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PROCEEDINGS VOLUME 0691

X-Ray Imaging II
Editor(s): D. Keith Bowen; Larry V. Knight
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Volume Details

Volume Number: 0691
Date Published: 12 August 1986
Softcover: 19 papers (155) pages
ISBN: 9780892527267

Table of Contents
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Measured 1 to 40 keV Photoabsorption Cross Sections for: Fe, Ni, Sn, Ta, Pt, Au, Pb, U
Author(s): Nancy Kerr Del Grande
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Normal Incidence Reflection Multilayer Optics for Solar Soft X-Ray/Extreme Ultraviolet (XUV) Observations
Author(s): Joakim F. Lindblom; Arthur B. C. Walker; Troy W. Barbee
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Metal Reflectors in the EUV
Author(s): Marion L. Scott; Paul N. Arendt; Bernard Cameron; Richard Cordi; Brian Newnam; David Windt; Webster Cash
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Simultaneous, Nondestructive Analysis Of Thickness And Composition Of Multilayer Metal Films Using A Fundamental Parameter XRF Approach.
Author(s): R. Linder; G. Kladnik; J. Augenstine
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Imaging at Soft X-ray Wavelengths with High-Gain Microchannel Plate Detector Systems
Author(s): J.Gethyn Timothy
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The performance of CCD array detectors for application in high-resolution tomography
Author(s): J. H. Kinney; Q. C. Johnson; U. Bonse; R. Nusshardt; M. C. Nichols
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X-Ray Multilayer Optic Development For Plasma Diagnostic And Source Enhancement
Author(s): L. N. Koppel; E. D. Franco; J. A. Penkethman; B. Rodrigues
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Monochromatization By Multilayered Optics On A Cylindrical Reflector And On An Ellipsoidal Focusing Ring
Author(s): Gerald F. Marshall
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Curved Silicon Substrates For Multilayer Structures
Author(s): R. C. Woodbury; H. Fan; L. V. Knight; J. M. Thorne
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Theoretical Considerations in the Design of Multilayer X-Ray Optics
Author(s): Raymond T. Perkins; James M. Thorne; Hans K. Pew
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Multilayer X-Ray Imaging Systems
Author(s): David L. Shealy; Richard B. Hoover; David R. Gabardi
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X-ray Microtomography with Synchrotron Radiation
Author(s): D. K. Bowen; J. S. Elliott; S. R. Stock; S. D. Dover
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Radiographic Imaging at Medium Energies Using Multilayer Mirrors
Author(s): Robert S. Nelson; Reuven D. Zach; Zoran L. Barbaric; Patrick J. Papin; Anthony R. Ricci; Lawrence W. Bassett; Eberhard Spiller
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X-Ray Fluorescence (XRF) Testing for Thickness in On-Site Controlled Construction of Specialty Coatings
Author(s): Thomas W. Oakes; Robert E. Oakes
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An Undulator Based Scanning Microscope At The National Synchrotron Light Source
Author(s): H. Rarback; D. Shu; H. Ade; C. Jacobsen; J. Kirzi; I. McNulty; R. Rosser
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Soft X-ray Imaging System for Measurement of Noncircular Tokamak Plasmas
Author(s): R. J. Fonck; M. Reusch; K. P. Jaehnig; R. Hulse; P. Roney
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Optics For X-Ray Astronomy
Author(s): R. C. Catura; E. G. Joki; J. R. Vieira; W. J. Brookover
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Design, Analysis, Fabrication and Test of the LAMAR Protoflight Mirror Assembly
Author(s): Lester M. Cohen; Daniel G. Fabricant; Paul Gorenstein
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The Measured Performance Of A Grazing Incidence Relay Optics Telescope For Solar X-Ray Astronomy
Author(s): Dan Moses; Allen S. Krieger; John M. Davis
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