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Proceedings of SPIE Volume 0153

Advances in Optical Metrology I
Editor(s): N. Balasubramanian; James C. Wyant
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Volume Details

Volume Number: 0153
Date Published: 15 December 1978
Softcover: 25 papers (172) pages
ISBN: 9780892521807

Table of Contents
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Gaging By Remote Image Tracking
Author(s): James P. Waters
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Optical Profile Transducer
Author(s): Takeo Sawatari; Richard B. Zipin
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Laser Based In-Process Dimension Measurement And Control
Author(s): Richard H. Moore
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A Non-Contact Method For Surface Profile Measurement And Angular Deflection Monitoring Using A Scanning Laser Beam
Author(s): Francisco M. Smolka; Thomas P. Caudell
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The Use Of Microdensitometers As A Basis For Highly Accurate Metrology
Author(s): H. J. Caulfield; David L. Kryger
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Surface Finish From Reflected Laser Light
Author(s): H. S. Corey
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Electro-Optical Techniques For Non-Contact Circuit Probing
Author(s): Peter D. Poulsen
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Real-Time Interferometer
Author(s): Kenneth D. Stumpf
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Unequal Path Interferometer Alignment And Use
Author(s): Robert J. Zielinski
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Removal Of Test Optics Errors
Author(s): Robert E. Parks
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Interferometric Measurement Of Large Aperture Infrared Windows
Author(s): Albert F. Slomba
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Application Of Ronchi Interferometry To Testing Large Aperture Flat Mirrors
Author(s): David E. Stoltzmann
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Determining Image Quality And Wavefront Profiles From Interferograms
Author(s): Ben C. Platt; Steve G. Reynolds; Terry R. Holt
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Problems In Optical Measurements With Fourier Transform Spectrometers
Author(s): Wayne Wasson
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Electro-Optics In Industrial Metrology
Author(s): Robert E. Bible; John R. DeAguiar
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Three-Dimensional Inspection By A Revolutionary Optical Surface Measurement Technique
Author(s): Seymour S. Levine; George Gallios
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Silicon Position Sensing Detectors For Precision Measurement And Control
Author(s): R.Michael Madden
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Photo-Optic Measuring Systems
Author(s): Elmer v. Harbert
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Moire Methods For Contouring Displacement, Deflection, Slope And Curvature
Author(s): F. P. Chiang
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Testing The White Sands Missile Range (WSMR) 100 mm Focal Length Rotating Prism Camera Lens
Author(s): Charles R. Hayslett; William H. Swantner; Richard A. Buchroeder
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Quasi-Real-Time High Precision Interferometric Measurements Of Deforming Surfaces
Author(s): N. A. Massie
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Microprocessor-Based Automatic Heterodyne Interferometer
Author(s): F. M. Mottier
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Shearing Interferometer With Scanned Photodiode Array And Microcomputer For Automatic Transparency Distortion Measurements
Author(s): J. Taboada; A. J. Duelm
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An Automatic Interference Pattern Processor With Interactive Capability
Author(s): Walter H. Augustyn; Alvin H. Rosenfeld; Carl A. Zanoni
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A Coaxial Interferometer With Low Mapping Distortion
Author(s): Albert F. Slomba; John W. Figoski
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