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PROCEEDINGS VOLUME 0088

Polarized Light: Instruments, Devices, Applications
Editor(s): Rasheed M. A. Azzam; W. Lewis Hyde
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Volume Details

Volume Number: 0088
Date Published: 22 October 1976
Softcover: 18 papers (136) pages
ISBN: 9780892521159

Table of Contents
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Demonstrations With Polarized Light
Author(s): W. Lewis Hyde
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Survey Of Methods For The Complete Determination Of A State Of Polarization
Author(s): P. S. Hauge
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Use Of Different Periodic Analyzers For The Frequency-Mixing Detection Of Polarization-Modulated Light
Author(s): R. M. A. Azzam
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A New Automatic Ellipsometer
Author(s): Grant M. Miles
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Recent Advances In Birefringent Filters
Author(s): Alan M. Title; Stephen A. Schoolman
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Polarizing Optical Components For High Power Glass Laser Systems
Author(s): Stanley Refermat; Jay Eastman
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Polarization Properties Of Internal Mirror He-Ne Lasers
Author(s): J. A. Duardo; S. C. Wang; W. Hug
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Polarizers For Liquid Crystal Displays
Author(s): Sidney J. Baum
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Recent Developments In PLZT Electrooptic Shutters
Author(s): J. Thomas Cutchen; James O. Harris; George R. Laguna
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A Scenario On Polarization In A Planetary Atmosphere
Author(s): George W. Kattawar
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Polarized Light In Chemistry
Author(s): P. J. Stephens
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Applications Of Polarized Light In Materials Research
Author(s): K. Vedam
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Ellipsometry As A Tool For Monitoring Molecular And Cellular Biological Processes In Vitro
Author(s): R. M. A. Azzam
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Laser Sensing Of Electric And Magnetic Fields For Power Transmission Applications
Author(s): G. A. Massey; J. C. Johnson; D. C. Erickson
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Some Useful Applications Of Polarized Light In Holography And Optical Information Processing
Author(s): Bruce Bartholomew; Jack Cederquist; Sing H. Lee
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Dichroic Polarizers - Spectral Properties And Some Applications
Author(s): Giorgio B. Trapani
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Effect Of Pressure On Molecular Conformation: An Experimental Method For Its Determination
Author(s): K. Vedam; J. Hayes
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Ellipsometric Measurements Of Thin Residual Films On Thermally Oxidized Silicon
Author(s): Samuel S. So; S. M. Zimmerman
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