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PROCEEDINGS VOLUME 1009

Surface Measurement and Characterization
Editor(s): Jean M. Bennett
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Volume Details

Volume Number: 1009
Date Published: 21 March 1989
Softcover: 36 papers (316) pages
ISBN: 9780819400444

Table of Contents
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Surface Measurement And Characterization
Author(s): Jean M. Bennett; Helen Vogele Gourley
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Automatic Inspection In Industry Today
Author(s): Richard A. Brook
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On A Few Functions Of HIPOSS (High Precision Optical Surface Sensor) And Their Applications
Author(s): Tsuguo Kohno
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Optical Methods Of Measuring Rough Surfaces
Author(s): K. Leonhardt; K.-H. Rippert; H. J. Tiziani
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Chromatic Probe For Surface Microtopography Inspection And Analysis
Author(s): G. Molesini; F. Quercioli; M. Trivi
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High Resolution Phase Measuring Laser Interferometric Microscope For Engineering Surface Metrology
Author(s): J. F. Biegen; R. A. Smythe
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Instrumental Effects In Surface Finish Measurement
Author(s): E. L. Church; P. Z. Takacs
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Limits Of Surface Measurement By Stylus Instruments
Author(s): Margaret Stedman; Kevin Lindsey
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Limits Of Surface Measurement By Optical Probes
Author(s): Margaret Stedman
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Statistical Analysis Of Random And Pseudo Random Rough Surfaces
Author(s): Monique Rasigni; Georges Rasigni; Francoise Varnier; Christophe Dussert; Jacqueline Palmari; Nicole Mayani; Antoine Llebaria
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Comparison Of Optical Scatterometer And Profilometer Techniques For Characterizing Smooth Surfaces
Author(s): R. D. Jacobson; S. R. Wilson; G. A. Al-Jumaily; J. R. McNeil; J. M. Bennett; L. Mattsson
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Scattering From Surfaces And Multilayer Coatings: Recent Advances For A Better Investigation Of Experiment
Author(s): C. Amra; P. Bousquet
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Measurement Of Scattering Curves Of Coated Or Uncoated Optical Surfaces: Experimental Techniques For Determining Surface Roughnesses
Author(s): E. Pelletier; P. Roche; C. Grezes-Besset
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Comparison Of Light Scattering From Rough Surfaces With Optical And Mechanical Profilometry
Author(s): R. Brodmann; M. Allgauer
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Relationship Between Near-Angle Scatter And Surface Characteristics
Author(s): Douglas W. Ricks
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Optimal Distribution Of Optical Fibers In Surface Roughness Sensor
Author(s): Andrzej W. Domanski; Tomasz R. Wolinski; Tomasz J. Rzysko
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Surface Smoothing Effects And Optical Scatter Characteristics Of Coated Metal Surfaces
Author(s): J. R. McNeil; G. A. Al-Jumaily; J. M. Bennett
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A Practical Total Integrated Scatterometer
Author(s): John M. Guerra
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Characterization Of Mirror Surfaces For Laser-Gyro Applications
Author(s): Dirk-Roger Schmitt
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Characterization Of Supersmooth Surfaces By Light Scattering Techniques
Author(s): Lars Mattsson
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Elastic Lightscattering Measurements Of Si-Surfaces
Author(s): Peter O. Hahn; Michael Kerstan
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Interface Scattering Of Light From Oxidized Copper Surfaces
Author(s): A. Roos; M. Bergkvist; C. G. Ribbing
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Assessment Of Surface Topography By X-Ray Scattering Measurements
Author(s): Bernd Aschenbach; Heinrich Brauninger
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X-UV And X-Ray Scattering Measurements From A Rough LiF Crystal Surface Characterized By Electron Micrography
Author(s): N. Alehyane; M. Arbaoui; R. Barchewitz; J-M. Andre; F. E. Christensen; A. Hornstrup; J. Palmari; M. Rasigni; R. Rivoira; G. Rasigni
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Validation Of A Local Defect Classification Procedure
Author(s): Aline Huard; Jean Paul Marioge; Jean Luc Hautcolas; Michel Munier
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Visual Assessment And Instrumental Quantification Of Optical Surfaces And Thin Film Coatings Relative To Their Roughness And Light Scattering
Author(s): Karl H. Guenther
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LASSI - A Scanning Differential Ac Interferometer For Surface Profile And Roughness Measurement
Author(s): G. Makosch
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Photon Tunneling Microscopy
Author(s): John M. Guerra
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Coherent Optical Analysis, Filtering And Correlation Of Reflected Images
Author(s): Paolo Sirotti
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Scanning Tunneling Microscopic Techniques Applied To Roughness Of Silver Surfaces
Author(s): James K. Gimzewski
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Ultrasonic Sensor For Measuring Surface Roughness
Author(s): G. V. Blessing; D. G. Eitzen
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Application Of Non-Stereoscopic Secondary Electron Microscopy And Optical Spectroscopy For The Evaluation Of A Pronounced Microroughness
Author(s): Michael Kohl; Thomas Walter; Karlhanns Gindele
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Use Of Surface Enhanced Raman Scattering To Characterize Metal Substrate
Author(s): Kamel M. El-Shokrofy; Sohair Negm; H. Talaat
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