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Proceedings of SPIE Volume 0220

Optics in Metrology and Quality Assurance
Editor(s): Harvey L. Kasdan
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Softcover $105.00 * $105.00 *

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Volume Details

Volume Number: 0220
Date Published: 28 May 1980
Softcover: 25 papers (202) pages
ISBN: 9780892522484

Table of Contents
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Computer Image Processing And Recognition
Author(s): Ernest L. Hall; J. J. Hwang; F. A. Sadjadi
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New Digital Interferometric Output Analyzer And Display System
Author(s): N. Balasubramanian
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How To Control Color Appearance With Instrumentation
Author(s): Margaret E. Burns
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High-Speed Single Particle Sizing By Light Scattering In A Flow System
Author(s): G. C. Salzman; R. D. Hiebert; J. H. Jett; M. Bartholdi
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Measurements Of Small Dimensions Of Products And By-Products
Author(s): Dennis A. Swyt; Stephen W. Jensen
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Inferential Physical Measurements Using Detectors And Detector Arrays
Author(s): Fred Abbott; K. K. Burhardt; F. M. Waltz
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Applications Of Visual Task Automation In Aerospace Manufacturing
Author(s): C. William Souder
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Techniques For Evaluation Of Aircraft Windscreen Optical Distortion
Author(s): James S. Harris; Keven G Harding; Steven H. Mersch
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Aspheric Testing By Conventional Interferometry
Author(s): Walter H. Augustyn
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Direct Phase Measurement In Spherical Wave Fizeau Interferometers
Author(s): Robert C. Moore; Frank H. Slaymaker
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Optical Open-Area Ratiometer
Author(s): Fred M. Dickey; Mark A. Petersen
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Aircraft Quality Assurance Using Close-Range Photogrammetry
Author(s): G. L. Danielson
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Automatic Workpiece Surface Tracker For Laser Cutter
Author(s): F. M. Mottier
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Automated Optical Inspection Of Multilayer Printed Circuit Boards
Author(s): William A. Bentley
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Microdensitometer Measurements Of Photomask Quality
Author(s): David Kryger
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Photomask Mensuration With The Linear Microdensitometer
Author(s): Burton D. Figler
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Infrared Testing Of Printed Circuit Boards And Hybrids
Author(s): M. P. Wirick; H. A. Diede
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Thick-Film Hybrid Inspection With A Computer-Controlled High Resolution Imaging And Storage System
Author(s): L. Arlan; M. J. Cantella; T. J. Dudziak; M. F. Krayewsky
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Computerized Measuring Microscope
Author(s): Thomas D. Schoonmaker
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Considerations In The Design And Specifications Of An Automatic Inspection System
Author(s): David T. Lee
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Industrial Robots: Today And Tomorrow
Author(s): J. W. Saveriano
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Image Processing Applications In Nondestructive Examination (N De)
Author(s): Roger A. Morris
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On-line Inspection For Nonwoven Fabrics
Author(s): William E. Wolf
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On-line Optical Gaging
Author(s): M. Thomas Jackson
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