Share Email Print
cover

Proceedings of SPIE Volume 0359

Applications of Digital Image Processing IV
Editor(s): Andrew G. Tescher
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 0359
Date Published: 17 March 1983
Softcover: 49 papers (407) pages
ISBN: 9780892523948

Table of Contents
show all abstracts | hide all abstracts
Model-Based Restoration Procedure For Small, Low-Resolution Optical Images
Author(s): John A. Saghri; Andrew G. Tescher
Show Abstract
Synthetic Aperture Radar Digital Image Formation Processing
Author(s): I. J. LaHaie; A. R. Dias; R. S. Powers
Show Abstract
Adaptive Restoration Of Images With Speckle
Author(s): D. T. Kuan; A. A. Sawchuk; T. C. Strand; P. Chavel
Show Abstract
Direct Image Plane Deblurring
Author(s): Antonio R. Dias
Show Abstract
Signal Recovery From Signal Dependent Noise
Author(s): Rangachar Kasturi; Thomas F. Krile; John F. Walkup
Show Abstract
Automatic Scene-Adaptive Pattern Removal
Author(s): Michael Cannon; Alex Lehar; Fred Preston
Show Abstract
Performance Considerations In Automatic Target Recognition Systems For Infrared Images
Author(s): C. Benning
Show Abstract
Adaptive Gate Multifeature Bayesian Statistical Tracker
Author(s): W. B. Schaming
Show Abstract
Statistical Approach For Forward Looking Infrared (Flir) Target Classification
Author(s): Yun-Kung J. Lin
Show Abstract
Image Scale, Translation, And Intensity Transformations For Real-Time Image Generation
Author(s): Daryl E. Hinman
Show Abstract
Image Skeletonization For Object Position Measurement
Author(s): Budimir Zvolanek; Chung Chang Lee
Show Abstract
SAM Opto-Electronic Picture Sensor In A Flexible Manufacturing Assembly System
Author(s): W. Brune; K. H. Bitter
Show Abstract
Neighborhood Access Problem In Image Parallel Machines
Author(s): Per-Erik Danielsson
Show Abstract
Near Real-Time Automated Inspection And Evaluation System (AIES)
Author(s): C. William Souder; Richard E. O'Hara
Show Abstract
Hybrid Modeling Of Staring Planar Arrays
Author(s): Alan Hunt; Craig A. MacPherson; R. E. Nasburg
Show Abstract
General Purpose Vision Sensor
Author(s): Giuseppina Gini; Maria Gini
Show Abstract
Real-Time Photoelectron Event-Detecting Video System
Author(s): R. H. Macklin; E. K. Hege; P. A. Strittmatter
Show Abstract
Mechanical Model Of The Insect Eye
Author(s): Richard T. Schneider; James F. Long
Show Abstract
Modeling Three-Dimensional Computer Reconstructions From Surface Contours For Diagnostic Imaging
Author(s): Larry T. Cook; Prakairut N. Cook; Samuel J. Dwyer; Solomon Batnitzky; Kyo Rak Lee; Hilton I. Price
Show Abstract
Digital Processing Of Medical Imagery
Author(s): William K. Pratt; Thomas B. Risser
Show Abstract
Integration Of Imagery And Cartographic Data Through A Common Map Base
Author(s): Jerry Clark
Show Abstract
Background Suppression For Moving Point Source Detection
Author(s): Philip D. Henshaw
Show Abstract
High Resolution Image Registration By Thresholded Difference
Author(s): L. J. Pinson
Show Abstract
Radar Image Registration And Rectification
Author(s): M. Naraghi; W. D. Stromberg
Show Abstract
Application Of Digital Image Processing To Acoustic Ambiguity Functions
Author(s): J. Brian Sharkey
Show Abstract
Adaptive Histogram Equalization And Its Applications
Author(s): Victor T. Tom; Gregory J. Wolfe
Show Abstract
Forward Looking Infrared (FLIR) Image Enhancement For A Generic Blob Target Detection System
Author(s): Chun Moo Lo
Show Abstract
Signal Reconstruction From Fourier Transform Amplitude
Author(s): Patrick L. Van Hove; Jae S. Lim; Alan V. Oppenheim
Show Abstract
Interpolation Of Two-Dimensional Surfaces Using The Gerchberg Algorithm
Author(s): Mark J. Carlotto; Victor T. Tom
Show Abstract
Processing Of Noisy High Resolution Electron Micrographs Of Crystalline Biological Membranes
Author(s): Suzanne B. Luscher
Show Abstract
Restoration Of Defocusing And Chromatism In Color Images
Author(s): J. Bescos; J. H. Altamirano; J. Santamaria; A. Santisteban
Show Abstract
Cardio-Surgical Thermography
Author(s): A. R. Fiorini; R. Fumero; R. Marchesi
Show Abstract
Syntactic Pattern Recognition Approach To Scene Matching
Author(s): John F. Gilmore
Show Abstract
Rotation Invariant Pattern Recognition
Author(s): H. H. Arsenault; Y. N. Hsu; K. Chalasinska-Macukow; Y. Yang
Show Abstract
Computer Evaluation Of Real-Time X-Ray And Acoustic Images
Author(s): M. H. Jacoby; R. S. Loe; P. A. Dondes
Show Abstract
High Speed Pattern Inspection System
Author(s): Burton D. Figler
Show Abstract
Machine Recognition Of Cursive Arabic Words
Author(s): Adnan Amin; Gerald Masini
Show Abstract
Constructive Invariant Coupling Method Applications For Statistical Data Analysis And Effective Decision Rule Synthesis In Digital Image Processing Problems
Author(s): Nicolai A. Nechval
Show Abstract
Compressing, Ordering And Displaying Image Data
Author(s): F. H. Preston; A. F. Lehar; R. J. Stevens
Show Abstract
Analysis Of Three-Dimensional Time Varying Scene
Author(s): Roger Y. Tsai; Thomas S. Huang
Show Abstract
Analysis And Evaluation Of Sequential Quantizers
Author(s): Ali Habibi
Show Abstract
Image Synthesis And Coding Using Gaussian Markov Random Field Models
Author(s): R. Chellappa; R. Bagdazian
Show Abstract
Application Of Hadamard, Haar, And Hadamard-Haar Transformation To Image Coding And Bandwidth Compression
Author(s): Ryszard S. Choras
Show Abstract
Composite Predictive Coding Of The NTSC Color TV Signal
Author(s): C. E. Li; K. R. Rao
Show Abstract
Performance Measures For Statistical Segmentation
Author(s): Dov J. Shazeer
Show Abstract
Image Segmentation By Edge Tracing
Author(s): Marion Lineberry
Show Abstract
Segmenter Wobble In Infrared Images
Author(s): F. Elliott; W. W. Boyd; Marion Lineberry
Show Abstract
Very Large Scale Integration (VLSI) Approach To Feature Extraction
Author(s): James S. Duncan; Werner Frei
Show Abstract
Automatic Evaluation Of Interferograms
Author(s): Friedhelm Becker; Gerd E. A. Meier; Horst Wegner
Show Abstract

© SPIE. Terms of Use
Back to Top