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PROCEEDINGS VOLUME 10373

Applied Optical Metrology II
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Volume Details

Volume Number: 10373
Date Published: 11 December 2017

Table of Contents
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Front Matter: Volume 10373
Author(s): Proceedings of SPIE
Usefulness of orthogonal basis sets for predicting optical performance of wavefronts with mid-spatial frequency error
Author(s): Zahra Hosseinimakarem; Angela D. Davies; Chris J. Evans
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Fusion of light-field and photogrammetric surface form data
Author(s): Danny Sims-Waterhouse; Samanta Piano; Richard K. Leach
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Expansion of measurement area of three-dimensional deformation measurement speckle interferometry with same sensitivities in three directions under consideration of measurement sensitivity
Author(s): Y. Arai
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Form and position measurement of sheet metal parts by boundary outlines extracting strategy
Author(s): Liqun Ma; Jingjing Fan; Zili Zhou; Yongqian Li
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Application of polarization in high speed, high contrast inspection
Author(s): Matthew J. Novak
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Measurement of polarization state of light using in-plane spin splitting
Author(s): Xiaodong Qiu; Zhaoxue Li; Zhiyou Zhang; Jinglei Du
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The photonic spin Hall effect sensor
Author(s): Linguo Xie; Zhiyou Zhang; Jinglei Du
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Vibration-immune compact optical metrology to enable production-line quantification of fine scale features
Author(s): Erik Novak
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Experimental investigation of natural convection in a rectangular cavity with two protruded half cylinders using a Mach-Zehnder interferometer
Author(s): Akhil Krishnan Maliackal; A. R. Ganesan; Annamalai Mani
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Authentication Sensing System Using Resonance Evaluation Spectroscopy (ASSURES)
Author(s): James D. Trolinger; Andrei K. Dioumaev; Amit K. Lal; Dave Dimas
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Optical mapping of surface roughness by implementation of a spatial light modulator
Author(s): Laura Aulbach; Franziska Pöller; Min Lu; Shengjia Wang; Alexander W. Koch
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Dimensional metrology of micro structure based on modulation depth in scanning broadband light interferometry
Author(s): Yi Zhou; Yan Tang; Qinyuan Deng; Lixin Zhao; Song Hu
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Phase measuring deflectometry for determining 5 DOF misalignment of segmented mirrors
Author(s): Angela Davies; Trent Vann; Christopher Evans; Mark Butkiewicz
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Deflectometry for measuring mount-induced mirror surface deformations
Author(s): Eric H. Frater; Laura E. Coyle
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General testing method for refractive surfaces based on reverse Hartmann test
Author(s): Ping Xu; Daodang Wang; Zhidong Gong; Zhongmin Xie; Rongguang Liang; Ming Kong; Jun Zhao; Linhai Mo; Shuhui Mo
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Geometrical error calibration in reflective surface testing based on reverse Hartmann test
Author(s): Zhidong Gong; Daodang Wang; Ping Xu; Chao Wang; Rongguang Liang; Ming Kong; Jun Zhao; Linhai Mo; Shuhui Mo
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Study of annular sub-aperture stitching interferometry for aspheric surfaces
Author(s): Zixin Zhao; Zhaoxian Xiao; Hangying Zhang
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Development of an oxygen saturation measuring system by using near-infrared spectroscopy
Author(s): K. Kono; E. Nakamachi; Y. Morita
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Metrology of semiconductor structures using novel Fabry Perot fringe stretching system
Author(s): Wojtek J. Walecki; Alexander Pravdivtsev
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Rapid, automated, quality control of diffraction grating efficiency
Author(s): Mark R. Fisher; Travis C. Burt
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Spatially and temporally resolved diagnostics of dense sprays using gated, femtosecond, digital holography
Author(s): James D. Trolinger; Andrei K. Dioumaev; Ali Ziaee; Marco Minniti; Derek Dunn-Rankin
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Multimodal and synthetic aperture approach to full-field 3D shape and displacement measurements
Author(s): M. Kujawińska; R. Sitnik
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Focusing schlieren systems using digitally projected grids
Author(s): Drew L'Esperance; Benjamin D. Buckner
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Application of instrument transfer function to a fringe projection system for measuring rough surfaces
Author(s): Bin Zhang; Angela Davies; John Ziegert; Christopher Evans
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A three-dimensional scanning apparatus based on structured illumination method and its application in dental scanning
Author(s): Jae Sung Ahn; Anjin Park; Ju Wan Kim; Byeong Ha Lee; Joo Beom Eom
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A calibration method immune to the projector errors in fringe projection profilometry
Author(s): Ruihua Zhang; Hongwei Guo
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Collimator focus check with interferometer
Author(s): H. L. Tsay; Y. C. Lin; S. T. Chang; T. M. Huang
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Characterizing the surface fluctuation of an epitaxial wafer by using a Shack-Hartmann wave-front sensor
Author(s): Pao-Keng Yang; Yao-Kai Zhuang
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Advanced polarization sensitive analysis in optical coherence tomography
Author(s): Aleksandra Wieloszyńska; Marcin R. Strąkowski
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Optical stabilization for time transfer infrastructure
Author(s): Josef Vojtech; Michal Altmann; Pavel Skoda; Tomas Horvath; Martin Slapak; Vladimir Smotlacha; Ondrej Havlis; Petr Munster; Jan Radil; Jan Kundrat; Lada Altmannova; Radek Velc; Miloslav Hula; Rudolf Vohnout
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Robust phase unwrapping algorithm for 3D profile measurement applications
Author(s): Meiqi Fang; Hong Zhao; Chunwei Zhang; Yueyang Ma; Changquan Zhou
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Measurement of vibration using phase only correlation technique
Author(s): S. Balachandar; K. Vipin
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