Share Email Print
cover

PROCEEDINGS VOLUME 0954

Optical Testing and Metrology II
Editor(s): Chander Prakash Grover
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 0954
Date Published: 16 January 1989
Softcover: 92 papers (733) pages
ISBN: 9780892529896

Table of Contents
show all abstracts | hide all abstracts
Some New Techniques For Imaging Through Inhomogeneities
Author(s): E. N. Leith; A. Cunha
Show Abstract
Phase-Conjugate Interferometry Using Degenerate Four-Wave Mixing And Holography
Author(s): Kazuo Nakagawa; Nirofumi Fujiwara
Show Abstract
Pulsed Holography With Computer Vision For Nondestructive Testing In The Field Environment
Author(s): David L. Mader
Show Abstract
The Range Of Holographic Interferometry For Displacement Measuring
Author(s): Fang Jing; Dai Fulong
Show Abstract
Alignment Verification Using Holographic Correlation
Author(s): Kevin G. Harding; Mark Michniewicz
Show Abstract
Characterization Of DCG Holograms During The Production Process: Some Practical Aspects
Author(s): R. Pawluczyk; T. C. Billard; A. Quaglia; T. Vienneau; B. S. Hockley
Show Abstract
Holographic Interferometry Versus Lensless Speckle Photography
Author(s): R. D. Bahuguna; S. C.S. Lee; N. H. Abramson
Show Abstract
Aberration-Free Fraunhofer Holography Of Micro-Objects
Author(s): C. S. Vikram; M. L. Billet
Show Abstract
What Can Be Interferometered?
Author(s): P. Langenbeck
Show Abstract
Scan Interferometer
Author(s): P. Langenbeck; P. Gerspacher; D. Muller
Show Abstract
Phase-Measuring Interferometry: Applications And Techniques
Author(s): Jay A. Tome; H.Philip Stahl
Show Abstract
Phase-Measuring Interferometry: Performance Characterization And Calibration
Author(s): H.Philip Stahl; Jay A. Tome
Show Abstract
The Evaluation Of A Random Sampling Error On The Polynomial Fit Of Subaperture Test Data
Author(s): Jeff L. Lewis; William P. Kuhn; H.Philip Stahl
Show Abstract
Talbot Bands : Determination Of Material Dispersion
Author(s): M. Warenghem; C. P. Grover
Show Abstract
Optical Profiling Using An Interference Microscope
Author(s): B. Cencic; M. Barut; P. Langenbeck
Show Abstract
Coded Imaging By Self-Imaging Structures (SIS) And Applications
Author(s): S. C. Som; A. Satpathi
Show Abstract
An Interpretation Of Moire Tnterferometry From Wavefront Interference Theory
Author(s): Fu-long Dai; James McKelvie; Daniel Post
Show Abstract
Characterization Of Images Produced By Single And Multiple Apertures And Their Applications
Author(s): K. Hane; C. P. Grover
Show Abstract
Computer Moire© Deflectometry Using Talbot Effect
Author(s): V. I. Vlad; D. Popa; I. Apostol
Show Abstract
Moire Interferometry Applied To Topographic Contour Measurement
Author(s): Y. Z. Dai; F. P. Chiang
Show Abstract
Reflection Lau Imaging And Its Application To Displacement Sensing
Author(s): K. Hane; S. Hattori; C. P. Grover
Show Abstract
Moire Methods For Curvature Measurements
Author(s): Jacob Politch
Show Abstract
Comparison Of Interferometric Contouring Techniques
Author(s): Katherine Creath; James C. Wyant
Show Abstract
Interferometric Measurements Of Remote Surfaces Profile's Through An Optical Fiber
Author(s): Jose E. Calatroni; Carmen Sainz; Gilbert Tribillon
Show Abstract
Comparison Of Optical And Mechanical Measurements Of Surface Finish
Author(s): E. L. Church; J. C. Dainty; D. M. Gale; P. Z. Takacs
Show Abstract
Industrial Applications Of An Optical Profilometer
Author(s): A.J. C. Brown; U. Breitmeier
Show Abstract
Optical Enhancement Of Surface Contour Variations For Sheet Metal And Plastic Panel Inspection
Author(s): Rodger L. Reynolds; Omer L. Hageniers
Show Abstract
Surface Measurements And Applications For Manufactured Parts Using Noncontact Profilometer
