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Proceedings Paper

Effects of multiple reflections and low-frequency interferences on measured terahertz Fourier transform spectra
Author(s): Shao-Liang Li; Kang-Min Zhou; Wen-Ying Duan; Zhen-Hui Lin; Qi-Jun Yao; Sheng-Cai Shi
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Paper Abstract

Fourier transform spectroscopy (FTS) is a measurement technique widely used in characterizing the spectrum of light sources and the frequency response of detectors. Some “ghost” spectral lines, however, are often observed in measured Fourier transform spectra, such as high-frequency harmonics of the light source due to multiple reflections in the measurement system and unexpected high frequency lines owing to low-frequency interferences in the data acquisition. Here we study the effects of multiple reflections and low-frequency interferences on the THz spectra measured by a Fourier transform spectrometer for different THz sources and detectors. Experimental and simulation results will be presented.

Paper Details

Date Published: 5 December 2012
PDF: 6 pages
Proc. SPIE 8562, Infrared, Millimeter-Wave, and Terahertz Technologies II, 856204 (5 December 2012); doi: 10.1117/12.999900
Show Author Affiliations
Shao-Liang Li, Purple Mountain Observatory (China)
Key Lab. of Radio Astronomy (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Kang-Min Zhou, Purple Mountain Observatory (China)
Key Lab. of Radio Astronomy (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Wen-Ying Duan, Purple Mountain Observatory (China)
Key Lab. of Radio Astronomy (China)
Zhen-Hui Lin, Purple Mountain Observatory (China)
Key Lab. of Radio Astronomy (China)
Qi-Jun Yao, Purple Mountain Observatory (China)
Key Lab. of Radio Astronomy (China)
Sheng-Cai Shi, Purple Mountain Observatory (China)
Key Lab. of Radio Astronomy (China)


Published in SPIE Proceedings Vol. 8562:
Infrared, Millimeter-Wave, and Terahertz Technologies II
Cunlin Zhang; Xi-Cheng Zhang; He Li; Sheng-Cai Shi, Editor(s)

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