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Proceedings of SPIE Volume 0816

Interferometric Metrology
Editor(s): Norbert A. Massie
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Volume Details

Volume Number: 0816
Date Published: 23 March 1987
Softcover: 17 papers (239) pages
ISBN: 9780892528516

Table of Contents
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Interferometric Metrology: Current Trends And Future Prospects
Author(s): P. Hariharan
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Interferometric Testing Of Aspheric Surfaces
Author(s): James C. Wyant
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Digital Heterodyne Interferometry
Author(s): N. A. Massie
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Automated Fringe Reduction Techniques
Author(s): Amar Choudry
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Interferometric Testing Technology Developments And Applications In Japan
Author(s): Toyohiko Yatagai
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Accuracy Analysis And Improvements To The Hewlett-Packard Laser Interferometer System
Author(s): C. Steinmetz; R. Burgoon; J. Herris
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Recent Advances In Interferometry At Zygo
Author(s): R. A. Smythe; J. A. Soobitsky; B. E. Truax
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Surface Measurements With A Non-Contact Nomarski-Profiling Instrument
Author(s): Thomas C. Bristow; Dag Lindquist
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Wyko Systems For Optical Metrology
Author(s): Katherine Creath
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The Holography Of Phase Objects
Author(s): James D. Trolinger
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Review Of Methods For Automatic Analysis Of Fringes In Hologram Interferometry
Author(s): Ryszard J. Pryputniewicz
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Absolute Distance Interferometry
Author(s): N. A. Massie; H.John Caulfield
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Interferometry At The University Of Arizona
Author(s): David S. Anderson
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Shearing Interferometry: A Flexible Technique For Wavefront Measurement
Author(s): John W. Hardy; Alan J. MacGovern
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Advanced Wavefront Sensing At Lockheed
Author(s): Osuk Y Kwon
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Interferometric Measurements At Eastman Kodak Company
Author(s): J. E. Greivenkamp
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Interferometric Testing At Perkin-Elmer
Author(s): D. R. Eastman
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