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PROCEEDINGS VOLUME 10449 • new

Fifth International Conference on Optical and Photonics Engineering
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Volume Details

Volume Number: 10449
Date Published: 6 November 2017
Softcover: 74 papers (572) pages
ISBN: 9781510613720

Table of Contents
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Front Matter: Volume 10449
Author(s): Proceedings of SPIE
A digital holography microscopy system for DOE measurement
Author(s): Yun Xu; Beng Soon Tan; Gim Han Law; Jun Zhang
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Nondestructive identification of defects in additive manufacturing (AM) structures using continuous phase-shifted coherent gradient sensing method
Author(s): Kang Ma; Huimin Xie
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Stereoscopic shadow microscopy
Author(s): G. O. F. Parikesit; I. Kusumaningtyas
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Contact lens assisted imaging with integrated flexible handheld probe for glaucoma diagnosis
Author(s): Xun Jie Jeesmond Hong; Shinoj V. K.; V. M. Murukeshan; M. Baskaran; Tin Aung
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Three-dimensional shape measurement with modal phase measuring deflectometry
Author(s): Lei Huang; Junpeng Xue; Bo Gao; Mourad Idir
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Stability test of the silicon Fiber Bragg Grating embroidered on textile for joint angle measurement
Author(s): Thanit Apiwattanadej; Byung Jae Chun; Hyub Lee; King Ho Holden Li; Young-Jin Kim
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Geometric approach to the design of an imaging probe to evaluate the iridocorneal angle structures
Author(s): Xun Jie Jeesmond Hong; Shinoj V. K.; V. M. Murukeshan; Baskaran M.; Tin Aung
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Detection of grating asymmetries by phase-structured illumination
Author(s): M. L. Gödecke; S. Peterhänsel; D. Buchta; K. Frenner; W. Osten
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Effect analysis of material properties of picosecond laser ablation for ABS/PVC
Author(s): Y. H. Tsai; C. Y. Ho; Y. J. Chiou
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Imaging objects behind small obstacles using axicon lens
Author(s): Sandeep M. Perinchery; Anant Shinde; V. M. Murukeshan
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Microscopy using randomized speckle illumination
Author(s): Sandeep M. Perinchery; Anant Shinde; V. M. Murukeshan
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Fiber optic probe for region of interest (ROI) selective time averaged multi-fluorescence imaging
Author(s): Anant Shinde; Sandeep M. Perinchery; V. M. Murukeshan
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DMD based digital speckle illumination for high resolution imaging
Author(s): Anant Shinde; Ayush Mishra; Sandeep M. Perinchery; V. Matham Murukeshan
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Form error compensation of on-machine noncontact measurement of precision grinding for large and middle-diameter aspheric elements
Author(s): Jianpu Xi; Dongxu Ren; Bin Li; Zexiang Zhao
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Double image encryption in Fresnel domain using wavelet transform, gyrator transform and spiral phase masks
Author(s): Ravi Kumar; Basanta Bhaduri
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Application of adaptive optics for flexible laser induced ultrasound field generation and uncertainty reduction in measurements
Author(s): Lars Büttner; Felix Schmieder; Martin Teich; Nektarios Koukourakis; Jürgen Czarske
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Full-field 3D shape measurement of specular object having discontinuous surfaces
Author(s): Zonghua Zhang; Shujun Huang; Nan Gao; Feng Gao; Xiangqian Jiang
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Non-uniform fringe patterns for compensating the projector distortion in absolute phase map
Author(s): Wei Zhang; Liandong Yu; Weishi Li
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Analysis on ultrashort-pulse laser ablation for nanoscale film of ceramics
Author(s): C. Y. Ho; Y. H. Tsai; Y. J. Chiou
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Experimental study on nonlinear vibrating of aluminum foam using electronic speckle pattern interferometry
Author(s): Fujun Yang; Yinhang Ma; Nan Tao; Xiaoyuan He
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Out of the lab and into the fab: Nano-alignment as an enabler for Silicon Photonics’ next chapter
Author(s): Scott Jordan
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The research on surface characteristics of optical lens by 3D printing technique and precise diamond turning technique
Author(s): Chien-Yao Huang; Chun-Ming Chang; Cheng-Fong Ho; Tai-Wen Lee; Ping-Hung Lin; Wei-Yao Hsu
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Calibration of areal surface topography measuring instruments
Author(s): J. Seewig; M. Eifler
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Intensity and contrast based surface roughness measurement approaches for rough and shiny surfaces
Author(s): P. Prabhathan; Chaolong Song; Aswin Haridas; Guru Prasad; Kelvin Chan
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Experimental investigations and parametric studies of surface roughness measurements using spectrally correlated speckle images
Author(s): P. Prabhathan; Chaolong Song; Aswin Haridas; Guru Prasad; Kelvin Chan; Murukeshan V. M.
