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PROCEEDINGS VOLUME 10291

Materials Characterization and Optical Probe Techniques: A Critical Review
Editor(s): Roger A. Lessard; Hilmar Franke
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Volume Details

Volume Number: 10291
Date Published: 30 June 1997
Softcover: 0 papers () pages
ISBN:

Table of Contents
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Front Matter: 10291
Author(s):
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Mid- and near-infrared spectroscopy of polymers: time-resolved studies and remote sensing applications
Author(s): S. Okretic; N. Voelkl; Heinz W. Siesler
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Four-wave mixing: applications to both fundamental research and photonics technology
Author(s): Paras N. Prasad
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Moessbauer spectroscopy of iron containing polymers
Author(s): Hilmar Franke
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UV-vis spectroscopy as an analytical tool for the characterization of polymers
Author(s): Gurusamy Manivannan
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Laser atomic fluorescence characterization of materials
Author(s): Sergey B. Mirov; Alex Yu. Dergachev
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Dielectric spectroscopy as an analytical technique for the characterization of polymeric solids
Author(s): G. J. Pratt; M. J. A. Smith
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SEM techniques for materials characterization
Author(s): Jacques Beauvais; Dominique Drouin; Raynald Gauvin
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Review of transmission electron microscopy for the characterization of materials
Author(s): R. Gauvin
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Materials analysis using high-energy ion scattering
Author(s): Emile J. Knystautas
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Characterization of optical materials using Auger electron spectroscopy
Author(s): Mark R. Davidson; Paul H. Holloway
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Surface analysis with scanning probe microscopy
Author(s): Todd G. Ruskell
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Holographic characterization of optical materials
Author(s): Roger A. Lessard
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Photothermal sensing techniques for thin-film characterization
Author(s): Zhouling Wu
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Core level spectroscopy for surface analysis
Author(s): Franz J. Himpsel; R. Treusch; I. Jimenez; Alan F. Jankowski; D. G. J. Sutherland; L. J. Terminello; C. Heske; Rupert C. C. Perera; D. K. Shuh; William M. Tong; James H. Underwood; J. A. Carlisle; T. A. Callcott; Jian Jun Jia; David L. Ederer; Dieter M. Gruen; Alan R. Krauss; D. C. Zuiker; Gary L. Doll
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EPR and ENDOR characterization of nonlinear optical materials
Author(s): Larry E. Halliburton
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Ellipsometry as a characterization technique
Author(s): Vo-Van Truong; Le-quang Nguyen
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SIMS characterization of optical materials
Author(s): Frederico Caccavale
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Characterization of polymeric films by integrated optics
Author(s): Jerome D. Swalen
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Electric-field-induced second harmonic generation
Author(s): Francois Kajzar
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Z-scan technique for nonlinear materials characterization
Author(s): Eric W. Van Stryland; Mansoor Sheik-Bahae
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Characterization of polymers and particles with the analytical ultracentrifuge
Author(s): Helmut H. Coelfen
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