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Proceedings Paper

Temperature effect on ultraviolet differential absorption cross section of SO2
Author(s): Weijia Jin; Haiming Zheng; Haiping Li; Guiyin Zhang; Hui Ji
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Paper Abstract

When the technique of differential optical absorption spectroscopy (DOAS) is applied to the pollutant monitoring, the differential absorption characteristics of pollution gases will change greatly owing to the flue gas is often with high temperature. This will bring the influence on the detection results. This article mainly aims at the temperature effects for SO2 differential absorption cross section by recordings the absorption spectra. The results show that the differential absorption property changes dramatically with temperature. The differential absorption peaks in the region of 280.0-320.0nm decrease with the increase of temperature while the valleys will increase. So the entire differential absorption cross section decreases with the increase of temperature, but no wavelength drift and differential absorption structure change appear with temperature. By measuring the differential absorption cross section of a few peaks at different temperature, it is found that the reduction regularity at different wavelength is varied. The variation at 286.7nm, 293.9nm and 304.0nm with temperature is in a manner of cubic polynomial, while the variation at 300.0nm presents a nearly linear decline. When the temperature rises from 300K to 450K, the relative change of the differential absorption cross section at 286.7nm is 77.1%, while it can reach 84.0% at 300.0nm.

Paper Details

Date Published: 26 November 2012
PDF: 6 pages
Proc. SPIE 8557, Optical Design and Testing V, 85571J (26 November 2012); doi: 10.1117/12.999621
Show Author Affiliations
Weijia Jin, North China Electric Power Univ. (China)
Haiming Zheng, North China Electric Power Univ. (China)
Haiping Li, North China Electric Power Univ. (China)
Guiyin Zhang, North China Electric Power Univ. (China)
Hui Ji, North China Electric Power Univ. (China)

Published in SPIE Proceedings Vol. 8557:
Optical Design and Testing V
Yongtian Wang; Chunlei Du; Hong Hua; Kimio Tatsuno; H. Paul Urbach, Editor(s)

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