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Proceedings of SPIE Volume 0225

Infrared Image Sensor Technology
Editor(s): Esther Krikorian
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 0225
Date Published: 6 August 1980
Softcover: 21 papers (174) pages
ISBN: 9780892522545

Table of Contents
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Hybrid Focal-Plane Array Development
Author(s): David H. Alexander
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Mosaic Focal Plane Evaluation Technique
Author(s): Gary L, Payton
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N-Channel Metal Oxide Semiconductor (NMOS) Silicon Signal Processors For On-Focal-Plane Applications
Author(s): Robert J Kansy
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Multiplexed Intrinsic Detector Arrays With Signal Processing (MIDASP) Program Development Of Hybrid Technology For Advanced Scanning Systems
Author(s): M. Gurnee; R. Rawe; M. Dries
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Unconventional Focal-Plane Architecture (FPA)
Author(s): John C. Carson
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Pulse-bias Mosaic Test Data And Subassembly Configuratior
Author(s): E. W. McCallion; D. S. Glad; J. S. Lorenzo; C. M. Parry; C. W. Clench
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Advances In (Hg,Cd)Te Materials Technology
Author(s): D. A. Nelson; W. M. Higgins; R. A. Lancaster
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Advances in InSb Charge Injection Device (CID) Focal Planes
Author(s): M. D. Gibbons; J. M. Swab; W. E. Davern; M. L. Winn; T. C. Brusgard; R. W. Aldrich
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Extrinsic Silicon Focal-Plane Technology
Author(s): Dieter H. Pommerrenig
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Advances In Platinum Silicide Schottky-Barrier IR-CCD Image Sensors
Author(s): W. F. Kosonocky; H. G. Erhardt; G Meray; F. V. Shallcross; H. Elabd; M. J. Cantella; J. Klein; L. H. Skolnik; B. R. Capone; R. W. Taylor
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Coded-Bias Mosaics
Author(s): Christopher M. Parry
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Issues In Advanced Focal Plane Manufacturing And Evaluation
Author(s): James C. Fraser
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Focal-Plane Evaluation
Author(s): William S. Chan
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Focal Plane Testing From A Production Point Of View: A Tutorial
Author(s): D. F. Schmunk; A. H. Marshall; R. J. Sonners
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Nomenclature For Focal Surface Radiometry
Author(s): Irving J. Spiro
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Computer-Aided Facility For The Rapid Evaluation And Optimization Of IR Image Sensors
Author(s): S. B. Grossman; S. R. Hawkins; A. K. Gressle; R. P. Farley; W. G. Opyd
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Implementation Of Image Preprocessing Functions Using CCD LSI Circuits
Author(s): S. D. Fouse; G. R. Nudd; P. A. Nygaard
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IR Signal Processing Under Zodiacal Light Background
Author(s): K. S. Han
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Measurement Of Noise Sources In P-Surface Channel Charge Coupled Device (CCD) Multiplexers For Infrared Focal Plane Arrays
Author(s): W. C. Jenkins; J. M. Killiany; J. A. Modolo
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Evaluation Of Flight Data From A Mosaic Sensor
Author(s): W. G. Opyd
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Spatial And Temporal Tests Of IR Detectors With Tunable Diode Lasers
Author(s): Terry R. Todd
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