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Proceedings of SPIE Volume 0794

Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices
Editor(s): Orest J. Glembocki; Fred H. Pollak; Jin-Joo Song
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Volume Details

Volume Number: 0794
Date Published: 22 April 1987
Softcover: 42 papers (288) pages
ISBN: 9780892528295

Table of Contents
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An Overview Of Optical Characterization Of Semiconductor Structures And Alloys
Author(s): K. K. Bajaj; D. C. Reynolds
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Characterization Of Optical And Transport Properties Of Semiconductors: A Photothermal Approach
Author(s): Nabil M. Amer
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Scanning Photoluminescence
Author(s): E. K. Riemer; T. G. Stoebe; A. Azim Khan
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Photoluminescence Studies Of Donors In MBE-Grown ZnSe
Author(s): J. E. Potts; T. L. Smith; H. Cheng
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Time-Resolved Thermal And Acoustic Pulse-Echo Measurements In Condensed Matter
Author(s): Gary L. Eesley; Carolyn A. Paddock; Bruce M. Clemens
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Use Of Photoluminescence Spectroscopy To Characterize The Crystalline Quality Of Cdte Films Grown By A Modified Csvt Technique
Author(s): J. G. Mendoza-Alvarez; F. Sanchez-Sinencio; O. Zelaya; J. Gonzalez-Hernandez; M. Cardenas; S. S. Chao
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Optical Characterization Of Single Quantum Wells Fabricated Under Conditions Of Interrupted Growth
Author(s): B. S. Elman; Emil S. Koteles; C. Jagannath; Y. J. Chen; S. Charbonneau; M. L.W. Thewalt
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Spectrally Filtered Cathodoluminescence Of CdTe
Author(s): L. O. Bubulac; J. Bajaj; W. E. Tennant; P. R. Newman
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Optical Characterization Of GaAs/AlxGai-xAs Quantum Well Structures And Superlattices By Photoluminescence And Photoexcitation Spectroscopy.
Author(s): J. J. Song; Y. S. Yoon; P. S. Jung; A. Fedotowsky; Y. B. Kim
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Low Temperature Photoluminescence Signature Of A Two-Dimensional Electron Gas
Author(s): Emil S. Koteles; J. Y. Chi; R. P. Holmstrom
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Photoluminescence And Stimulated Emission Of Highly Excited Gaas/A1Gaas Single Quantum Wells
Author(s): S. Borenstain; D. Fekete; Arza Ron; E. Cohen
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Photoreflectance Characterization Of Microstructures Using A Dye Laser System
Author(s): O. J. Glembocki; B. V. Shanabrook
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Electroreflectance And Photoreflectance Characterization Of The Space Charge Region In Semiconductors: Ito/Inp As A Model System
Author(s): R. N. Bhattacharya; H. Shen; P. Parayanthal; Fred H. Pollak; T. Coutts; H. Aharoni
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Comparative Responses Of Electroreflectance And Photoreflectance In Gaas
Author(s): R. Glosser; N. Bottka
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Photoreflectance Spectroscopy Studies Of Alloy Compositions And Ion Implant Damage In Zincblende-Type Semiconductors
Author(s): R. C. Bowman; R. L. Alt; K. W. Brown
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Piezomodulated Electronic Spectra Of Semiconductor Heterostructures: Gaas/Alxgal_Xas Quantum Well Structures
Author(s): Y. R. Lee; A. K. Ramdas; F. A. Chambers; J. M. Meese; L. R. Ram Mohan
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Characterization By Electroreflectance Of Thin Films And Thin Film Interfaces In Layered Structures.
Author(s): G. Niquet; J. P. Dufour; G. Chabrier; M. Q' Jani; P. Vernier
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Study Of GaAs/AlGaAs And InGaAs/GaAs Multiple Quantum Wells Grown On Non-Polar Substrates By Photoreflectance
Author(s): U. K. Reddy; G. Ji; R. Houdre; H. Unlu; D. Huang; H. Morkoc
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Approaches To Enhancing The Sensitivity Of Direct Coupled Photoacoustic Spectroscopy As Applied To Gaas
Author(s): Bruce K. Janousek; Richard C. Carscallen
