Share Email Print
cover

Proceedings Paper

Enhanced subwavelength light spot of vertically tapered metallic aperture based on plasmonics
Author(s): Jun-Bum Park; KyuHo Kim; Il-Min Lee; Dawoon Choi; Byoungho Lee
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We propose an approach that improves the characteristics of a subwavelength light spot from a tapered aperture without increment of the subwavelength spot size, via simply introducing a taper along the aperture shape. Two advantageous features of the proposed tapered structure are investigated: At first, by enlarging the entrance area of the aperture, it could collect more light with respect to the regular one. Thus the funneled light contributes to the field enhancement. Furthermore, the tapered edges of the exit surface of the aperture provide confined field, a wedge mode, which is bounded strongly and enhances the local electric field around the edge of the aperture. The enhanced characteristics of subwavelength spot in vertically-tapered aperture, including peak intensity, power throughput, and full width half maximum were obtained numerically using finite difference time domain method. The proposed device is fabricated using conventional planar fabrication techniques and focused ion beam milling to realize the tapered structure. The relative tapered angle-dependent enhancements are presented with experimental and quantitative demonstrations of the proposed structure.

Paper Details

Date Published: 26 November 2012
PDF: 6 pages
Proc. SPIE 8556, Holography, Diffractive Optics, and Applications V, 85560E (26 November 2012); doi: 10.1117/12.999895
Show Author Affiliations
Jun-Bum Park, Seoul National Univ. (Korea, Republic of)
KyuHo Kim, Seoul National Univ. (Korea, Republic of)
Il-Min Lee, Seoul National Univ. (Korea, Republic of)
Dawoon Choi, Seoul National Univ. (Korea, Republic of)
Byoungho Lee, Seoul National Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 8556:
Holography, Diffractive Optics, and Applications V
Yunlong Sheng; Chongxiu Yu; Linsen Chen, Editor(s)

© SPIE. Terms of Use
Back to Top