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PROCEEDINGS VOLUME 0429

Precision Surface Metrology
Editor(s): James C. Wyant
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Volume Details

Volume Number: 0429
Date Published: 15 November 1983
Softcover: 29 papers (213) pages
ISBN: 9780892524648

Table of Contents
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Pseudo-Shear Interferometry
Author(s): Peter B. Keenan
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Interferometric Phase Measurement Using Spatial Synchronous Detection
Author(s): Kenneth H. Womack
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Instantaneous Phase Measuring Interferometry
Author(s): R. Smythe; R. Moore
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A Heterodyne Interferometer For Testing Laser Diodes
Author(s): John Hayes; Steve Lange
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Wavefront Evaluation On Laser Diodes Using A Phase Measurement Interferometer
Author(s): Kang M. Leung; Steven R. Lange
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AC Phase Measurement Technique For Moire Interferograms
Author(s): R. N. Shagam
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An Absolute Distance Interferometer Using A Dye Laser Heterodyne Interferometer And Spatial Separation Of Beams
Author(s): R. J. Tansey
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A New Optical Surface Microprofiling Instrument
Author(s): Jay M. Eastman; James M. Zavislan
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Optical Heterodyne Profilometer
Author(s): C-C . Huang
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A New Optical Method For The Measurement Of Surface Roughness Of Technical Surfaces
Author(s): R.-J. Ahlers; H. J. Warnecke
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Scatter Measurements On LAK9 And SF1 Glasses At 0.915 µm
Author(s): William L. Wolfe; John E. Hubbs; Frederick O. Bartell
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The Precision Measurement And Characterization Of Surface Finish
Author(s): E. L. Church
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Calculation Of Surface Statistics From Light Scatter
Author(s): John C. Stover; Steven A. Serati; Calvin H. Gillespie
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Direct Comparison Of Mechanical And Optical Measurements Of The Finish Of Precision-Machined Surfaces
Author(s): E. L. Church
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Subaperture Testing For Mid-Frequency Figure Control On Large Aspheric Mirrors
Author(s): A. F. Slomba; L. Montagnino
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Advanced Circularly Ruled Gratings for General Surface Metrology
Author(s): Karl M. Bystricky; Teresa A. Fritz
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Contour Line Measurements On ROSAT X-ray Mirrors
Author(s): Klaus Beckstette; Erich Heynacher
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Automatic Flatness Tester for VLSI
Author(s): Toyohiko Yatagai; Shigeru Inaba; Hideki Nakano; Masane Suzuki
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Aspherical Surface Testing With Shearing Interferometer Using Fringe Scanning Detection Method
Author(s): Toyohiko Yatagai; Toshio Kanou
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Design and Operation of a Real Time Interferometer Working at 3.8 µm
Author(s): K. Prettyjohns; S. DeVore; E. Dereniak; J. Wyant
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High Precision Angle Measurements Off Small Surfaces
Author(s): Russell A. Chipman
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Applied Infrared Presensitization Photography
Author(s): J. Geary; D. Vunck; R. Sessions; D. Duneman; D. Holmes; C. Moeller; R. Wick
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Projection Interference Fringes Microscope
Author(s): O. D. D. Soares; S. P. Almeida
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A Frequency Domain Description Of Interferogram Analysis
Author(s): Kenneth H. Womack
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Wavefront Measurements From A Knife Edge Test
Author(s): Edward M. Granger
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A Set Of Orthonormal Surface Error Descriptors For Near Cylindrical Optics
Author(s): Paul Glenn
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Separating Misalignment From Misfigure In Interferograms On Off-Axis Aspheres
Author(s): Gregory C. Dente
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Lateral Shearing Interferogram Analysis
Author(s): David Korwan
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Real Time Metrology Using Heterodyne Interferometry
Author(s): Joseph T . Evans
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