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Proceedings of SPIE Volume 0699

Laser and Opto-Electronic Technology in Industry: State-of-the-Art Review
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Volume Details

Volume Number: 0699
Date Published: 28 October 1987
Softcover: 21 papers (209) pages
ISBN: 9780892527342

Table of Contents
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Wavelength Compensation For Hoe
Author(s): Charles S. Ih; B. H. Zhuang
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Electronic Speckle Pattern Interferometry (E.S.P.I) For Dynamic Studies
Author(s): Oliverio D.D. Soares
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Optoelectronic Techniques For Measurement And Inspection
Author(s): Lionel R. Baker
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Solutions To Industrial Problems Using Laser And Opto-Electronics Technologies - Some Specific Examples
Author(s): S. M. Bose
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Vibration Analysis Of Large-Sized Structure Using Cw Laser Holographic Interferometry
Author(s): Hajime Yamashita
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New Optical Measurement Methods In Western Europe
Author(s): William F. Fagan
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Applications Of Coherent Optics At ISL
Author(s): P. Smigielski
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Holographic Interferometry As Means For Nondestructive Testing And Flaw Quantization
Author(s): W. Juptner
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Imaging Techniques For Gas Turbine Development
Author(s): P. A.E. Stewart
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Industrial Holography - The Rolls-Royce Experience
Author(s): R. J. Parker; D. G. Jones
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Panoramic Holocamera For Tube And Borehole Inspection
Author(s): Pal Greguss
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The Optical Characterization Of Electronic Materials
Author(s): Roy F. Potter
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Optical Strain Measurement Of Rotating Components
Author(s): Richard W.T. Preater
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Quantitative Interpretation Of Holograms And Specklegrams
Author(s): Ryszard J. Pryputniewicz
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Real-Time Laser And Microcomputer System For Controlling The Process Of Producing Ultra-Thin Tungsten Wires Under 10 4On
Author(s): Hu Lin
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Real Time Speckle Shearography Using Bso Crystals
Author(s): Wang Tianji; Li Yaotang; Fan Shaowu; Zhang Shichao
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Laser Speckle Technique For Hydraulic Structure Model Test
Author(s): Zhang Jingjian; Wei Qun; Wang Liangyuan; Zhang Songnian
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Application Of Photocarrier To Photoelasticity, Holography, And Speckle
Author(s): Xu Zhu; Guan Yu-nin; Zhang Bao-he; Chen Yu-zhou
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Study Of Ho Lo-Speckle Interferometry
Author(s): Jiabi Chen
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Common Path Shearing Fringe Scanning Interferometer
Author(s): Xiaoming Ren; Yao Gang; Jingtang Ke
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Laser Interferometry Applied To Non-Destructive Testing Of Tires
Author(s): Ke Jingtang; He Yuning; Yao Gang
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