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Proceedings Paper

A new type of wide spectral coverage echelle spectrometer design for ICP-AES
Author(s): Shaojie Chen; Yuguo Tang; X. Bayanheshig; Xiangdong Qi; Wenyu Zhu
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Paper Abstract

The inductively coupled plasma atomic emission spectrometry (ICP-AES) has always attracted great interest and is widely used for routine elemental analysis. While one drawback of this technique is the fact that conventional Czerny- Turner spectrographs in combination with CCD cameras are very limited either in terms of spectral resolution or in terms of simultaneously detectable spectral range. A cross-dispersion system with echelle grating and prism has therefore been developed, and the spectral image is directed by large area charge coupled device (CCD). This configuration meets the needs of atomic emission spectroscopy well, since it has many benefits including high resolving power, spectral coverage, high sensitivity, and high optical throughput. While, because the limitation of the development of detectors, it is difficult to complete wide spectral coverage measurement. Due to the improvements in optical design, this system can detect the wide spectral coverage from 180nm to 900nm simply by rotating the prism, and these two ranges are 180nm- 260nm and 210nm-900nm, with a high resolution 0.009nm@200nm. The detection of different elements only needs to choose appropriate wavelength coverage, thus lots of elements can be analyzed within quite short time. The novel optical design of this instrument is presented in this paper and its merits are discussed. The optical spectral resolution and the precision of wavelength calibration are found to be satisfactory and within design goals. Experiments show that the ICPAES with echelle spectrometer is available to detect multiple elements within a short time correctly, and the wavelength precision is better than 0.01nm.

Paper Details

Date Published: 26 November 2012
PDF: 9 pages
Proc. SPIE 8557, Optical Design and Testing V, 85571M (26 November 2012); doi: 10.1117/12.999677
Show Author Affiliations
Shaojie Chen, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate Univ. of the Chinese Academy of Sciences (China)
Yuguo Tang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
X. Bayanheshig, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Xiangdong Qi, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Wenyu Zhu, Changchun Institute of Optics, Fine Mechanics and Physics (China)

Published in SPIE Proceedings Vol. 8557:
Optical Design and Testing V
Yongtian Wang; Chunlei Du; Hong Hua; Kimio Tatsuno; H. Paul Urbach, Editor(s)

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