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Proceedings Paper

Wave-front aberrations analysis by Zernike polynomials based on the annular sub-aperture stitching system
Author(s): Lei Duan; Mei Hui; Jiayuan Deng; Cheng Gong; Yuejin Zhao
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Paper Abstract

Annular sub-aperture stitching method was developed for testing large-aperture aspheric surfaces without using of any compensating element for measurement. It is necessary to correct measurement of aspheric optical aberrations and create mathematical description to describe wave-front aberrations. Zernike polynomials are suitable to describe wave aberration functions and data fitting of experimental measurements for the annular sub-aperture stitching system. This paper uses Zernike polynomials to describe the wave-front aberrations of full wave-front and reconstructed wave-front by annular sub-aperture stitching algorithm. At the same time, the imaging quality of the aspheric optical element can be contrasted. The stitching result shows good agreement with the full aperture result.

Paper Details

Date Published: 26 November 2012
PDF: 7 pages
Proc. SPIE 8557, Optical Design and Testing V, 855707 (26 November 2012); doi: 10.1117/12.999563
Show Author Affiliations
Lei Duan, Beijing Institute of Technology (China)
Mei Hui, Beijing Institute of Technology (China)
Jiayuan Deng, Shanghai Jiao Tong Univ. (China)
Cheng Gong, Beijing Institute of Technology (China)
Yuejin Zhao, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 8557:
Optical Design and Testing V
Yongtian Wang; Chunlei Du; Hong Hua; Kimio Tatsuno; H. Paul Urbach, Editor(s)

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