Author(s): T. C. Bristow; A. Bouzid; J. Bietry
Show Abstract
Coordinate Mastering Using Optical Coupling
Author(s): Leonard H. Bieman
Show Abstract
Laser -Aided Spherometer
Author(s): Oliverio D. D. Soares; Jose F. Fernandez
Show Abstract
An Improved Fourier Transform Profilometry
Author(s): Xian-Yu Su; Jian Li; Lu-Rong Guo; Wan-Yong Su
Show Abstract
Interferometric Measurement Of The Roughness Of Machined Parts
Author(s): Katherine Creath; James C. Wyant
Show Abstract
Automated Optical Rouginess Inspection
Author(s): Jay H. Zimmerman; Theodore V. Vorburger; Howard T. Moncarz
Show Abstract
Comparison Of Techniques For The Measurement Of 3-Dimensional Surface Microtopography
Author(s): M. J. Fairlie; J. G. Akkerman; D. Smith; R. S. Timsit
Show Abstract
Rough Surfaces Classification Using Fourier Transform
Author(s): C. Gorecki
Show Abstract
High Precision And Miniaturized Mark Position Sensing Methods For 3-D Shape Measurement
Author(s): Masanori Idesawa
Show Abstract
A Non-Contact ED Sensor For Irterferometric End Gauge Calibration
Author(s): L. S. Tanwar; P. C. Jain
Show Abstract
Profilometry In The Angstrom Region
Author(s): Jacob Politch
Show Abstract
The Development Of ESPI With View-Points Of Optical System Set-Ups
Author(s): Ming-Wen Chang
Show Abstract
Digital Processing Of Young's Fringes In Speckle Photography
Author(s): D. J. Chen; F. P. Chiang
Show Abstract
Optical Surface Inspection Using A Transverse Speckle Detection Technique
Author(s): A. Oulamara; G. Tribillon; M. Spajer; J. Duvernoy
Show Abstract
New Method Of Contouring Using Digital Speckle Pattern Interferometry (DSPI)
Author(s): A. R. Ganesan; R. S. Sirohi
Show Abstract
A Fast Deformation Analysis Method By Digital Correlation Technique
Author(s): Qiang Fang; Hong Yiao; Yushan Tan; Chungshien Ku
Show Abstract
Changed Parameter Method In Photomechanics
Author(s): Fang Chen
Show Abstract
Holography In Science And Industry - Measurement With Picosecond Pulses
Author(s): Nils H. Abramson
Show Abstract
Elastic Scattering Of Light From A Few Atomic Dipoles On A Flat Metal Surface
Author(s): Ole Keller; Peter Sonderkaer
Show Abstract
Technologies In Aspherisation
Author(s): R. Hradaynath
Show Abstract
Optical Flatness Standard II: Reduction Of Interferograms
Author(s): William Primak
Show Abstract
In-Process Analysis Of Optical Components Machined On A Diamond Turning Lathe
Author(s): R. A. Parker
Show Abstract
Developments In Radial Metrology
Author(s): Pal Greguss; John A. Gilbert; Donald R. Matthys; David L. Lehner
Show Abstract
Testing Reflective Optical Surfaces With A Non-Contacting Probe
Author(s): G. Molesini; F. Quercioli; B. Tiribilli; M. Trivi
Show Abstract
State Of The Art Of Applications Of Holography In Medicine And Biology
Author(s): G. von Bally
Show Abstract
Review Of Optical Methods In Immunosensing
Author(s): Janusz W. Sadowski
Show Abstract
Biomedical Aspects Of Optical Testing
Author(s): Pal Greguss
Show Abstract
Digital Image Correlation Measurements Of Strain In Bovine Retina
Author(s): B. R. Durig; W. H. Peters; M. E. Hammer
Show Abstract
Some Experiments On The Perceived Size Of Laser Speckles
Author(s): R. D. Bahuguna; K. K. Gupta; K. Singh
Show Abstract
Traceability Of Optical Length Measurements
Author(s): Masaji Sawabe; Shigekata Ohta; Seiji Hiroshima
Show Abstract
Alignment Aspects Of The Optical System On The VEGA Spacelabs
Author(s): Gyorgy Abraham; Klara Wenzel
Show Abstract
Applications Of Neural Networks To The Manufacturing Environment
Author(s): H. J. Caulfield
Show Abstract
Image Processing Techniques For Fringe Pattern Analysis
Author(s): G. T. Reid
Show Abstract
The Analysis Of Precision In Digital Image Metrology
Author(s): D. I. Havelock
Show Abstract