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Influence of partially coherent and partially polarized light on polarization imaging of an edge object
Author(s): Xiaoying Hu; Ailing Tian; Wei Wang
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Scatterometry for advanced process control in semiconductor device manufacturing
Author(s): Arie den Boef; Hugo Cramer; Stefan Petra; Bastiaan Onne Fagginger Auer; Jolanda Schmetz-Schagen; Armand Koolen; Olaf van Loon; Gudrun de Gersem; Pieter Klandermans; Eric Bakker
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A review of sensing technologies for small and large-scale touch panels
Author(s): Humza Akhtar; Qian Kemao; Ramakrishna Kakarala
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Multi-beam interferometric patterning in optically transparent materials
Author(s): Nicholas Tham; Y. J. Kim; Murukeshan V. M.
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A new flexible calibration method for intrinsic parameters of the camera
Author(s): Qun Wu; Zhen Liu
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A review of interferometric techniques with possible improvement in pattern resolution using near-field patterning
Author(s): J. Y. Pae; Murukeshan V. M.
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Multi-attribute automatic optimization method for lens system design
Author(s): Di Wu; Hua Fan; Jing Wang; Yan-lei Li
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Instrument transfer function for digital holography system
Author(s): Tao Sun; Anand K. Asundi; Yingjie Yu
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Detection method for the focusing performance of small fiber lens
Author(s): Shubo Bi; Chi Wang; Jun Zhu; Tingting Xu; Zhiwen Yuan
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Short-coherence in-line phase-shifting infrared digital holographic microscopy for measurement of internal structure in silicon
Author(s): Teli Xi; Jiazhen Dou; Jianglei Di; Ying Li; Jiwei Zhang; Chaojie Ma; Jianlin Zhao
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RONI-based steganographic method for 3D scene
Author(s): Xiao-Wei Li; Qiong-Hua Wang
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Novel adaptive fringe projection technique for high dynamic range 3D shape measurement
Author(s): Shaoxu Li; Feipeng Da; Li Rao
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Nondestructive inspection of aerospace composites by a fiber-coupled laser ultrasonics system
Author(s): J.-F. Vandenrijt; F. Languy; C. Thizy; M. P. Georges
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A fractal image analysis methodology for heat damage inspection in carbon fiber reinforced composites
Author(s): Aswin Haridas; Alexandru Crivoi; P. Prabhathan; Kelvin Chan; V. M. Murukeshan
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Snapshot hyperspectral imaging probe with principal component analysis and confidence ellipse for classification
Author(s): Hoong-Ta Lim; Vadakke Matham Murukeshan
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Spatial calibration and image processing requirements of an image fiber bundle based snapshot hyperspectral imaging probe: from raw data to datacube
Author(s): Hoong-Ta Lim; Vadakke Matham Murukeshan
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Fractal speckle image analysis for surface characterization of aerospace structures
Author(s): Aswin Haridas; Alexandru Crivoi; P. Prabhathan; Kelvin Chan; V. M. Murukeshan
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Imaging quality analysis of computer-generated holograms using the point-based method and slice-based method
Author(s): Zhen Zhang; Siqing Chen; Huadong Zheng; Tao Sun; Yingjie Yu; Hongyue Gao; Anand K. Asundi
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Comparison between ternary and binary Gray-code-based phase unwrapping methods
Author(s): Dongliang Zheng; Qian Kemao; Feipeng Da; Hock Soon Seah
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Improvement of phase measurement accuracy and stability in dual-wavelength common-path digital holographic microscopy
Author(s): Jianglei Di; Yu Song; Teli Xi; Jiwei Zhang; Ying Li; Chaojie Ma; Kaiqiang Wang; Jianlin Zhao
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Photo physical properties and estimation of ground and excited state dipole moments of acridine orange hemi zinc salt and acridine yellow G laser dyes
Author(s): Prabhu M. Meti; Ajeetkumar Patil; Jyoti N. Rayar; I. I. Pattanashetti
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Direct comb multi-heterodyne interference spectroscopy
Author(s): Keunwoo Lee; Jaehyeon Lee; Young-Jin Kim; Seung-Woo Kim
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Multimodal quantitative phase and fluorescence imaging of cell apoptosis
Author(s): Xinye Fu; Chao Zuo; Hao Yan
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Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystal
Author(s): Lichao Guan; Jiexiong Ding; Li Du; Achyut Adhikari; Anand Krishna Asundi
