Share Email Print
cover

Proceedings of SPIE Volume 0009

Photo-Optical Systems Evaluation
Editor(s): Fred M. Emens
Format Member Price Non-Member Price
Softcover $105.00 * $105.00 *

*Available as a photocopy reprint only. Allow two weeks reprinting time plus standard delivery time. No discounts or returns apply.


Volume Details

Volume Number: 0009
Date Published: 1 November 1967
Softcover: 16 papers (138) pages
ISBN: 9780892520114

Table of Contents
show all abstracts | hide all abstracts
Evaluation Of Lens Systems
Author(s): Harry D. Polster
Show Abstract
The Use Of "MTf" For Lens Testing In Production Quantities
Author(s): Harry R. Palmer
Show Abstract
Development Of A Picture Sharpness Test For Still Cameras
Author(s): Howard F. Rogers
Show Abstract
Application Of A New Method Of Calculating Depth Of Field
Author(s): Vance J. Carpenter
Show Abstract
Testing A 100-Inch Mirror
Author(s): Joost H. Kiewiet Dejonge
Show Abstract
Variable Contrast, Variable Color Resolution Target
Author(s): Robert J. Meltzer; Walter J. Wojcik
Show Abstract
A MATHEMATICAL ERROR MODEL FOR CINETHEODOLITES
Author(s): Philip G. Blew
Show Abstract
Effects Of Coherence In Image Evaluation
Author(s): Brian J. Thompson
Show Abstract
A Leds Bench For Measuring The Modulation Transfer Function
Author(s): J. B. Davis; W. J. Deerhake; H. H. Herd; J. S. Wilczynski
Show Abstract
A Laser Unequal Path Interferometer (Lupi)* For The Optical Shop
Author(s): Joseph B. Houston; C. John Buccini; Patrick K. O'Neill
Show Abstract
Retrieval Of Optical Performance Functions From An Edge Trace With Rigid Control By Least Squares
Author(s): Gottfried R. Rosendahl
Show Abstract
Gray-Level Resolution Of Flying-Spot-Scanner Systems
Author(s): C. F. Shelton; H. H. Herd; J. J. Leybourne
Show Abstract
A Visible, Near-Ultraviolet, Ratio-Type Spectroradiometer
Author(s): G. K. Starkweather
Show Abstract
How Good Was It? - The Epitaph
Author(s): James W. Shean
Show Abstract

© SPIE. Terms of Use
Back to Top