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Proceedings of SPIE Volume 0680

Surface Characterization and Testing
Editor(s): Katherine Creath
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Volume Details

Volume Number: 0680
Date Published: 23 March 1987
Softcover: 23 papers (180) pages
ISBN: 9780892527151

Table of Contents
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Current State Of Optical Testiny
Author(s): H J Tiziani
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Programmable Interferometry
Author(s): Bruce E Truax
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Comparison Of Phase-Measurement Algorithms
Author(s): Katherine Creath
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Phase-Measuring Interferometry Performance Parameters
Author(s): H Philip Stahl
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Real-Time Snapshot Interferometer
Author(s): Joseph L McLaughlin; Bruce A Horwitz
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Testing Collimation Using Shearing Interferometry
Author(s): Manfred W Grindel
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Influeace Of System Aberrations On Interferometric Aspheric Surface Testing
Author(s): Hiroyuki Kurita; Keisuke Saito; Masahiko Kato; Toyohiko Yatagai
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Testing The Primary Mirror Of The W. M. Keck Observatory
Author(s): Evan Stryjewski; R J Zielinski; J T Smith
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Phase-Measuring Interferometric Testing Of Large Diamond-Turned Optics
Author(s): H Philip Stahl; John M Casstevens; Ronald P Dickert
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Intensity Distribution In Out-Of-Focus Images Of A Rotationally Symmetric Optical System
Author(s): Steve N Wong; Robert E Parks; Lianzhen Shao
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Automated Interferometric System For Aspheric Surface Testing
Author(s): T Kanoh
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Aspheric Surface Figure Measurement Using Mechanical Profilometry
Author(s): Russ Palum
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Scratch And Dig Measurement - A Way Ahead
Author(s): Lionel R Baker
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Subsurface Damage In The Diamond Generation Of Aspherics
Author(s): David S Anderson
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Comments On The Correlation Length
Author(s): E L Church
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Longscan Surface Profile Measurements Using A Phase-Modulated Mirau Interferometer
Author(s): E R Cochran; J C Wyant
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High Resolution Optical Profilometer
Author(s): Andrei Brunfeld; Gregory Toker; Joseph Shamir
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Structure Effects In Optical Surface Metrology
Author(s): E L Church; S R Lange
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Comparison Of Profiler Measurements Using Different Magnification Objectives
Author(s): P Z Takacs; E L Church
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Use Of The WYKO And Sommargren Profilers In Polishing Research
Author(s): Norman J Brown
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A Description Of Scattering Of Light From A Rough Surface And Measurements Of The Surface Topography Of A Metal
Author(s): O Keller; P Sonderkaer
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An Instrument For Measurement Of Surface Scatter In The Presence Of Bulk Scatter
Author(s): Erik W Anthon
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Application Of Fourier Optical Signal Processing To Detect Surface Flaws In Transmissive And Reflective Materials
Author(s): Mary P Thomas; Timothy Day; Tracy Kubo
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