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Microwave-Detected Photoconductivity-Transient Spectroscopy For Non-Destructive Evaluation Of Gaas Wafers
Author(s): R. J. Gutmann; J. M. Borrego; C. S. Lo; M. C. Heimlich; O. Paz
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Spatial Characterization Of Semiconductors Using 'Laser Beam Induced Current (LBIC)'
Author(s): J. Bajaj; L. O. Bubulac; P. R. Newman; W. E. Tennant
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Infrared-Wavelength Modulation Spectra Of InGaAs Grown By MBE And LPE
Author(s): T. W. Nee; T. L. Cole; A. K. Green; M. E. Hills; C. K. Lowe-Ma; Victor Rehn
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Defect Detection In Silicon By Optical Beam Induced Reflectance (OBIR)
Author(s): G. E. Carver; J. D. Michalski
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Growth Of Atomic Layer Structures By Modified MOCVD And Their Characterization
Author(s): Y. Horikoshi; N. Kobayashi; T. Toriyama
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Raman Microscopy Of Semiconductor Films
Author(s): Philippe M Fauchet; Ian H. Campbell
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Raman Scattering From Semiconductor Thin Films
Author(s): Howard E. Jackson; Joseph T. Boyd; Samhita Dasgupta; Hsindao E. Lu; Thomas D. Mantei
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Raman Scattering For Semiconductor Interface Analysis
Author(s): R. J. Nemanich
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Raman And Optical Spectroscopy Of Nanocrystalline Silicon Films
Author(s): Z. Iqbal; S. Veprek
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Optical Characterization Of Monocrystalline Silicon Carbide Thin Films
Author(s): H. J. Kim; R. F. Davis
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Electric Field And Impurity-Induced Symmetry Forbidden Lo Phonon Raman Scattering In Heavily Doped <100> N-Gaas
Author(s): H. Shen; P. Parayanthal; Fred H. Pollak; R. N. Sacks; G. Hickman
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Far Infrared Reflectance Spectroscopy Of AlAs-GaAs Microstructures
Author(s): R. Sudharsanan; S. Perkowitz; S. S. Yom; T. J. Drummond
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Infrared Reflectance Spectroscopy Of Ion-Implanted Soi Structures
Author(s): Bea M Lacquet; Pieter L Swart
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Raman Scattering Characterization Of Quantum Wells And Superlattices
Author(s): Carl Colvard
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A Complete System For Semiconductor Characterization Incorporating Both Photoluminescence And Raman Spectroscopy
Author(s): F . J. Purcell; Raymond Kaminski
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Optical Characterization Of Epitaxial And Doped Semiconductors
Author(s): M. Geddo; D. Maghini; A . Stella; M. Cottini
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Non-Destructive Characterization Of Carrier Concentration And Thickness Uniformity For Semiconductors Using Infrared Reflectance Spectroscopy
Author(s): D. K. Gaskill; J. Davis; R. S. Sillmon; M. Sydor
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Picosecond Transient Reflectivity Of Photowashed Gallium Arsenide Surfaces
Author(s): J. E. Wessel; S. M. Beck; D. C. Marvin
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In Situ Ellipsometry Characterization Of The Growth Of Thin Film Amorphous Semiconductors
Author(s): R. W. Collins; J. M Cavese
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Spectroellipsometric Characterization Of Inhomogeneous Films
Author(s): B. A. Tirri; A. Turner; P. C. Van Buskirk
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Nonlinear Transmission Of Semiconductor Thin Films
Author(s): E. W. Van Stryland; Steven A. Miller; B. S. Wherrett
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Reflected Millimeter Wave Power From Moving Strip Illuminated Semiconductor Panel (RMWPFMSISP)
Author(s): M. H. Rahnavard; A. Habibzadeh
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Resonant Atr (Attenuated Total Reflection) Spectroscopy & The Nondestructive Characterization Of Multilayer Structures
Author(s): Bruno Bosacchi; Robert C. Oehrle
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