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Proceedings of SPIE Volume 0368

Microscopy: Techniques and Capabilities
Editor(s): Lionel R. Baker
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Volume Details

Volume Number: 0368
Date Published: 29 March 1983
Softcover: 21 papers (136) pages
ISBN: 9780892524037

Table of Contents
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X-Ray Microscopy: Recent Developments And Practical Applications
Author(s): B. Niemann; G. Schmahl; D. Rudolph
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Quantitative Microfocal Radiography In Medicine, Biological Research, And The Quality Control Industry
Author(s): J. C. Buckland-Wright
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Soft X-Ray Imaging Microscopy Using Zone Plates And Nonsynchrotron Sources
Author(s): R. J. Rosser
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Application Of Synchrotron Radiation To X-Ray Microscopy
Author(s): P. J. Duke
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Techniques In Surface Microscopy And Analysis
Author(s): J. M. Walls
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Analytical Capabilities Of Transmission Electron Microscope (TEM) Systems
Author(s): P. Hagemann; M. N. Thompson
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Technique For Quantitative Analysis Of Specimen Microtopography Using Computer Control Of A Scanning Electron Microscope
Author(s): David M. Holburn
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Applications Of High Voltage Electron Microscopy In Materials Science
Author(s): M. J. Goringe
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Forensic Scanning Electron Microscope
Author(s): R. H. Keeley
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Scanning Acoustic Microscopy: Review Of Recent Developments
Author(s): H. K. Wickramasinghe
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Applications Of Acoustic Microscopy In The Semiconductor Industry
Author(s): A. J. Miller
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Scanning Electron Acoustic Microscopy
Author(s): G. Davies; A. Howie; L. Staveley-Smith
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Helium Acoustic Microscopy
Author(s): A. F.G. Wyatt
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Acoustic Microscopy In Materials Science
Author(s): G. A.D. Briggs; M. G. Somekh; C. Ilett
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Application Of Optical Microscopy To Dimensional Measurements In Microelectronics
Author(s): M. J. Downs; N. P. Turner
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Applications Of Scanning Optical Microscopy
Author(s): Colin J.R. Sheppard
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Advances In The Infrared Microscopy Of Electronic Materials
Author(s): Charles R. Elliott; John C. Regnault; Beverley T. Meggitt
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Holography Applied To Stereomicroscopy
Author(s): R. W. Smith; T. R. Empson
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Interference Film Microscopy For Metal Phase Identification
Author(s): K. W. Raine; P. N. Quested
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Particle Size Analysis By Automated Optical Microscopy
Author(s): L. C. Kenny; A. P. Rood
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Reflex Microscope: Measurement In Three Dimensions
Author(s): Peter J. Scott
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