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Proceedings of SPIE Volume 1019

Thin Film Technologies III
Editor(s): Karl H. Guenther; Hans K. Pulker
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Volume Details

Volume Number: 1019
Date Published: 27 February 1989
Softcover: 31 papers (244) pages
ISBN: 9780819400543

Table of Contents
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"Nonlinear Optical Effects In Organic Molecules And Polymers -Theory, Measurements And Devices"
Author(s): Paras N. Prasad
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Practical Aspects Of Pumping Systems For Optical Coating
Author(s): P. R. Denton; D. Boyarsky; A. Musset; I. C. Stevenson
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Effect Of Process Gas Mixture On Reactively DC Magnetron Sputtered (Al1_xSix)OyNz Thin Films
Author(s): Erik Bjornard
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Multilayer Optical Coating Fabrication By Ion Beam Sputter Deposition
Author(s): J. Becker; V. Scheuer
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Control And Activation Techniques For The Optimisation Of The Reactive Sputtering Of TiO2
Author(s): Kazuki Oka; Ronald P. Howson; Robert W. Lewin; Alaric G. Spencer
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Influence Of Substrate Temperature On Optical Absorption In TiO2 Films
Author(s): K. Rao Narasimha; S. Mohan
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Comparison Between Yttrium Oxide And Hydrogenated Amorphous Carbon Thin Films For Infrared Applications As Protective Coatings.
Author(s): E. Masetti; S. Scaglione; L. Caneve; G. Emiliani
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MAEIP Ti-N Thin Films
Author(s): Tian Dazhun; Yin Zhigiang; Yan Zhanggen; Wang Guoqing; Xu Zhiqian
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Microanalysis Of Thin Films
Author(s): Hans Bach; Klaus Bange
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Microstructure Analysis Of Thin Films Deposited By Reactive Evaporation And By Reactive Ion-Plating
Author(s): Karl H. Guenther; Boon Loo; David Burns; Jo Edgell; Debbie Windham; Karl-Heinz Muller
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High-Speed Ellipsometer For Thin-Film Deposition Monitoring
Author(s): W. H. Southwell; W. J. Gunning
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In-Situ Optical Monitoring Of Thin Films During Evaporation
Author(s): M. T. Gale; H. W Lehmann; H. Brunner; K. Frick
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A Flexible On-Line Correction Method For Automated Coating Processes
Author(s): Jaap Leeuwenburgh; Harm Salomons; Andre de Geus
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Optical Thickness Monitoring Of Dielectric Optical Filters Using A New In-Situ Photometer With High Signal Resolution And Excellent Long-Term-Stability
Author(s): Alfons Zoller; Michael Boos; Reinhard Herrmann; Werner Klug; Walter Lehnert
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Coating With High Performance For 10.6 µm Reflection On Large Size Mirrors
Author(s): Alain Marraud; Jacques Chapuis; Andre Rinchet
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High Performance AR Coatings For Germanium
Author(s): Ronald R. Willey
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Intrinsic Mechanical Stresses In Sputtered Aluminium Films
Author(s): Roland Zarwasch; Eduard P. Rille; Hans K . Pulker
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Partially Polarizing Stack For The Beam-Combiner With Anisotropic Element
Author(s): Ales A. Pesl
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Modern Optical Coating Technologies
Author(s): Hans K. Pulker
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Magnetron Sputtering Deposition Of Ultrathin W-Si Multilayers For X Rays Optics
Author(s): B. Vidal; J. Marfaing; P. Dhez
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Numerical And Experimental Evaluations Of Multilayer Mirror For Soft X-Rays
Author(s): K. Etoh; I. Kataoka; K. Ito
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Laser-Gyro Mirrors Of Differing Layer Structure
Author(s): Dirk-Roger Schmitt
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Development Of A Magneto-Optic Mirror Based On The Transverse Magnetic Kerr Effect
Author(s): Erich Alge; Roland Pfefferkorn
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Stability Of The Spectral Characteristics Of Ion Plated Interference Filters
Author(s): Johannes Edlinger; Jurgen Ramm; Hans K. Pulker
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Experiences With The Reactive Low Voltage Ion Plating In Optical Thin Film Production
Author(s): K. Gurtler; U. Jeschkowski; E. Conrath
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The Use Of Molecular Beam Techniques For The Fabrication Of Optical Thin Films And Structures
Author(s): I T Muirhead; K L Lewis; A M Pitt; A G Cullis; T J Wyatt-Davies; G Williams; A Miller
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Photonic Applications Of Thin Film Gaas Grown On Silicon And Insulating Substrates By Molecular Beam Epitaxy
Author(s): Jeffrey D. Morse; Glen M. McWright; Raymond P. Mariella; Charles F. McConaghey; Elaine M. Behymer; William H. Guthreau
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Gradient-Index Thin Films: An Emerging Optical Coating Technology
Author(s): W. Gunning
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Dielectric Filter Optimization By Simulated Thermal Annealing
Author(s): R. Morf; R. E. Kunz
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Reactive Evaporation And Plasma Processes For Thin Film Optical Coatings
Author(s): Johannes Ebert
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Linear Electrooptic Effect In Sputtered Polycrystalline LiNbO3 Films
Author(s): G. Griffel; S. Ruschin; N. Croitoru
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