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Proceedings Paper

A method for phase unwrapping base digital spackle correlation
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Paper Abstract

A new method for phase unwrapping is proposed, which makes the unwrapping of phase images realistic without binary codes or more frequency fringe images produced by projection systems, uses only one additional digital speckle pattern projected to help finding correspondence points. It means that the novel method is by the use of the additional speckle pattern to achieve a unique point correspondence. The proposed method to get unwrapped phase will save images recorded time. Experiment results demonstrated the proposed method is effective and robust.

Paper Details

Date Published: 20 November 2012
PDF: 6 pages
Proc. SPIE 8563, Optical Metrology and Inspection for Industrial Applications II, 856317 (20 November 2012); doi: 10.1117/12.999965
Show Author Affiliations
Dong He, Shenzhen Univ. (China)
Ameng Li, Shenzhen Univ. (China)
Xiaoli Liu, Shenzhen Univ. (China)
Xiang Peng, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 8563:
Optical Metrology and Inspection for Industrial Applications II
Kevin G. Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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