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Optical Manufacturing, Testing and Aspheric Optics
Editor(s): Gregory M. Sanger
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Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 0645
Date Published: 3 November 1986
Softcover: 22 papers (140) pages
ISBN: 9780892526802

Table of Contents
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Scanning Aspherical Surfaces With The Focus-Wavelength Encoded Profilometer
Author(s): F. Francini; G. Molesini; F. Quercioli; B. Tiribilli
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Test And Measuring Methods To Analyse Undulation Effects On Micromachined Optical Surfaces Generated By Vibration On Precision Machinery
Author(s): Manfred Weck; Robert Hartel
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Verifying Nd-Tool Quality Using Plunge Cuts And Micro-Interferometer
Author(s): Dieter Mullner
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"Predicting And Minimizing Working Zone Migration On Nd-Tools Used In Aspherical Micromachining With The Erickson-Watt Approach".
Author(s): J. Arnold
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About Very Large Air-Bearing Tables (3M O.D.) For Micromachining Of Aspherical And Fresnel Mirrors.
Author(s): H. Geppert
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In Process Measurement Of Radii Of Curvature On Micromachined Spherical Zones
Author(s): P. Langenbeck
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Diamond Turning With Moore Machine For Infra-Red Applications. Machining And Results.
Author(s): Claude Jeanmichel; Marc Prevost
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Mass-Production Of Diffraction Limited Replicated Objective Lenses For Compact-Disc Players.
Author(s): Joop Andrea
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Design And Measurement Of Replicated Aspheric Compact Disc Objective Lenses
Author(s): Derk Visser
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A Replicated Bi-Aspherical Readout Lens For Optical Disc Systems.
Author(s): Renso J .M. Zwiers; Joseph J. M. Braat; Gerard C. M. Dortant
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Aspects Of Manufacturing Grazing Incidence X-Ray Mirrors
Author(s): K. Beckstette
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An Automated Aspheric Polishing Machine
Author(s): Donald W. Small; Steven J. Hoskins
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Direct Contact Profilometry Of Large Aspherics
Author(s): Lance D. Lund
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The Use Of Perturbed Aspherics In Broad Band Optical Systems
Author(s): D. J. Nicholas
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High Power Laser Focusing Optics
Author(s): D. J. Nicholas; J. E. Boon
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Multiple Aspheric Systems For The Lithography Of VLSI Circuits
Author(s): D. J. Nicholas
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A New Test For Cylindrical Optics
Author(s): J. Geary; L. Parker
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Direct Phase Measurement Of Aspheric Surface Contours
Author(s): Katherine Creath; James C. Wyant
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Statistical And Signal Processing Concepts In Surface Metrology
Author(s): E L Church; P. Z. Takacs
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Temperature Stable Boresight Module
Author(s): Rudolf Hartmann
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Surface Roughness Effect On Laser Speckle Spectral Density
Author(s): S. M. Metwalli; A. H. Kamel; A. A. Saheb
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An Optical Lever For The Metrology Of Grazing Incidence Optics
Author(s): Alan E. DeCew; Robert W. Wagner
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