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Scanning Microscopy Technologies and Applications
Editor(s): E. Clayton Teague
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 0897
Date Published: 12 July 1988
Softcover: 27 papers (226) pages
ISBN: 9780892529322

Table of Contents
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Some History And Technology Of Scanning Microscopy
Author(s): H K Wickramasinghe
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Scanning Tunneling Microscopy: Instrument Design And Application In Air And Vacuum
Author(s): Sang-il Park; J Nogami; C F Quate
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Creating And Observing Surface Features With A Scanning Tunneling Microscope
Author(s): J Schneir; P K Hansma; V Elings; John Gurley; K Wickramasinghe; R Sonnenfeld
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Probing Surfaces With The Atomic Force Microscope
Author(s): O Marti; B Drake; S Gould; P K Hansma
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Atomic Force Microscope: Implementations
Author(s): P C. D Hobbs; Y Martin; C C Williams; H K Wickramasinghe
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The Scanning Optical Microscope: An Overview
Author(s): G S Kino; T R Corte; G Q Xiao
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Linear And Differential Techniques In The Scanning Optical Microscope
Author(s): M.Vaez Iravani; C W See
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Infrared Beam Induced Contrast With Double Illumination
Author(s): A Castaldini; A Cavallini
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Deteriorating Effects Of Beam Truncation On Focus Sensing Systems
Author(s): Gregory Toker; Andrei Brunfeld; Joseph Shamir
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Photothermal Microscope
Author(s): N J Dovichi; D S Burgi
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Ultra-Violet Confocal Metrology
Author(s): Simon D Bennett; Eric A Peltzer; Ian R Smith
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Scanning Near-Field Optical Microscopy (SNOM*): Basic Principles And Some Recent Developments
Author(s): D. W. Pohl; U. Ch. Fischer; U. T. Durig
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Near-Field Scanning Optical Microscopy (NSOM)
Author(s): E Betzig; M Isaacson; H Barshatzky; A Lewis; K Lin
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Surface Plasmon Scanning Microscopy
Author(s): Eric M Yeatman; Eric A Ash
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Scanning Capacitance Microscopy
Author(s): J R Matey
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Acoustic Microscopy
Author(s): B T Khuri-Yakub
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Thermal And Photothermal Imaging On A Sub 100 Nanometer Scale
Author(s): C C Williams; H K Wickramasinghe
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Thermal Wave Imaging: Detection Of Subsurface Features In Opaque Solids
Author(s): John C Murphy; Leonard C Aamodt; Jane W Maclachlan
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Externally Pressurised Bearings For Systems Leading To Nanometer Technology
Author(s): K J Stout; M Tawfik
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Magnetic Bearings For Precision Linear Slides
Author(s): David B Eisenhaure; Alexander Slocun; Richard Hockney
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Scanning Tomographic Acoustic Microscopy
Author(s): G Wade; A Meyyappan
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Application Of The PIPE Image Processing Machine To Scanning Microscopy
Author(s): Martin Herman
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Determination Of Fields Near A Silver Strip On A Glass Substrate
Author(s): Egon Marx; E.Clayton Teague
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Scanning Soft X-Ray Microscopy
Author(s): John A Trail; Robert L Byer
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High-Resolution Capacitance Measurement By Force Microscopy: Application To Sample Characterization And Potentiometry
Author(s): David W Abraham; Yves Martin; Kumar Wiekramasinghe
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Image Processing And Control Workstation For Scanning Microscopy
Author(s): A E Dixon; J A Smith; T A Gutjahr
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High Resolution Phase Measuring Laser Interferometric Microscope For Engineering Surface Metrology
Author(s): J F Biegen; R A Smythe
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