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Proceedings of SPIE Volume 0652

Thin Film Technologies II
Editor(s): J. Roland Jacobsson
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Volume Details

Volume Number: 0652
Date Published: 13 October 1986
Softcover: 50 papers (350) pages
ISBN: 9780892526871

Table of Contents
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Automated Optical Coating Processes With Optical Thickness Monitoring
Author(s): R Herrmann; A Zoller
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Thin Film Production With A New Fully Automated Optical Thickness Monitoring System
Author(s): M Lardon; H Selhofer
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An Evaporation Monitoring System featuring "Software" Trigger Points and On line Evaluation of Refractive Indices
Author(s): Christian Schroedter
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Optical Monitoring: Comparison Of Different Monitoring Strategies With Respect To The Resulting Reproducibility To The Completed Layer Systems
Author(s): A Zoller; R Herrmann; W Klug; W Zultzke
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Realization Of Fabry-Perot Filters For Wavelength Demultiplexing
Author(s): A Fornier; R Richier; E Pelletier
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Ultrasonic Precision Cleaning Of Optical Components Prior To And After Vacuum Coating
Author(s): K H Guenther; H Enssle
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Survey Of Computer Numerically Controlled Optical Coating Systems
Author(s): Ronald R Willey
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Design Of Optical Multilayer Coatings At NRCC
Author(s): J A Dobrowolski
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Tschebyshev Optical Filter Design
Author(s): Shiou-Yun Wu; John S Seeley
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Wideband Antireflection Coating Design By The Random Search Approach
Author(s): A Piegari; G Emiliani
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Medium-Index Mixed-Oxide Layers for Use in AR-Coatings
Author(s): Peter Ganner
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Computer Aided Design (CAD) Of Thin Film Optical Coatings
Author(s): M K Rao; Tan Chin Chye; Ow Chek Seng
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Systems Analysis Of Absorbing Media
Author(s): Y K Lim; J S Seeley
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Algorithms for Optical Thin Film Software
Author(s): Fred Goldstein
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The Use Of An IBM PC For Maximizing Production In Coating Laboratories
Author(s): Larry H. Songer
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Subjective Versus Objective Methods For Surface Inspection
Author(s): Lionel R Baker
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Set Up For Filter And Mirror Efficiencies Measurements In The UV and VUV Spectral Range
Author(s): M Pouey; A. Malherbe
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Inverse Synthesis For Analyzing The Variations Of Spectral Properties Of Optical Multilayers From Different Coating Runs
Author(s): W Klug; M Boos; R Herrmann; H Schwiecker
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Quality Control And Ageing Tests On Replicated, Al/MgF2 Coated Aspheric Mirrors For The Far UV
Author(s): Lars Mattsson; Stefan Johansson
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Mechanical Properties Of Coatings Revealed By Ultra Low Load (VICKERS) Hardness Measurements In A SEM
Author(s): H Bangert; A Wagendristel; K H Guenther
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Micro-/Ultramicro Hardness Measurements with Insulating Films
Author(s): H K Pulker; K Salzmann; C Reichert
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Optical Absorption In Amorphous Semiconductor Films
Author(s): Marie-Luce Theye
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Thin Film Refractive Index Determination By Different Techniques
Author(s): G Emiliani; E Masetti,; A Piegari
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Effects Of Dispersion On The Determination Of Optical Constants Of Thin Films
Author(s): C K. Carniglia
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Optical Properties Of Noble Metal Like Films
Author(s): C G Ribbing; E Valkonen
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Optical Constants of Individual Films in Multilayers
Author(s): F Demichelis; G Kaniadakis; E Mezzetti; A Tagliaferro; E Tresso; P Rava
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New Phenomenological Approach For The Optical Dielectric Function Of Inhomogeneous Media Near The Percolation
Author(s): J Lafait; S Berthier; L E Regalado
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Optical Properties Of Thin Silicides Layers
Author(s): C Viguier; A, Cros; A Humbert
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Ellipsometric Methods of Characterization of Optical Thin Films
Author(s): R M. A. Azzam
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Laser Damage To Optical Coatings -- A Continuing Challenge
Author(s): C K Carniglia
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On The Determination Of Optical Constants Of Films In Multilayers
Author(s): J A Dobrowolski
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Pratical Techniques For The Determination Of Optical Constants
Author(s): G Emiliani
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Non-Optical Characterization Techniques For Optical Coatings
Author(s): Karl H Guenther
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Light Scattering And Characterization Of Thin Films
Author(s): Lars Mattsson
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Ion And Photon-Beam Assisted Deposition Of Thin Films
Author(s): H A Macleod
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Optical Constants Of Thin Silver And Titanium Nitride Films
Author(s): E. Valkonen; C G Ribbing; J E Sundgren
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Low Temperature Photo-CVD Silicon Nitride Characterization
Author(s): M Meliga; A Stano; S Tamagno
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Optical Study Of The Growth Of Ta2O5 and SiO2 Layers Obtained By Ion Assisted Deposition
Author(s): F Flory; G Albrand; C Montelymard; E Pelletier
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Measurement Of Scattering Distribution For Characterization Of The Roughness Of Coated Or Uncoated Substrates
Author(s): F Roche; C Amra; E Pelletier
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Total Integrated Scatter Measurement System For Quality Assessment Of Coatings On Optical Surfaces
Author(s): Lars Mattsson
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The Measurement Of Absorption In Thin Films By Laser Calorimetry
Author(s): P A Temple
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Theoretical Model For Evaluating Transient Temperature Distribution In Rugate Optical Thin Film Coatings Subject To High Power Continuous Wave And Repetitive Pulsed Lasers
Author(s): J R Palmer
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Theoretical Model For Evaluating Transient Temperature Distribution In Rugate Optical Thin Film Coatings Subject To High Power Continuous Wave And Repetitive Pulsed Lasers
Author(s): J R Palmer
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Coherence Loss Due To Thin Film Interface Roughness
Author(s): W H. Southwell
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Optimization Of Technology For The Systems Of Hard-Oxide Layers By Spectroscopic Methods
Author(s): K Fluck; G Szalai; J Kojnok; A Szasz
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Applications, Devices, And Markets For Optical Coatings
Author(s): Alfred Thelen
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Performance Of Sputter Deposited Multi Layer X-Ray Mirrors
Author(s): M Arbaoui; R Barchewitz; C. Sella; K B Youn
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Efficient Infrared Reflection Polarizers Using Transparent High-Index Films On Transparent Low-Index Substrates
Author(s): R M. A . Azzam; T F Thonn
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Computer Simulation Of Evaporation Processes
Author(s): Ricardo Flores-Hernandez
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Stability Of Hard Coating Filters
Author(s): Tadeusz D Stefaniak
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