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Single-shot color fringe projection profilometry using two-step phase shifting and centerline marker
Author(s): Shuo Xing; Ping Chen; Yi Xiao
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A cross-scale constrained dynamic programming algorithm for stereo matching
Author(s): Sipei Cheng; Feipeng Da; Jian Yu; Yuan Huang; Shaoyan Gai
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Research on fast simplification algorithm of point cloud data
Author(s): Yuan Huang; Feipeng Da; Lin Tang; Jian Yu; Xing Deng; Shaoyan Gai
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Focusing light through strongly scattering media by controlling binary amplitude optimization using genetic algorithm
Author(s): Zhipeng Liu; Bin Zhang; Qi Feng; Zhaoyang Chen; Chengyou Lin; Yingchun Ding
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The study on surface characteristics of high transmission components by 3D printing technique
Author(s): Hui-Jean Kuo; Chien-Yao Huang; Wan-Hsuan Wang; Ping-Hung Lin; Ho-Lin Tsay; Wei-Yao Hsu
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Numerical study on the maximum small-signal gain coefficient in passively mode-locked fiber lasers
Author(s): Xin Tang; Jian Wang; Zhaoyang Chen; Chengyou Lin; Yingchun Ding
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Two-dimensional wavefront reconstruction based on double-shearing and least squares fitting
Author(s): Peiying Liang; Jianping Ding; Yangqing Zhu; Qian Dong; Yuhua Huang; Zhen Zhu
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Camera calibration based on virtual planar targets
Author(s): Zhentao Lin; Qican Zhang; Yuankun Liu; Hui Pan
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Fruit ripening using hyperspectral imaging
Author(s): Swetha .; Santhosh Chidangil; Tanvi Karpate; Anand Asundi
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Double-wavelength optical fiber laser and its application for large step height measurement
Author(s): Lianlian Dong; Fang Xie; Sen Ma; Yunzhi Wang; Liang Chen
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Controlled micro-wrinkling of ultrathin indium-tin-oxide films for transparency tuning
Author(s): Deyuan Wei; Milan Shrestha; Anand Asundi; Gih-Keong Lau
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Transmittance measurement using scanning LED
Author(s): Yao Ping; Rosmin Elsa Mohan; Gih-Keong Lau; Anand Krishna Asundi
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ST-LIBS for heavy element detection in complex matrices
Author(s): M. M. Tamboli; Unnikrishnan V. K.; Praveen Devangad; Muhammed Shameem K. M.; Santhosh C.
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Monitoring of laser material processing using machine integrated low-coherence interferometry
Author(s): Rouwen Kunze; Niels König; Robert Schmitt
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Fabrication of micro-optical components using femtosecond oscillator pulses
Author(s): Vanessa R. M. Rodrigues; Hema Ramachandran; Santhosh Chidangil; Deepak Mathur
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Surface roughness measurement of additive manufactured samples using angular speckle correlation
Author(s): Kapil Dev; Guru Prasad A. S.; Aswin H; Prabhathan P; Kelvin H. K. Chan; Murukeshan V. Matham
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The error correction for EMD profilometry
Author(s): Chenxing Wang; Feipeng Da
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Cylinder stitching interferometry: with and without overlap regions
Author(s): Junzheng Peng; Dingfu Chen; Yingjie Yu
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Development of intergrated laser triangulation sensor and the processing algorithm of light spot
Author(s): Wei Tao; Hongwei Yang; Hui Zhao; Xiao Chen
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High speed 3D shape measurements with motion compensation
Author(s): Shijie Feng; Chao Zuo; Qian Chen; Guohua Gu
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Defect detection of electronic circuit using digital holographic interferometry
Author(s): . Chanchal; P. K. Panigrahi
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3D/4D multiscale imaging in acute lymphoblastic leukemia cells: visualizing dynamics of cell death
Author(s): Sreelatha Sarangapani; Rosmin Elsa Mohan; Ajeetkumar Patil; Matthew J. Lang; Anand Asundi
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High-numerical-aperture sphericity measurement based on stitching interferometry
Author(s): Kebing Mou; Xin Wu; Yingjie Yu
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Size dependent studies of metal nanoparticles with bio-fluorophores
Author(s): Ajeetkumar Patil; Steffy Ballary; Sajan D. George; Santhosh Chidangil
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Artificial defects in CFRP composite structure for thermography and shearography nondestructive inspection
Author(s): P. Blain; J.-F. Vandenrijt; F. Languy; M. Kirkove; L.-D. Théroux; J. Lewandowski; M. Georges
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