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PROCEEDINGS VOLUME 10385

Advances in Metrology for X-Ray and EUV Optics VII
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Volume Details

Volume Number: 10385
Date Published: 27 October 2017
Softcover: 17 papers (178) pages
ISBN: 9781510612273

Table of Contents
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Front matter: Volume 10385
Author(s):
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Single-grating Talbot imaging for wavefront sensing and x-ray metrology
Author(s): Walan Grizolli; Xianbo Shi; Tomasz Kolodziej; Yuri Shvyd'ko; Lahsen Assoufid
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Speckle-based portable device for in-situ metrology of x-ray mirrors at Diamond Light Source
Author(s): Hongchang Wang; Yogesh Kashyap; Tunhe Zhou; Kawal Sawhney
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Investigation of HF-plasma-treated soft x-ray optical elements
Author(s): F. Eggenstein; M. Krivenkov; I. Rudolph; M. G. Sertsu; A. Sokolov; A. Varykhalov; J. Wolf; T. Zeschke; F. Schäfers
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Intrinsic resolving power of XUV diffraction gratings measured with Fizeau interferometry
Author(s): Samuel Gleason; Jonathan Manton; Janet Sheung; Taylor Byrum; Cody Jensen; Lingyun Jiang; Joseph Dvorak; Ignace Jarrige; Peter Abbamonte
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Characterization of a 150-mm long variable line spacing plane grating through interferometry
Author(s): M. Vannoni; I. Freijo-Martin
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Metrology of variable-line-spacing x-ray gratings using the APS Long Trace Profiler
Author(s): Janet Sheung; Jun Qian; Joseph Sullivan; Muriel Thomasset; Jonathan Manton; Sunil Bean; Peter Takacs; Joseph Dvorak; Lahsen Assoufid
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Recent developments in nanoradian-angle metrology
Author(s): Tanfer Yandayan
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A new ultra-high-accuracy angle generator: current status and future direction
Author(s): Christian F. Guertin; Ralf D. Geckeler
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A portable device for calibration of autocollimators with nanoradian precision
Author(s): Tanfer Yandayan
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A new optics metrology laboratory at CNPEM: metrology capabilities, performance, and future plans
Author(s): Bernd C. Meyer; Murilo B. da Silva
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X-ray optics laboratory at the ALS: current capabilities, new challenges, and tasks for further development (Conference Presentation)
Author(s): Ian Lacey; Gary P Centers; Gevork S. Gevorkyan; Sergey M. Nikitin; Brian V. Smith; Valeriy V. Yashchuk
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Status of the metrology laboratory for the LCLS II project (Conference Presentation)
Author(s): May Ling Ng; Corey L. Hardin; Josep Nicolas; Daniele Cocco
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Development of a high performance surface slope measuring system for two-dimensional mapping of x-ray optics
Author(s): Ian Lacey; Jérôme Adam; Gary P. Centers; Gevork S. Gevorkyan; Sergey M. Nikitin; Brian V. Smith; Valeriy V. Yashchuk
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Surface slope metrology of highly curved x-ray optics with an interferometric microscope
Author(s): Gevork S. Gevorkyan; Gary Centers; Kateryna S. Polonska; Sergey M. Nikitin; Ian Lacey; Valeriy V. Yashchuk
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New twist in the optical schematic of surface slope measuring long trace profiler
Author(s): Sergey M. Nikitin; Gevork S. Gevorkyan; Wayne R. McKinney; Ian Lacey; Peter Z. Takacs; Valeriy V. Yashchuk
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Development of relative angle determinable stitching interferometry for high-accuracy x-ray focusing mirrors
Author(s): Yingna Shi; Xudong Xu; Qiushi Huang; Hua Wang; Aiguo Li; Ling Zhang; Zhanshan Wang
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Fizeau stitching at the European Synchrotron Radiation Facility (ESRF)
Author(s): Amparo Vivo; Raymond Barrett
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Three-dimensional shape measurement for x-ray ellipsoidal mirror
Author(s): T. Kume; Y. Takei; S. Egawa; G. Yamaguchi; H. Motoyama; H. Mimura
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X-ray multilayer mid-frequency characterizations using speckle scanning techniques
Author(s): Hui Jiang; Shuai Yan; Dongxu Liang; Naxi Tian; Hua Wang; Aiguo Li
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