Use Of The Radon Transform In Surface Inspection
Author(s): Christian Pieralli; Philippe Regnault; Gilbert Tribillon
Show Abstract
Procedures For Reliable Evaluation Of Measurement Data In Electrooptical Coordinate Measurement Systems
Author(s): C. P. Keferstein; H.-J. Warnecke
Show Abstract
Application Of Heterodyne Nrofilometry And Digital Image Processings To The Stufiilly Of Erosion Phenomena
Author(s): C. Pieralli; G. Tribillon
Show Abstract
Detection And Characterization Of Flaws On Machined Metal Surfaces
Author(s): Reza Safabakhsh; Rafael C. Gonzalez
Show Abstract
Vector Wave Imagery, Image Processing And Temporal Filtering
Author(s): A. K. Chakraborty
Show Abstract
Structurally Integrated Fiber Optic Recticulate Sensors (SIFORS) - The Key To Smart Structures
Author(s): R. M. Measures
Show Abstract
Quality Control Using Optical Probe Arrays
Author(s): Robert M. Stewart
Show Abstract
Misalignment Tolerances For A Phased Array Imaging System
Author(s): Eric W. Young; Shelah M. Peters
Show Abstract
Photometry And Radiometry Of Diode Emitters: LEDs And IREDs
Author(s): Kathleen Muray
Show Abstract
Infrared Sensors For Seam Tracking And Penetration Depth Control
Author(s): S. Nagarajan; W. H . Chen; K. N. Groom; B. A . Chin
Show Abstract
Design And E-0 Performance Of A Low Voltage Highly Reflective Dichroic LCD Using A/4 Plate
Author(s): Birendra Bahadur
Show Abstract
A Dual-Imager And Its Applications For Active Vision Robot Welding, Surface Inspection And Two Color Pyrometry
Author(s): X. Maldague; M. Dufour
Show Abstract
Application Of Photothermoelastic Effect To Noncontact Inspection Of Soldered Connections
Author(s): K. Hane; S. Hattori
Show Abstract
Photoelastic Simulation Technique Of Welding Residual Stresses
Author(s): H. Q. Zhang; Z. M. Lai
Show Abstract
Ontical Sensing Principles And Optic Sensor Buses
Author(s): Barry E. Paton
Show Abstract
Optical Heterodyne-Detection Schemes For Fiber-Optic Gyroscopes
Author(s): Yoshihiro Ohtsuka
Show Abstract
Fiber Optic Sensing Based On Counterpropagating Waves
Author(s): T. Valis; R. D. Turner; R. M. Measures
Show Abstract
Fiber Optic Geophysics Sensor Array
Author(s): Lucjan Grochowski
Show Abstract
Multifibre Sensor Systems Using Optical-RAM Detectors
Author(s): B. E. Paton; I. B. MacKay
Show Abstract
Fiber Optic Sensors With Internal Referencing
Author(s): Grigory Adamovsky; Duncan J. Maitland
Show Abstract
Discrete Measurement Of Field Distribution Ming Fiber Optic Microbend Sensor
Author(s): Mehdi Shadaram
Show Abstract
A Fibre Optic Fluid Level Sensor: Practical Considerations
Author(s): James W . Snow
Show Abstract
Positioning Error In Fiber-Optic Due To Focal Shift Produced By GRIN Connectors
Author(s): C. Gomez-Reino; J. Linares; J. R. Flores; E. Acosta
Show Abstract
Ultrahigh Resolution Optical Time-Domain Reflectometry
Author(s): B. K. Garside
Show Abstract
Robot Mounted Laser Scanner For Paint Inspection
Author(s): R. N. West; L. R. Baker; R. M. Atkinson; J. F. Claridge
Show Abstract
Photometric Camera Alignment And Focus Using Reflection
Author(s): David G. Labick; Judson B. Estes
Show Abstract
Portable Laser Tools For Vibration Measurement
Author(s): N. A. Halliwell
Show Abstract
Laser Alignment Techniques For Simultaneous Machine Tool Geometric Error Detection
Author(s): J. Ni; S. M. Wu
Show Abstract
A Laser-Based 3D Sensor For Teaching Robot Paths
Author(s): A. Makynen; J. Kostamovaara; R. Myllyla
Show Abstract
Laser-Based Instrument For Noncontact Measurement Of Fan-Belt Slippage
Author(s): Finn Mengel
Show Abstract
Optical Triangulation Using A CCD Array With Sub-Pixel Resolution
Author(s): Robert Jones; Lucy Rowbotham; Michael Pritchett
Show Abstract

© SPIE. Terms of Use
Back to Top