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Proceedings of SPIE Volume 0690

X-Rays in Materials Analysis: Novel Applications and Recent Developments
Editor(s): Thomas W. Rusch
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Volume Details

Volume Number: 0690
Date Published: 12 August 1986
Softcover: 23 papers (162) pages
ISBN: 9780892527250

Table of Contents
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Refinements in XAFS Theory
Author(s): J. J. Rehr
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Comparison Of Experimental And Theoretical Calculations Of Backscattering Amplitude And Phase Shift Functions For A Number Of FCC Metals
Author(s): G. S. Knapp; A. G. McKale; S.K. Chan; B. W. Veal
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Experimental Studies Of Photon-Surface Interaction Dynamics In The Alkali Halides
Author(s): Richard F. Haglund; Norman H. Tolk
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Time-Dependent X-Ray Reflectivity of a Germanium Crystal Heated with 25 ps 1.06 µm Laser Light
Author(s): C. J. Hailey; G. Busch; R. Johnson; Z. Koenig; J. Lupton; R. Schroeder; D. Sullivan; W. Goldstein
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Characteristics Of Transition Radiation In The X-Ray Spectral Region
Author(s): Michael J. Moran
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EXAFS And Reflectivity Studies Of Surfaces And Interfaces Using Glancing Angle X-Rays
Author(s): S. M. Heald; H. Chen; J. M. Tranquada
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Near Edge X-Ray Absorption Fine Structure Spectroscopy In Materials Analysis
Author(s): Roger Carr
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EXAFS Measurements Of Ion-Implanted Amorphous Surface Layers
Author(s): C. E. Bouldin; R. A. Forman; M. I. Bell; E. P. Donovan; G. K. Hubler
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Structure of Icosahedral AlMnSi and AlMn as Determined by Extended X-Ray Absorption Fine Structure (EXAFS)
Author(s): Yanjun Ma; Edward A. Stern
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Local Structural And Magnetic Environments Of Iron In Dilute Alloys
Author(s): J. I. Budnick; M. Choi; D. M. Pease; Z. Tan; Guy H. Hayes; E. Klein; B. Illerhaus
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Economical and Efficient Detector for Fluorescent X-Ray Absorption Spectroscopy
Author(s): S. M. Khalid; G. Rosenbaum; B. Chance
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Surface and Epitaxial Overlayer Structures from X-Ray Photoelectron Diffraction (XPD)
Author(s): Charles S. Fadley
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Angle Resolved X-ray Photoelectron Spectroscopy Applied to Patchy Surfaces
Author(s): D. J. Pocker
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Thin Layer Formation Studied by Angular Dependent X-Ray Photoelectron Spectroscopy
Author(s): William F. Stickle; Kenneth D. Bomben; Lillian E. Gulbrandsen; Thomas W. Rusch
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X-Ray Photoelectron Spectroscopy (XPS) Applications Using Microfocused X-Rays
Author(s): Robert Chaney; Robert Cormia; Ruth Siordia
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An Investigation Of The Effect Of Particle Size On Oxidation Of Pyrites In Coal.
Author(s): Paul K. Chan; David C. Frost
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The Application of X-rays and Electrochemistry to Materials Analysis
Author(s): P. M.A. Sherwood
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Problems in Quantitation in X-Ray Photoelectron Spectroscopy (XPS): the Use of Data Reduction Techniques to Obtain Peak Areas
Author(s): B. L. Maschhoff; K. R. Zavadil; K. W. Nebesny; J. W. Fordemwalt; N. R. Armstrong
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Surface Structure Analysis Using Grazing Incidence X-ray Scattering
Author(s): S. Brennan
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X-Ray Diffraction of CdTe Epitaxial Layers on GaAs Substrates as a Function of Temperature
Author(s): R. D. Horning; J. -L. Staudenmann; U. Bonse; D. K. Arch; J. L. Schmit
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Structural Depth Profiling by Glancing Angle X-ray Diffraction
Author(s): B. R. York; A. B. Austin
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Measurement of X-Ray Dielectric Constants With Coherent Transition Radiation
Author(s): M. J. Moran; B. A. Dahling; M. A. Piestrup; B. L. Berman; J. O. Kephart
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Time Resolved X-Ray Diffraction Measurements Of Phase Transitions In Lipid-Water Systems
Author(s): L. J. Lis; P. J. Quinn
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