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Proceedings Paper

Tire x-ray image belt-ply defect feature recognition method based on Gabor wavelets
Author(s): Qiang Du; Zhanhua Huang
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Paper Details

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Proc. SPIE 8558, Optoelectronic Imaging and Multimedia Technology II, 855811; doi: 10.1117/12.999755
Show Author Affiliations
Qiang Du
Zhanhua Huang, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 8558:
Optoelectronic Imaging and Multimedia Technology II
Tsutomu Shimura; Guangyu Xu; Linmi Tao; Jesse Zheng, Editor(s)

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