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Proceedings of SPIE Volume 0525

Measurement and Effects of Surface Defects & Quality of Polish
Editor(s): Lionel R. Baker; Harold E. Bennett
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Volume Details

Volume Number: 0525
Date Published: 3 September 1985
Softcover: 26 papers (204) pages
ISBN: 9780892525607

Table of Contents
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Surface Roughness Metrology By Angular Distributions Of Scattered Light
Author(s): David E. Gilsinn; Theodore V. Vorburger; E.Clayton Teague; Michael J. MeLay; Charles Giauque; Fredric E. Scire
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Defects Induced In Optical Surfaces By The Diamond-Turning Process
Author(s): H. H. Hurt
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Image Degradation Caused By Tooling Marks In Diamond-Turned Optics
Author(s): J. M. Elson; H. E. Bennett
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The Specification And Control Of Surface Finish-Empiricism Versus Dogmatism
Author(s): K. J. Stout; C. Obray; J. Jungles
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Visibility Method To Classify Macroscopic Surface Defects For Both Reflection And Transmission Systems.
Author(s): Aline Huard
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Defect Characteristics Of Optical Surfaces Using Pulsed Laser Damage Methods
Author(s): J. O. Porteus; J. B. Franck; S. C. Seitel; S. D. Allen
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Nondestructive Defect Detection From Optical Surfaces
Author(s): C. D. Marrs; J. O. Porteus; J. R. Palmer
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ASTM And OSA Efforts To Develop An Optical Surface Roughness Measurement Standard
Author(s): John A. Detrio
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Comparison Of Visibility Of Standard Scratches
Author(s): Lionel R. Baker; Jagpal Singh
Tunable Scratch Standards
Author(s): Matt Young; Eric G. Johnson; Richard Goldgraben
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Use Of MIL-0-13830A For Specifying The Surface Quality Of Laser Optics
Author(s): H. E. Bennett
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Effect Of Defects And Surface Finish On The Performance Of Optical Systems
Author(s): Stanley Martin
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Effects Of Surface Quality On CO[sub]2[/sub] Optics
Author(s): Jerry Rein
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Surface Quality Requirements And Inspection Techniques For Semiconductor Slices
Author(s): Detlef Reimann
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Instrumentation For Measuring Finish, Defects And Gloss
Author(s): David J. Whitehouse
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Application Of IR Ellipsometry/Reflectometry To Surface Metrology
Author(s): Thomas A. Leonard; John S. Loomis; Jack B. Stubbs
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Scanning Electron Microscopy Studies Of Laser Damage Initiating Defects In ZnSe/ThF[sub]4[/sub] And SiH/Si0[sub]2[/sub] Multilayer Coatings
Author(s): L. F. Johnson; E. J. Ashley; T. M. Donovan; J. B. Franck; R. W. Woolever; R. Z. Dalbey
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A Study Of Surface Particulate Contamination On The Primary Mirror Of The Hubble Space Telescope
Author(s): Terence A. Facey
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Laser Scattering From Multi-Scale Surfaces
Author(s): D. L. Jordan; E. Jakeman; R. C. Hollins
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Measurement Of Roughness On Teeth By Means Of Holographic Correlation.
Author(s): De Schryver; M. Kuliralo
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A Portable Scatterometer For Optical Shop Use
Author(s): William L. Wolfe; Kathleen Magee; Douglas W. Wolfe
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A Schlieren Microscope
Author(s): G. Prast
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Microprofiling Of Precision Surfaces
Author(s): James M. Zavislan; Jay M. Eastman
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Optical Profilers For Surface Roughness
Author(s): James C. Wyant
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Scatter Measurements Made With Ultraviolet Light
Author(s): Erik W. Anthon
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Instrument For Angle-Resolved Measurement Of Scattered Light In The VUV-Visible Wavelength Region
Author(s): Lars Mattsson
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