenzo Cotroneo; Casey T. DeRoo; Thomas N. Jackson; Vladimir Kradinov; Tianning Liu; Vanessa Marquez; Paul B. Reid; Daniel A. Schwartz; Eric D. Schwartz; Mohit Tendulkar; Susan Trolier-McKinstry; Julian Walker
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Magnetostrictively deforming the surface of a silicon wafer at two locations
Author(s): M. P. Ulmer; R. Coppejans; M. A. Khreishi; K. Keely; D. B. Buchholz; R. Shiri; L. A. Rodriguez; A. E. O'Donnell; Z. J. Schonfeld; W. H. Reinhardt; L. E. Borgsmiller; T. B. Baturalp; V. L. Coverstone; J. Cao
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Inspecting adaptive optics with at-wavelength wavefront metrology
Author(s): J. Krempaský; F. Koch; P. Vagovič; L. Mikeš; A. Jaggi; C. Svetina; U. Flechsig; L. Patthey; S. Marathe; D. Batey; S. Cipiccia; C. Rau; F. Seiboth; M. Seaberg; C. David; U. H. Wagner
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Developments of EUV/x-ray wavefront sensors and adaptive optics at Imagine Optic
Author(s): Ombeline de La Rochefoucauld; Samuel Bucourt; Daniele Cocco; Guillaume Dovillaire; Fabrice Harms; Mourad Idir; Dietmar Korn; Xavier Levecq; Agathe Marmin; Lionel Nicolas; Martin Piponnier; Lorenzo Raimondi; Philippe Zeitoun
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Ptychography simulations for precisely measuring wavefront profiles in soft x-ray focusing system based on ellipsoidal mirror
Author(s): Yoko Takeo; Hiroto Motoyama; Yasunori Senba; Hikaru Kishimoto; Haruhiko Ohashi; Hidekazu Mimura
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Compact metrology beamline for EUV optic and adaptive optic tests (Conference Presentation)
Author(s): Philippe Zeitoun; Domenico Alj; Hugo Dacasa; Ombeline de La Rochefoucauld
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Real-time feedback for x-ray adaptive optics with an interferometric absolute distance sensor array
Author(s): Ernesto Abruña; Vivek G. Badami; Lei Huang; Mourad Idir
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Micro-focusing of broadband high-order harmonic radiation by a double toroidal mirror (Conference Presentation)
Author(s): Philippe Zeitoun; Hélène Couderc-Alteirac; Anne l'Huillier; Piotr Rudawski; Hugo Dacasa
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