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Proceedings of SPIE Volume 0196

Measurements of Optical Radiations
Editor(s): Harold P. Field; Edward F. Zalewski; Frederic M. Zweibaum
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Volume Details

Volume Number: 0196
Date Published: 15 November 1979
Softcover: 22 papers (186) pages
ISBN: 9780892522248

Table of Contents
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Spectral Radiometric Measurements For High Temperature Solar Applications
Author(s): L. K. Matthews
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Multiband Radiometer For Field Research
Author(s): B. F. Robinson; M. E. Bauer; D. P. DeWitt; L. F. Silva; V. C. Vanderbilt
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Calibration Procedures For Measurement Of Reflectance Factor In Remote Sensing Field Research
Author(s): B. F. Robinson; L. L. Biehl
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Narrow-Field Radiometry In A Quasi-Isotropic Atmosphere
Author(s): Alan Holmes; James M. Palmer; Martin G. Tomasko
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Diver-Operable Multiwavelength Radiometer
Author(s): Charles R. Booth; Phillip Dustan
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High-Resolution Optical Telescope For Ultraviolet (UV) Radiation Field
Author(s): Wahe W. Karayan
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Evaluation Of Silicon Diode Arrays For The High-Resolution Spectrograph (HRS) Digicon
Author(s): R. D. Smith; E. A. Beaver
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Microprocessor-Based Spectral Responsivity Calibration System For Photosensors
Author(s): Dennis N. Horwitz; Paul H. Wendland
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On The Possibility Of An Absolute Radiometric Standard Based On The Quantum Efficiency Of A Silicon Photodiode
Author(s): Jon Geist
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Measurement Of Synchrotron Radiation From The NBS SURF II Using A Silicon Radiometer
Author(s): A. R. Schaefer
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Thin-Film Scintillators For Extended Ultraviolet (UV) Response Silicon Detectors
Author(s): Walter Viehmann
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Measurement Of Low Level Laser Pulses At 1.064 µm
Author(s): Alvin L. Rasmussen; Aaron A. Sanders
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Direct Measure Of Cathode-Ray Tube (CRT) Image Quality
Author(s): Robert W. Verona; Harry L. Task; Victor C. Arnold; James H. Brindle
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Computer-Controlled Photometry And Large-Screen Display Resolution
Author(s): Waldo R. Robinson
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Unique Optical System For Conversion Of Existing Photometers Into Scanning Microphotometers
Author(s): Thomas H. Bulpitt; Richard A. Walker
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Laser Spatial Profile Measurement Device
Author(s): William R. Mallory; Francis X. Jeskie; W. Lee Blanton
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Accuracy In The Photometry Of Retroreflectors
Author(s): N. L. Johnson
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Spectroradiometric Testing Of Antireflection Coatings
Author(s): Richard L. Austin
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Cavity Radiometer Reflectance
Author(s): E. F. Zalewski; J. Geist; R. C. Willson
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Two-Scatter-Plate Integrator To Reduce Speckle Noise
Author(s): Richard F. Horton
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Measurement Of Nanosecond Laser Pulse Characteristics Transiting An Underwater Path
Author(s): Robert F. Howarth
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Versatile Method For Measuring Absolute Grating Efficiencies
Author(s): R. L. Hilliard
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