Share Email Print

Proceedings of SPIE Volume 0187

System Aspects of Electro-optics
Editor(s): Harold B Jeffreys
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.

Volume Details

Volume Number: 0187
Date Published: 4 October 1979
Softcover: 25 papers (210) pages
ISBN: 9780892522156

Table of Contents
show all abstracts | hide all abstracts
Optical Systems Engineering: A Tutorial
Author(s): Charles L. Wyman
Show Abstract
Army Laser Measurement Assurance Program (ALMAP)
Author(s): M. L. Fecteau
Show Abstract
Electro-Optical System Environment Simulation
Author(s): William F. Waite
Show Abstract
Systems Considerations In The Simulation Of Missiles Employing Electro-Optic (EO) Devices
Author(s): Donald W. Holder
Show Abstract
Optical Sensor System Evaluation
Author(s): Rex D. Lewis; Chris H. Horgen
Show Abstract
Changes In Manufacturing, Testing And Process Control
Author(s): Ronald B. Sartain
Show Abstract
Machine Shop Operations In Support Of Optics
Author(s): Bill Dempsey
Show Abstract
Transfer Radiometer For Missile Test Set Calibration
Author(s): Frederic M. Zweibaum; Richard F. Leftwich
Show Abstract
Balanced Common Module Coolers
Author(s): G. W. Shepherd
Show Abstract
Low Temperature Thermoelectric Cooling Of Self-Scanned Arrays
Author(s): Raymond Marlow
Show Abstract
Prediction Of The Angular Vibration For Airborne Electro-Optical Systems
Author(s): Jon Lee; Michael W. Obal
Show Abstract
Super Recording Automatic Digital Optical Tracker (RADOT) Field-Test Results At Kwajalein Missile Range (KMR)
Author(s): Jerome L. Sibol
Show Abstract
Precision Stabilization Requirements For Long-Range Acquisition Systems
Author(s): James L. Baumann; Mark D. Dixon
Show Abstract
Development Of The Deployment Mapping Instrument For SAMTEC
Author(s): Robert L. Baker; John E. Cornell; Raymond P. Lynch
Show Abstract
Rotating Spin Mount/Data Acquisition System
Author(s): Henry Heinemann; John Duke
Show Abstract
Systems Approach To The Design Of A Precision Infrared Imaging Tracking System
Author(s): Felix E. Morgan
Show Abstract
Undesirable Electromagnetic (EM) Effects In Electro-Optic Systems
Author(s): James H. Atkinson; Marvin D. Aasen
Show Abstract
Michelson Spectrometer System
Author(s): Harold L. . Johnson; Theodore D. Fay; Wieslaw Z. Wisniewski
Show Abstract
Electro-Optical Technique For Suppressing Vibration-Induced Line-Of-Sight Errors
Author(s): Robert L. Light; Jackson H. Priest; Larry D. McTigue
Show Abstract
System Acceptance Testing Utilizing an Interferometer
Author(s): Walter H. Augustyn
Show Abstract
Frequency Domain Approach To An Electro-Optics System
Author(s): Iao-Huei Pan; Sui-Chu Cheng; Jer-Hao Chen; Henry H. Su
Show Abstract
Designating Optical Tracker (DOT) Sensor Test And Calibration
Author(s): E. J. McCool; J. L. Zurasky
Show Abstract
Limitations on Design Parameters of BLIP Infrared Sensors Used to Measure Point Sources
Author(s): L. C. Clune
Show Abstract
Infrared Processing Techniques For Air-To-Air Missiles
Author(s): Lynn L. Deibler
Show Abstract
Monte Carlo Simulations Of Optical Processing Systems In Nuclear Environments
Author(s): Phillip L. Jessen
Show Abstract

© SPIE. Terms of Use
Back to Top