Share Email Print


Quality Assurance in Optical and Electro-Optical Engineering
Editor(s): Lionel R. Baker

*This item is only available on the SPIE Digital Library.

Volume Details

Volume Number: 0073
Date Published: 16 March 1976

Table of Contents
show all abstracts | hide all abstracts
Photogrammetric Aspects Of OTF And MTF Measurements For Quality Assessment
Author(s): Erik P. Welander
Show Abstract
High Performance Lens Mounting
Author(s): G. E. Jones
Show Abstract
The Relationship Between The Quality Control Of Night Vision Objectives And Their Use
Author(s): W A Shand
Show Abstract
Minimisation Of Errors In Optical And Mechanical Systems
Author(s): James M. Burch
Show Abstract
Calculation Of The Optical Transfer Function For Any Shaped Pupil And Its Relation To The Merit Function
Author(s): Edgar Hugues; Roger Genisson
Show Abstract
Practical Interferometers
Author(s): W. H. Steel
Show Abstract
Fast Automatic Lens Testing For Extended-Field Image Quality
Author(s): William T. Plummer
Show Abstract
Some Instruments For Quality Assurance In Component Manufacture
Author(s): B J Biddles
Show Abstract
Interferometry, In Perspective And Prospective
Author(s): Paul F. Forman
Show Abstract
Critical Parameters In The Photometric Measurements Of Image Intensifier Tubes
Author(s): A. J. Cuelenaere
Show Abstract
Infrared Detector Characteristics; Measurement And Use
Author(s): Roy F. Potter
Show Abstract
Designing Electro-Optical Systems With Quality Assurance In Mind
Author(s): Robert A. Woodson
Show Abstract
Planning For The Development Of High Quality Instruments By Scientific Institutes
Author(s): A. Hammerschlag
Show Abstract
Quality Assurance Of Xilitary Optical Deuces As Practised By The Quality Assurance Directorate (Weapons)
Author(s): W A Alden
Show Abstract
The Use Of MTF Methods For Quality Control Of Image Forming Systems
Author(s): T L Williams
Show Abstract
A New Equipment For Production Testing Using MTF
Author(s): Jacques Pouleau
Show Abstract
A New Approach To The Specification Of Non-Functional Surface Defects In Optical Systems
Show Abstract
Use Of The Interferometer And MTF Equipent In The Evaluation Of Optical System And Components
Author(s): N. P. Barton
Show Abstract

© SPIE. Terms of Use
Back to Top