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Characterization of Very High Speed Semiconductor Devices and Integrated Circuits
Editor(s): Ravinder K. Jain
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Volume Details

Volume Number: 0795
Date Published: 2 February 1988
Softcover: 31 papers (369) pages
ISBN: 9780892528301

Table of Contents
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Survey Of High Speed Test Techniques
Author(s): Tushar Gheewala
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Modulation-Doped Fets And Other High Speed III-V Transistors
Author(s): H. Unlu; H. Morkoc
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Progress On InP/InGaAs(P) Heterojunction Bipolar Transistors
Author(s): P. Schuitemaker; P. A. Houston; P. N. Robson
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Monte-Carlo Study Of Ballistic Transport In Heterojunction Bipolar Transistors (HJBTs) And In High Electron Mobility Transistors (HEMTs)
Author(s): J. L. Pelouard; R. Castagne; P. Hesto
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Millimeter Wave Monolithic GaAs Power FET Amplifiers
Author(s): B. Kim; H. Q. Tserng; H. D. Shih
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High Electron Mobility Transistors For Millimeter Wave And High Speed Digital IC Applications
Author(s): Aditya K. Gupta; J. A. Higgins; Chien-Ping Lee
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Ultrahigh Speed Evaluation Of GaAs ICs For Engineering Characterization And Production Test: Problems And Approaches
Author(s): Richard C. Eden; J. Elwood Clarke
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High Performance Silicon Bipolar Technology
Author(s): G. P. Li; M. B. Ketchen
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Testing Monolithic GaAs MMIC Circuits
Author(s): Allen Podell; Doug Lockie
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Measurement Considerations For Future High Speed Computer Packaging
Author(s): G. V. Kopcsay; G. Arjavalingam; A. Deutsch
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Electrical Sampling Techniques
Author(s): Sedki M. Riad
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Improved Electrical Measurement Techniques For The Characterization Of Microwave Field Effect Transistors
Author(s): Steven E. Rosenbaum; Octavius Pitzalis; Joe M. Marzan
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Ultrawide Bandwidth Instrument Based On Josephson Junctions
Author(s): E. Hanson; G. Hohenwarter; S. Whiteley; S. M. Faris
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Wideband Probing Techniques For Planar Devices: A Review
Author(s): Eric w. Strid
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Electron Beam Testing And Its Applications To VLSI Technology
Author(s): S. V. Pabbisetty; Kumar Gavisetty; Steve Vaughan; Kendall Scott Wills
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Ultrahigh Speed Electron Beam Pulsing Systems For Electron Beam Testing
Author(s): John T.L. Thong; Simon C.J. Garth; William c. Nixon; Alec N. Broers
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Noncontact Testing Of Integrated Circuits Using An Electron Beam Probe
Author(s): E. Menzel; R. Buchanan
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Photoelectron Scanning Electron Microscope (PSEM) For High Speed Noncontact Testing
Author(s): P. May; J. M. Halbout; G. Chiu
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Cross-Talk And Transit-Time Effects In Stroboscopic Voltage Measurements Via Electron Emission
Author(s): R. Clauberg; A. Blacha; H. Beha
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Photoconductor Pulse Generators And Sampling Gates For Characterization Of High-Speed Devices And Transmission Lines
Author(s): Nicholas G. Paulter; Robert B. Hammond
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Picosecond Photoconductive Sampling Measurements Of The Scattering Parameters Of High Speed Field Effect Transistors
Author(s): Steven C. Moss; Duane D. Smith; Donald E. Cooper
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Characterization Of Logic Devices With Photoconductively Generated Picosecond Pulses
Author(s): J. M. Halbouti; P. G. May; M. B. Ketchen
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Fundamentals Of Laser Photoemission For Testing High Speed Devices And Circuits
Author(s): G. w. Rubloff; H. Beha
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Picosecond Photoemission Sampling For Contactless High Speed Integrated Circuit Diagnostics
Author(s): A. Blacha; R. Clauberg; H. Seitz; W. Wolz; H. Beha
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Picosecond Resolution Sampling Via Multiphoton Photoemission
Author(s): A. M. Weiner; P. S.D. Lin; R. B. Marcus
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Electro-Optic Sampling: Device Embodiments And Possibilities
Author(s): Gerard A. Mourou
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Electro-Optic Sampling In Gallium Arsenide
Author(s): Brian H. Kolner
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Analysis Of High Speed GaAs ICs With Electro-Optic Probes
Author(s): X. C. Zhang; R. K. Jain
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Electro-Optic Sampling Using Injection Lasers
Author(s): J. M. Wiesenfeld; A. J. Taylor; R. S. Tucker; G. Eisenstein; C. A. Burrus
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Systems Solutions Based On Electro-Optic Sampling To High Speed Ic Test Problems
Author(s): Francois J. Henley; Douglas B. MacDonald
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Simple And Inexpensive Method For Testing High Speed Semiconductor Devices Using Electro-Optics Sampling
Author(s): K. W. Forsyth; R. S. Jones; J. R. Lindemuth
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